https://optics.eee.nottingham.ac.uk/w/api.php?action=feedcontributions&user=Teti&feedformat=atomApplied Optics Wiki - User contributions [en]2024-03-28T19:52:16ZUser contributionsMediaWiki 1.27.1https://optics.eee.nottingham.ac.uk/w/index.php?title=Theodosia_Stratoudaki&diff=1415Theodosia Stratoudaki2013-03-27T14:23:22Z<p>Teti: </p>
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<div>__NOTOC__<br />
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'''[[Teti Stratoudaki]]'''<br />
<br />
Location: Pharmacy Building – SIOS Lab Room C40 or CHOTs lab C36<br />
<br />
Email: t.stratoudaki@nottingham.ac.uk<br />
<br />
Phone: (0115) 95-15556 (office)<br />
<br />
'''Current Research'''<br />
Theodosia Stratoudaki has been developing a new breed of optical transducers (CHOTs) suitable for industrial applications. She has worked on CHOTs design, development, application, and commercialisation stage. CHOTs are activated and read optically and offer a range of advantages over the traditional contact transducers: remote, reliable, couplant free operation with low impact on the inspected structure, activated by light and eliminating the need of wires. Theodosia Stratoudaki is currently developing a portable CHOTs system for endoscopic, non destructive testing of turbine engines in collaboration with Rolls-Royce. <br />
Another research dimension has been the study of non linear behaviour of ultrasound. This research used parametric interaction between two ultrasonic beams to measure material nonlinearity and explored whether this measurement may be linked to the fatigue the material has experienced as it stems from the microscopic plastic deformation that has built up during use.<br />
<br />
'''Previous Projects'''<br />
<br />
[[% fatigue]]<br />
<br />
<br />
[[AERONEWS]]</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=File:Stratoudaki_photo_small.jpg&diff=1414File:Stratoudaki photo small.jpg2013-03-27T14:21:30Z<p>Teti: </p>
<hr />
<div></div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=File:Stratoudaki_photo.jpg&diff=1413File:Stratoudaki photo.jpg2013-03-27T11:38:53Z<p>Teti: Nice picture of Teti</p>
<hr />
<div>Nice picture of Teti</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1356Sputter coater2012-10-26T13:31:46Z<p>Teti: /* Changing the target metal */</p>
<hr />
<div>==Training==<br />
The sputter coater is a realtively easy and straightforward machine to use. However some basic training ''must'' be provided before you use it. The appropriate person to contact is [[Teti Stratoudaki]] or [[Richard Smith]]. Among the various technical points that you need to know to operate the sputter coater you must also be made aware of the basic good manners that you need to demonstrate. This is a shared facility and any misconduct has effect on all the Fab Lab users.<br />
<br />
==Important information regarding the ID tag system==<br />
An ID tag is required to run the sputter coater. If you are new in the lab and you need to use the sputterer please contact [[Teti Stratoudaki]] or [[Richard Smith]] who can issue a tag for you.<br />
The tag must be left on the tag reader, on top of the sputter coater, while the sputtering is taking place. The tag reader of the sputter coater is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputter coater needs to be restarted as well:<br />
* cd /sputterer<br />
* sudo ./run_sputterer_access_control<br />
You will have to provide the password for the computer (sofa) and the sputterer should then be back in working order.<br />
<br />
==Thickness calibration==<br />
To calibrate the sputter coater [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spin-coated layer and mask exposure.<br />
<br />
==Changing the target metal==<br />
<br />
<br />
If you need to change the target metal sources you need to understand the use of spacers.<br />
There are two kinds of spacers: the circular aluminium backing plates and the "batman" shaped spacers. <br />
<br />
The backing plates are placed underneath the targets and their function is to bring the two targets to the same level. In the case that one of the targets is thicker than the other, one or more of these backing plates are placed underneath the thinner target.<br />
<br />
The "batman" shaped spacers are used to maintain a gap of 1.5mm between the inside of the assembly shield (that is the top "binocular" shaped part of the target assembly) and the front face of the targets. The manufacturer has assumed a standard target thickness of 0.3mm and in this case no spacers need to be used. However, most of the targets that we have in the lab are thicker than 0.3mm and spacers are needed. Each of these spacers is 1mm thick and they are fitted in pairs (one at the top and one at the bottom side of the target assembly).<br />
<br />
This is an example of using the spacers: A silver target and a chrome target are required. The silver target is 1mm thick and the chrome target is 1.5mm thick. One of the backing plates is placed under the silver target to bring both targets on the same level. Now the sources stand at 1.5mm instead of the 0.3mm that the sputterer is designed for, a difference of (1.5-0.3=)1.2mm. To account for this, a pair of the "batman" shaped spacers (one on the top and one on the bottom) is placed under the final assembly shield. <br />
When using the ITO sample (very thick target), you need to use the thickest backing plate underneath the thin source and two of the "batman" shaped spacers. <br />
<br />
