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http://ieeexplore.ieee.org/rss/TOC92.XML

 	Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=92

http://ieeexplore.ieee.org/rss/TOC4.XML Solid-State Circuits, IEEE Journal of http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4

http://ieeexplore.ieee.org/rss/TOC4159607.XML Signal Processing, IET http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4159607

http://ieeexplore.ieee.org/rss/TOC7361.XML

 	Sensors Journal, IEEE

http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7361

http://ieeexplore.ieee.org/rss/TOC66.XML Semiconductor Manufacturing, IEEE Transactions on http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=66

http://ieeexplore.ieee.org/rss/TOC3.XML

 	Quantum Electronics, IEEE Journal of

http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=3

http://ieeexplore.ieee.org/rss/TOC42.XML Medical Imaging, IEEE Transactions on http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=42

http://ieeexplore.ieee.org/rss/TOC19.XML

 	Instrumentation and Measurement, IEEE Transactions on

http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=19

http://ieeexplore.ieee.org/rss/TOC2220.XML Electronics Letters http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=2220

http://ieeexplore.ieee.org/rss/TOC16.XML Electron Devices, IEEE Transactions on http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=16

http://ieeexplore.ieee.org/rss/TOC55.XML Electron Device Letters, IEEE http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=55

http://ieeexplore.ieee.org/rss/TOC4123966.XML Circuits, Devices & Systems, IET http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4123966

http://ieeexplore.ieee.org/rss/TOC8919.XML Circuits and Systems I: Regular Papers, IEEE Transactions on http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8919

http://ieeexplore.ieee.org/rss/TOC8920.XML

 	Circuits and Systems II: Express Briefs, IEEE Transactions on

http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8920