A special note on the appropriate '''screws''' to be used when fixing the assembly: there are four cap screws that are used to fix the assembly shield in place. The plate on which they are fixed is at 0V potential and the target housing around it is at -1200V. It is very important that the screws do not touch the machine at the back. This is why there are two sets of screws: one to be used when one set or less of the "batman" shaped spacers is used (short screws) and one to be used when two sets or more are used (long screws). If you use the long screws when you should have used the short a) sputtering may not happen and b) you are '''damaging''' the threads of the screws and the plate on which they are fixed. Please make sure you know what you are doing!<br />
<br />
Finally, after changing the targets, please do not forget to leave a note on the white board (right hand side facing the instrument) as to what targets are currently loaded!<br />
<br />
==Log book==<br />
Do not forget to fill in the sputter coater's log book (located next to the machine). It provides important information for the history and maintenance of the instrument as well as information for the sputtering conditions used by the previous users.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1355Sputter coater2012-10-26T13:30:31Z<p>Teti: /* Training */</p>
<hr />
<div>==Training==<br />
The sputter coater is a realtively easy and straightforward machine to use. However some basic training ''must'' be provided before you use it. The appropriate person to contact is [[Teti Stratoudaki]] or [[Richard Smith]]. Among the various technical points that you need to know to operate the sputter coater you must also be made aware of the basic good manners that you need to demonstrate. This is a shared facility and any misconduct has effect on all the Fab Lab users.<br />
<br />
==Important information regarding the ID tag system==<br />
An ID tag is required to run the sputter coater. If you are new in the lab and you need to use the sputterer please contact [[Teti Stratoudaki]] or [[Richard Smith]] who can issue a tag for you.<br />
The tag must be left on the tag reader, on top of the sputter coater, while the sputtering is taking place. The tag reader of the sputter coater is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputter coater needs to be restarted as well:<br />
* cd /sputterer<br />
* sudo ./run_sputterer_access_control<br />
You will have to provide the password for the computer (sofa) and the sputterer should then be back in working order.<br />
<br />
==Thickness calibration==<br />
To calibrate the sputter coater [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spin-coated layer and mask exposure.<br />
<br />
==Changing the target metal==<br />
<br />
<br />
If you need to change the target metal sources you need to understand the use of spacers.<br />
There are two kinds of spacers: the circular aluminium backing plates and the "batman shaped" spacers. <br />
<br />
The backing plates are placed underneath the targets and their function is to bring the two targets to the same level. In the case that one of the targets is thicker than the other, one or more of these backing plates are placed underneath the thinner target.<br />
<br />
The "batman" shaped spacers are used to maintain a gap of 1.5mm between the inside of the assembly shield (that is the top "binocular" shaped part of the target assembly) and the front face of the targets. The manufacturer has assumed a standard target thickness of 0.3mm and in this case no spacers need to be used. However, most of the targets that we have in the lab are thicker than 0.3mm and spacers are needed. Each of these spacers is 1mm thick and they are fitted in pairs (one at the top and one at the bottom side of the target assembly).<br />
<br />
This is an example of using the spacers: A silver target and a chrome target are required. The silver target is 1mm thick and the chrome target is 1.5mm thick. One of the backing plates is placed under the silver target to bring both targets on the same level. Now the sources stand at 1.5mm instead of the 0.3mm that the sputterer is designed for, a difference of (1.5-0.3=)1.2mm. To account for this, a pair of the "batman" shaped spacers (one on the top and one on the bottom) is placed under the final assembly shield. <br />
When using the ITO sample (very thick target), you need to use the thickest backing plate underneath the thin source and two of the "batman" shaped spacers. <br />
<br />
A special note on the appropriate '''screws''' to be used when fixing the assembly: there are four cap screws that are used to fix the assembly shield in place. The plate on which they are fixed is at 0V potential and the target housing around it is at -1200V. It is very important that the screws do not touch the machine at the back. This is why there are two sets of screws: one to be used when one set or less of the "batman" shaped spacers is used (short screws) and one to be used when two sets or more are used (long screws). If you use the long screws when you should have used the short a) sputtering may not happen and b) you are '''damaging''' the threads of the screws and the plate on which they are fixed. Please make sure you know what you are doing!<br />
<br />
Finally, after changing the targets, please do not forget to leave a note on the white board (right hand side facing the instrument) as to what targets are currently loaded!<br />
<br />
==Log book==<br />
Do not forget to fill in the sputter coater's log book (located next to the machine). It provides important information for the history and maintenance of the instrument as well as information for the sputtering conditions used by the previous users.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1354Sputter coater2012-10-26T13:29:11Z<p>Teti: </p>
<hr />
<div>==Training==<br />
The sputter coater is a realtively easy and straightforward machine to use. However some basic training ''must'' be provided before you use it. The appropriate person to contact is [[Teti Stratoudaki]] or [[Richard Smith]]. Among the various technical points that you need to know to opperate the sputter coater you must also be made aware of the basic good manners that you need to have. This is a shared facility and any misconduct has effect on all the Fab Lab users. <br />
<br />
==Important information regarding the ID tag system==<br />
An ID tag is required to run the sputter coater. If you are new in the lab and you need to use the sputterer please contact [[Teti Stratoudaki]] or [[Richard Smith]] who can issue a tag for you.<br />
The tag must be left on the tag reader, on top of the sputter coater, while the sputtering is taking place. The tag reader of the sputter coater is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputter coater needs to be restarted as well:<br />
* cd /sputterer<br />
* sudo ./run_sputterer_access_control<br />
You will have to provide the password for the computer (sofa) and the sputterer should then be back in working order.<br />
<br />
==Thickness calibration==<br />
To calibrate the sputter coater [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spin-coated layer and mask exposure.<br />
<br />
==Changing the target metal==<br />
<br />
<br />
If you need to change the target metal sources you need to understand the use of spacers.<br />
There are two kinds of spacers: the circular aluminium backing plates and the "batman shaped" spacers. <br />
<br />
The backing plates are placed underneath the targets and their function is to bring the two targets to the same level. In the case that one of the targets is thicker than the other, one or more of these backing plates are placed underneath the thinner target.<br />
<br />
The "batman" shaped spacers are used to maintain a gap of 1.5mm between the inside of the assembly shield (that is the top "binocular" shaped part of the target assembly) and the front face of the targets. The manufacturer has assumed a standard target thickness of 0.3mm and in this case no spacers need to be used. However, most of the targets that we have in the lab are thicker than 0.3mm and spacers are needed. Each of these spacers is 1mm thick and they are fitted in pairs (one at the top and one at the bottom side of the target assembly).<br />
<br />
This is an example of using the spacers: A silver target and a chrome target are required. The silver target is 1mm thick and the chrome target is 1.5mm thick. One of the backing plates is placed under the silver target to bring both targets on the same level. Now the sources stand at 1.5mm instead of the 0.3mm that the sputterer is designed for, a difference of (1.5-0.3=)1.2mm. To account for this, a pair of the "batman" shaped spacers (one on the top and one on the bottom) is placed under the final assembly shield. <br />
When using the ITO sample (very thick target), you need to use the thickest backing plate underneath the thin source and two of the "batman" shaped spacers. <br />
<br />
A special note on the appropriate '''screws''' to be used when fixing the assembly: there are four cap screws that are used to fix the assembly shield in place. The plate on which they are fixed is at 0V potential and the target housing around it is at -1200V. It is very important that the screws do not touch the machine at the back. This is why there are two sets of screws: one to be used when one set or less of the "batman" shaped spacers is used (short screws) and one to be used when two sets or more are used (long screws). If you use the long screws when you should have used the short a) sputtering may not happen and b) you are '''damaging''' the threads of the screws and the plate on which they are fixed. Please make sure you know what you are doing!<br />
<br />
Finally, after changing the targets, please do not forget to leave a note on the white board (right hand side facing the instrument) as to what targets are currently loaded!<br />
<br />
==Log book==<br />
Do not forget to fill in the sputter coater's log book (located next to the machine). It provides important information for the history and maintenance of the instrument as well as information for the sputtering conditions used by the previous users.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1353Sputter coater2012-10-26T13:28:29Z<p>Teti: /* Changing the target metal */</p>
<hr />
<div>==Training==The sputter coater is a realtively easy and straightforward machine to use. However some basic training ''must'' be provided before you use it. The appropriate person to contact is [[Teti Stratoudaki]] or [[Richard Smith]]. Among the various technical points that you need to know to opperate the sputter coater you must also be made aware of the basic good manners that you need to have. This is a shared facility and any misconduct has effect on all the Fab Lab users. <br />
<br />
==Important information regarding the ID tag system==<br />
An ID tag is required to run the sputter coater. If you are new in the lab and you need to use the sputterer please contact [[Teti Stratoudaki]] or [[Richard Smith]] who can issue a tag for you.<br />
The tag must be left on the tag reader, on top of the sputter coater, while the sputtering is taking place. The tag reader of the sputter coater is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputter coater needs to be restarted as well:<br />
* cd /sputterer<br />
* sudo ./run_sputterer_access_control<br />
You will have to provide the password for the computer (sofa) and the sputterer should then be back in working order.<br />
<br />
==Thickness calibration==<br />
To calibrate the sputter coater [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spin-coated layer and mask exposure.<br />
<br />
==Changing the target metal==<br />
<br />
<br />
If you need to change the target metal sources you need to understand the use of spacers.<br />
There are two kinds of spacers: the circular aluminium backing plates and the "batman shaped" spacers. <br />
<br />
The backing plates are placed underneath the targets and their function is to bring the two targets to the same level. In the case that one of the targets is thicker than the other, one or more of these backing plates are placed underneath the thinner target.<br />
<br />
The "batman" shaped spacers are used to maintain a gap of 1.5mm between the inside of the assembly shield (that is the top "binocular" shaped part of the target assembly) and the front face of the targets. The manufacturer has assumed a standard target thickness of 0.3mm and in this case no spacers need to be used. However, most of the targets that we have in the lab are thicker than 0.3mm and spacers are needed. Each of these spacers is 1mm thick and they are fitted in pairs (one at the top and one at the bottom side of the target assembly).<br />
<br />
This is an example of using the spacers: A silver target and a chrome target are required. The silver target is 1mm thick and the chrome target is 1.5mm thick. One of the backing plates is placed under the silver target to bring both targets on the same level. Now the sources stand at 1.5mm instead of the 0.3mm that the sputterer is designed for, a difference of (1.5-0.3=)1.2mm. To account for this, a pair of the "batman" shaped spacers (one on the top and one on the bottom) is placed under the final assembly shield. <br />
When using the ITO sample (very thick target), you need to use the thickest backing plate underneath the thin source and two of the "batman" shaped spacers. <br />
<br />
A special note on the appropriate '''screws''' to be used when fixing the assembly: there are four cap screws that are used to fix the assembly shield in place. The plate on which they are fixed is at 0V potential and the target housing around it is at -1200V. It is very important that the screws do not touch the machine at the back. This is why there are two sets of screws: one to be used when one set or less of the "batman" shaped spacers is used (short screws) and one to be used when two sets or more are used (long screws). If you use the long screws when you should have used the short a) sputtering may not happen and b) you are '''damaging''' the threads of the screws and the plate on which they are fixed. Please make sure you know what you are doing!<br />
<br />
Finally, after changing the targets, please do not forget to leave a note on the white board (right hand side facing the instrument) as to what targets are currently loaded!<br />
<br />
==Log book==<br />
Do not forget to fill in the sputter coater's log book (located next to the machine). It provides important information for the history and maintenance of the instrument as well as information for the sputtering conditions used by the previous users.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1352Sputter coater2012-10-26T13:25:00Z<p>Teti: </p>
<hr />
<div>==Training==The sputter coater is a realtively easy and straightforward machine to use. However some basic training ''must'' be provided before you use it. The appropriate person to contact is [[Teti Stratoudaki]] or [[Richard Smith]]. Among the various technical points that you need to know to opperate the sputter coater you must also be made aware of the basic good manners that you need to have. This is a shared facility and any misconduct has effect on all the Fab Lab users. <br />
<br />
==Important information regarding the ID tag system==<br />
An ID tag is required to run the sputter coater. If you are new in the lab and you need to use the sputterer please contact [[Teti Stratoudaki]] or [[Richard Smith]] who can issue a tag for you.<br />
The tag must be left on the tag reader, on top of the sputter coater, while the sputtering is taking place. The tag reader of the sputter coater is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputter coater needs to be restarted as well:<br />
* cd /sputterer<br />
* sudo ./run_sputterer_access_control<br />
You will have to provide the password for the computer (sofa) and the sputterer should then be back in working order.<br />
<br />
==Thickness calibration==<br />
To calibrate the sputter coater [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spin-coated layer and mask exposure.<br />
<br />
==Changing the target metal==<br />
<br />
<br />
If you need to change the target metal sources you need to understand the use of spacers.<br />
There are two kinds of spacers: the circular aluminium backing plates and the "batman shaped" spacers. <br />
<br />
The backing plates are placed underneath the targets and their function is to bring the two targets to the same level. In the case that one of the targets is thicker than the other, one or more of these backing plates are placed underneath the thinner target.<br />
<br />
The "batman" shaped spacers are used to maintain a gap of 1.5mm between the inside of the assembly shield (that is the top "binocular" shaped part of the target assembly) and the front face of the targets. The manufacturer has assumed a standard target thickness of 0.3mm and in this case no spacers need to be used. However, most of the targets that we have in the lab are thicker than 0.3mm and spacers are needed. Each of these spacers is 1mm thick and they are fitted in pairs (one at the top and one at the bottom side of the target assembly).<br />
<br />
This is an example of using the spacers: A silver target and a chrome target are required. The silver target is 1mm thick and the chrome target is 1.5mm thick. One of the backing plates is placed under the silver target to bring both targets on the same level. Now the sources stand at 1.5mm instead of the 0.3mm that the sputterer is designed for, a difference of (1.5-0.3=)1.2mm. To account for this, a pair of the "batman" shaped spacers (one on the top and one on the bottom) is placed under the final assembly shield. <br />
When using the ITO sample (very thick target), you need to use the thickest backing plate underneath the thin source and at two of the "batman" shaped spacers. <br />
<br />
A special note on the appropriate '''screws''' to be used when fixing the assembly: there are four cap screws that are used to fix the assembly shield in place. The plate on which they are fixed is at 0V potential and the target housing around it is at -1200V. It is very important that the screws do not touch the machine at the back. This is why there are two sets of screws: one to be used when one set or less of the "batman" shaped spacers is used (short screws) and one to be used when two sets or more are used. If you use the long screws when you should have used the short a) sputtering may not happen and b) you are damaging the threads of the screws and the plate on which they are fixed. Please make sure you know what you are doing!<br />
<br />
Finally, after changing the targets, please do not forget to leave a note on the white board (right hand side facing the instrument) as to what targets are currently loaded!<br />
<br />
==Log book==<br />
Do not forget to fill in the sputter coater's log book (located next to the machine). It provides important information for the history and maintenance of the instrument as well as information for the sputtering conditions used by the previous users.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1351Sputter coater2012-10-26T12:58:39Z<p>Teti: </p>
<hr />
<div>==Training==The sputter coater is a realtively easy and straightforward machine to use. However some basic training ''must'' be provided before you use it. The appropriate person to contact is [[Teti Stratoudaki]] or [[Richard Smith]]. Among the various technical points that you need to know to opperate the sputter coater you must also be made aware of the basic good manners that you need to have. This is a shared facility and any misconduct has effect on all the Fab Lab users. <br />
<br />
==Important information regarding the ID tag system==<br />
An ID tag is required to run the sputter coater. If you are new in the lab and you need to use the sputterer please contact [[Teti Stratoudaki]] or [[Richard Smith]] who can issue a tag for you.<br />
The tag must be left on the tag reader, on top of the sputter coater, while the sputtering is taking place. The tag reader of the sputter coater is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputter coater needs to be restarted as well:<br />
* cd /sputterer<br />
* sudo ./run_sputterer_access_control<br />
You will have to provide the password for the computer (sofa) and the sputterer should then be back in working order.<br />
<br />
==Thickness calibration==<br />
To calibrate the sputter coater [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spin-coated layer and mask exposure.<br />
<br />
==Changing the target metal==<br />
<br />
<br />
If you need to change the target metal sources you need to understand the use of spacers.<br />
There are two kinds of spacers: the circular aluminium backing plates and the "batman shaped" spacers. <br />
The backing plates are placed underneath the targets and their function is to bring the two targets to the same level. In the case that one of the targets is thicker than the other, one or more of these backing plates are placed underneath the thinner target.<br />
The "batman shaped" spacers are used to maintain a gap of 1.5mm between the inside of the assembly shield (that is the top "binocular" shaped part of the target assembly) and the front face of the targets. The manufacturer has assumed a standard target thickness of 0.3mm and in this case no spacers need to be used. However, most of the targets that we have in the lab are thicker than 0.3mm and spacers are needed.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1350Sputter coater2012-10-26T12:40:51Z<p>Teti: </p>
<hr />
<div>To calibrate the sputter coater [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spin-coated layer and mask exposure.<br />
<br />
<br />
==TEST==<br />
<br />
<br />
IMPORTANT INFORMATION REGARDING THE ID TAG SYSTEM!!!!<br />
An ID tag is required to run the sputterer. If you are new in the lab and you need to use the sputterer please contact [[Teti Stratoudaki]] or [[Richard Smith]] who can issue a tag for you.<br />
The tag must be left on the tag reader, on top of the sputter coater, while the sputtering is taking place. The tag reader of the sputter coater is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputter coater needs to be restarted as well:<br />
* cd /sputterer<br />
* sudo ./run_sputterer_access_control<br />
You will have to provide the password for the computer (sofa) and the sputterer should then be back in working order.<br />
<br />
* CHANGING METAL SOURCES<br />
<br />
If you need to change metal sources you need to understand the use of spacers.<br />
There are two kinds of spacers</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1349Sputter coater2012-10-26T12:40:29Z<p>Teti: </p>
<hr />
<div>To calibrate the sputter coater [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spin-coated layer and mask exposure.<br />
<br />
<br />
===TEST===<br />
<br />
IMPORTANT INFORMATION REGARDING THE ID TAG SYSTEM!!!!<br />
An ID tag is required to run the sputterer. If you are new in the lab and you need to use the sputterer please contact [[Teti Stratoudaki]] or [[Richard Smith]] who can issue a tag for you.<br />
The tag must be left on the tag reader, on top of the sputter coater, while the sputtering is taking place. The tag reader of the sputter coater is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputter coater needs to be restarted as well:<br />
* cd /sputterer<br />
* sudo ./run_sputterer_access_control<br />
You will have to provide the password for the computer (sofa) and the sputterer should then be back in working order.<br />
<br />
* CHANGING METAL SOURCES<br />
<br />
If you need to change metal sources you need to understand the use of spacers.<br />
There are two kinds of spacers</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1348Sputter coater2012-10-26T12:39:59Z<p>Teti: </p>
<hr />
<div>To calibrate the sputter coater [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spin-coated layer and mask exposure.<br />
<br />
<br />
===<br />
====TEST====<br />
===<br />
IMPORTANT INFORMATION REGARDING THE ID TAG SYSTEM!!!!<br />
An ID tag is required to run the sputterer. If you are new in the lab and you need to use the sputterer please contact [[Teti Stratoudaki]] or [[Richard Smith]] who can issue a tag for you.<br />
The tag must be left on the tag reader, on top of the sputter coater, while the sputtering is taking place. The tag reader of the sputter coater is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputter coater needs to be restarted as well:<br />
* cd /sputterer<br />
* sudo ./run_sputterer_access_control<br />
You will have to provide the password for the computer (sofa) and the sputterer should then be back in working order.<br />
<br />
* CHANGING METAL SOURCES<br />
<br />
If you need to change metal sources you need to understand the use of spacers.<br />
There are two kinds of spacers</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=AO_resources&diff=1347AO resources2012-10-26T12:38:09Z<p>Teti: </p>
<hr />
<div> Applied Optics Group Resources <br />
<br />
This is a list of resources for use within the Applied Optics Group. This can include:<br />
<br />
* Internal facilities<br />
* Equipment and instruments (bought on shared funding e.g. SRIF)<br />
* Local expertise<br />
* External facilities (that members of the Applied Optics Group use)<br />
<br />
Some of the facilities are "home-built" experiments - cutting edge facilities that may not be available anywhere else in the world, but on the other hand may be tied up/uncalibrated/moth-balled. Others are commercial.<br />
<br />
I (Steve) will make a start on this of the things I know about, and some of the things I vaguely know about. Please correct errors and omissions.<br />
<br />
= Internal Facilities =<br />
<br />
== ASOPs dual fs laser system ==<br />
TBA<br />
<br />
== Fab Lab ==<br />
<br />
Facility for fabricating samples. You need training to use any of this facility - if you aren't already using it please don't help yourself. Ask someone to show you around and train you on the kit you are interested in.<br />
<br />
You also need to keep logs of everything you do in this lab.<br />
<br />
Facilities for metal film evaporation/sputtering, photo-lithography and general chemical procedures that require working under a fume-cupboard and a clean-ish environment.<br />
<br />
* ''Location:'' SiOS Labs<br />
* ''Contact:'' Matt Clark or [[Teti Stratoudaki]]<br />
<br />
!!! Please Keep Clean at all times !!!<br />
<br />
*''The Lab is equipped with:''<br />
** Edwards 306A evaporator with 6 sources<br />
** Emitech K575XD [[Sputter coater|sputter coater]] with 2 sources<br />
** Carbolite oven<br />
** Cobilt [[Mask aligner|mask aligner]]<br />
** Spin coater<br />
** Decent scales<br />
** Microscope with camera<br />
<br />
When using the equipment (sputter coater/mask aligner/evaporator) please complete the log books and indicate your supervisor.<br />
<br />
[[Fab Lab]] pages<br />
<br />
== Soldering and minor metalworking ==<br />
<br />
Pillar drill (fairly crap), small bench vice, hand files, hacksaw, clamps etc.<br />
<br />
Temperature-controlled soldering iron<br />
<br />
Various PSUs, signal generators and scopes - all old<br />
<br />
Stock components (resistors, fuses, cables, wire, plugs/sockets/connectors etc)<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]] (for missing bits of equipment)<br />
* ''Extra info:''<br />
** Make sure you know what you're doing and how to operate the drill. Seek instruction if you're unsure. Don't take risks. Wear safety goggles (should be some nearby). Set the drill speed appropriately. Unplug the drill from the wall when moving the belt between pulleys. Clamp things down when drilling them (use the brush not your hands).<br />
** Tidy up after yourself - especially bits of metal after drilling.<br />
** Replace what you use: solder, solder wick, wire, stock components, anything.<br />
** If you see some old equipment and notice the electrical testing label has expired, get it PAT tested in the stores - it only takes a few minutes.<br />
** Switch everything off at the plug after you've used it - especially important for the soldering iron.<br />
<br />
== O-SAM ==<br />
<br />
'''Description needs completing'''<br />
<br />
* SRAS: surface microstructure imaging, using surface acoustic wave (SAW) velocity as contrast mechanism<br />
* Coating thickness measurement (again using SAW velocity)<br />
* Surface defect detection (cracks, delamination)<br />
<br />
* ''Location:'' Tower 303 and 306 (Laser Ultrasound Labs)<br />
* ''Contact:'' [[Steve Sharples]] (for missing bits of equipment)<br />
* ''Extra info:''<br />
<br />
== Scanning tank ==<br />
<br />
* Ultrasonic scanning tank<br />
* 6-axis<br />
* 2 axes may be scanned simultaneously<br />
* Panametrics 35MHz pulser-receiver<br />
* Range of focused and plane beam transducers<br />
* Agilent DSO8010A oscilloscope for acquisition<br />
* Uses ''c_scan'' running under Linux for control and acquisition<br />
<br />
* [[Scanning Tank]] detailed instructions<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
<br />
= Equipment and Instruments =<br />
<br />
== Posh Zeiss Microscope ==<br />
<br />
'''Description needs completing'''<br />
<br />
PC-controlled, with eye-pieces and CCD camera. Can reportedly stitch several images together. Illuminate from above and below. Lots of fancy stuff...<br />
<br />
* ''Location:'' iBIOS Labs, somewhere.<br />
* ''Contact:'' Shugang Liu? Jing Zhang?<br />
* ''Extra info:''<br />
<br />
== Old Olympus Microscope ==<br />
<br />
Olympus optical microscope, fairly old, but quite good. Optical only - although has a port for attaching a camera, think it's some sort of old Olympus manual SLR fitting. Manual focus and manual x-y. Illuminates top and bottom, has some ND filters, facilities for phase contrast, Nomarski prism.<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' No-one really. Turn up and use it. If it's faulty, ask around or get it fixed yourself.<br />
* ''Extra info:''<br />
** There are 2 plugs. One powers the lower lamp, the other the top lamp. Top lamp is controlled by the external box that sits next to the microscope (switch on the side, use the knob to control brightness).<br />
** Switch the plugs off at the wall after use.<br />
** Put the eye-piece covers back on, and (after the microscope has cooled down) replace the dust cover.<br />
<br />
== Atomic Force Microscope (AFM) ==<br />
<br />
'''Description needs completing'''<br />
<br />
* ''Location:'' iBIOS Labs, somewhere<br />
* ''Contact:'' Shugang Liu<br />
* ''Extra info:''<br />
<br />
== Polytec Laser Vibrometer ==<br />
<br />
[http://www.polytec.com/eur/158_421.asp Polytec single-point vibrometer] comprising:<br />
# [http://www.polytec.com/eur/158_849.asp OFV-5000 Modular Vibrometer Controller]<br />
# [http://www.polytec.com/eur/158_8072.asp OFV-534 Compact Sensor Head]<br />
# [http://www.polytec.com/eur/158_1932.asp VD-02 velocity decoder (DC-1.5MHz)]<br />
# [http://www.polytec.com/eur/158_1932.asp DD-300 displacement decoder (50kHz-24MHz)]<br />
<br />
* Total range <1Hz - 24MHz<br />
* Calibrated output (convert volts to actual displacement)<br />
* Internal CCD camera so you can see what you're scanning<br />
<br />
* ''Location:'' usually 201 on the scanning tank, sometimes SiOS<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** Includes a couple of Mitutoyo objectives (x10 and x20) for very small spot size (useful for MEMs etc)<br />
** Includes a 15" flat screen TV for the internal CCD camera<br />
** Laser is class 2 (He:Ne) <1mW but don't look into the beam and follow all the usual precautions<br />
<br />
== Agilent 4GHz Oscilloscope ==<br />
<br />
[http://www.home.agilent.com/agilent/product.jspx?nid=-536902755.536908563.00&cc=AU&lc=eng Agilent Infiniium 80404B Oscilloscope]<br />
<br />
*4 channels<br />
*4GHz analogue bandwidth<br />
*40/20GSa/s (2/4 ch)<br />
*Extra waveform memory (2Mpts)<br />
*50 Ohm inputs; 2 adapters available to convert 2 inputs to 1M Ohm.<br />
*Matlab module<br />
<br />
* ''Location:'' Usually one of the Laser Ultrasound Labs (303-307)<br />
* ''Contact:'' [[Steve Sharples]] or whoever's lab it's in<br />
* ''Extra info:''<br />
** '''Sensitive inputs:''' they may look like regular BNCs, but if you start shoving 10V into them you're going to end up with a very large repair bill and will probably get a bollocking. Maximum voltage is written on the scopes. Use the 1M Ohm adapters if you need to look at bigger voltages (or have a high input impedance) but even with these the range of voltages that it can cope with is limited.<br />
** There is a Matlab module installed - I've never used it, but it might be useful<br />
** '''Grabbing data:'''<br />
***Windows: see the Agilent web site I guess<br />
***Linux: see [[Experimental PC#Scope (and AFG) utilities|this wiki page]] about installing ''agetwf'' (or install ''c_scan'' for more complex acquisition)<br />
<br />
== Tektronix MSO4034 Mixed Signal Oscilloscope ==<br />
<br />
[http://www.tek.com/products/oscilloscopes/mso4000/ Tektronix MSO4034 mixed signal oscilloscope]<br />
<br />
*4 analogue channels<br />
*16 digital channels<br />
*350MHz analogue bandwidth<br />
*2.5GSa/s<br />
*10Mpts waveform memory<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** This has lots of bit with it, for the digital inputs, in addition to the usual manuals, installation CDs etc. Keep them all in the supplied bag and don't lose them<br />
** '''Grabbing data:'''<br />
***Windows: see the Tek web site I guess, or the installation CD<br />
***Linux: see [[Experimental PC#Scope (and AFG) utilities|this wiki page]] about installing ''tgetwf'' (or install ''c_scan'' for more complex acquisition)<br />
<br />
== Laser Beam Profiler ==<br />
<br />
[http://www.newport.com/Laser-Beam-Profiler/318103/1033/catalog.aspx Newport LBP-2-USB laser beam profiler]<br />
<br />
* ''Location:'' Tower 201<br />
* ''Contact:'' [[Steve Sharples]] or Richard Smith<br />
* ''Extra info:''<br />
** Runs under Windows XP<br />
** '''Installation:'''<br />
*** Install software first<br />
*** Plug profiler into USB dongle<br />
*** Plug PSU brick into USB dongle<br />
*** Plug PSU brick into AC adapter (has US plug) and turn on mains<br />
*** Plug USB dongle into PC<br />
<br />
== Optical (Thermal) Power Meter ==<br />
<br />
[http://www.lambdaphoto.co.uk/xlp12 Gentec XLP-12] Thermopile-based optical power meter<br />
<br />
* ''Location:'' usually Laser Ultrasound Labs (303-307). Possibly 201.<br />
* ''Contact:'' [[Steve Sharples]] or whoever's experiment it's sat on<br />
* ''Extra info:''<br />
** Sensitivity ~1mW to ~2W<br />
** Works fine with mode-locked (e.g. femtosecond), Q-switched (Nd:YAG) and CW lasers (long time constant)<br />
<br />
== High Frequency Lock-in Amplifier ==<br />
<br />
[http://www.thinksrs.com/products/SR844.htm SR844 high frequency lock-in amplifier]<br />
<br />
* 25 kHz to 200 MHz frequency range<br />
* 80 dB dynamic reserve<br />
* Time constants from 100 µs to 30 ks (6, 12, 18 or 24 dB/oct rolloff)<br />
* "No Time Constant" mode (10 to 20 µs update rate)<br />
* Auto-gain, -phase, -reserve and -offset<br />
* Internal or external reference<br />
* Two 16-bit DACs and ADCs<br />
* GPIB and RS-232 interfaces<br />
<br />
* ''Location:'' usually Tower 304 (Ultrafast Lab)<br />
* ''Contact:'' Richard Smith<br />
* ''Extra info: MATLAB Instrument Control Toolbox driver available. Will be available on Mathworks File Exchange. Until then, contact [mailto:eexat5@nottingham.ac.uk Alkis Tsapanidis]''<br />
<br />
== Ultrasonic Pulser-Receiver ==<br />
<br />
[http://www.olympusndt.com/en/5072pr/ Olympus (formerly Panametrics) 5072PR Ultrasonic Pulser-Receiver]<br />
<br />
* 35MHz bandwidth<br />
* Spike excitation<br />
<br />
* ''Location:'' CBS<br />
* ''Contact:'' Melissa Mathers<br />
* ''Extra info:''<br />
<br />
== Signal Generators == <br />
<br />
* 2x Marconi 2019A 2U Rack Mount<br />
** 80kHz - 1040MHz sine wave generation with.<br />
** 10Hz resolution up to 520MHz, 20Hz above.<br />
** -127 to +13dBm output with 0.1dBm resolution.<br />
** 50Ohm Type-N RF output connector.<br />
** Keypad control interface.<br />
** GPIB.<br />
** Amplitude, frequency and phase modulation.<br />
*** External modulation input.<br />
*** Internal modulation oscillator running at 300Hz, 400Hz, 500Hz, 1kHz, 3kHz or 6kHz.<br />
** ''Location: Tower 201 (Applied Optics Main Lab), left cupboard on the right hand side of the lab.''<br />
** [http://bama.edebris.com/manuals/marconi/2018a/ Marconi 2018/9A manual]<br />
<br />
<br />
* 2x Marconi 2022C<br />
** 10kHz - 1040MHz sine wave generation.<br />
** 10Hz resolution up to 100MHz, 100Hz above.<br />
** -127 to +13dBm output with 0.1dBm resolution.<br />
** 50Ohm Type-N RF output connector.<br />
** Keypad control interface.<br />
** One of them has GPIB.<br />
** Amplitude, frequency and phase modulation with external modulation input.<br />
** ''Location: Tower 201 (Applied Optics Main Lab), left cupboard on the right hand side of the lab.''<br />
** Status: As of the 20th of April, these are in the hands of the technicians for repairs.<br />
<br />
<br />
* Marconi 2022D<br />
** 10kHz - 1040MHz sine wave generation.<br />
** 10Hz resolution up to 100MHz, 100Hz above.<br />
** -127 to +13dBm output with 0.1dBm resolution.<br />
** 50Ohm Type-N RF output connector.<br />
** Keypad control interface.<br />
** GPIB.<br />
** Amplitude, frequency and phase modulation.<br />
** External modulation input or internal modulation oscillator running at 400Hz, 1kHz or 3kHz.<br />
** ''Location: Tower 1003 (Applied Optics VLSI Systems Lab), on top of the cupboard on the left. Ask someone in there about it.''<br />
<br />
The manual for the Marconi 2022E seems to cover the functions for the C and D models. [http://bama.edebris.com/manuals/marconi/2022e/ Marconi 2022E manual].<br />
<br />
<br />
* [http://www.testequipmentconnection.com/specs/WAV%20180%20SPECS.PDF Wavetek Model 180]<br />
** .1Hz to 2MHz.<br />
** Sine, square or triangle wave.<br />
** 50mV to 20V output.<br />
** 50Ohm and TTL pulse outputs.<br />
** Adjustable DC offset.<br />
** 1000:1 adjustable frequency sweep.<br />
** VCG input and GCV output.<br />
** ''Location: Tower 1003 (Applied Optics VLSI Systems Lab), on top of the cupboard on the left. Ask someone in there about it.''<br />
<br />
<br />
* Leader Electronics 17A<br />
** 100kHz to 150MHz.<br />
** 100MHz to 450MHz harmonic.<br />
** Internal (1KHz) or external AM.<br />
** ''Location: Tower 1003 (Applied Optics VLSI Systems Lab), on top of the cupboard on the left. Ask someone in there about it.''<br />
<br />
== Ocean Optics USB Spectrometer and bits ==<br />
<br />
* [http://www.oceanoptics.com/Products/usb2000.asp Ocean Optics USB2000]<br />
** 450-750nm grating.<br />
** ~0.13nm wavelength resolution.<br />
** 250:1 SNR (at full signal)<br />
** 12-bit ADC <br />
** 3.2 RMS counts dark noise<br />
** 2 x 10^8 system dynamic range, 1300:1 for a single acquisition<br />
** 3 ms to 65s integration time.<br />
** USB bus powered.<br />
** [http://www.oceanoptics.com/Products/hl2000.asp Ocean Optics HL-2000-FHSA] light source.<br />
** [http://www.oceanoptics.com/Products/reflectionprobesstandard.asp Ocean Optics reflection/backscatter probe].<br />
** ''Contact: [mailto:eexat5@nottingham.ac.uk Alkis Tsapanidis]''<br />
** ''Location: Tower 1004.''<br />
** ''Extra Info: 32-bit version Windows *required*, we have no licence for the 64-bit driver. Can use a stand-alone application or a direct driver for acquisition. MATLAB driver wrapper and user interface available.''<br />
<br />
== Optical Choppers ==<br />
<br />
* [http://www.thorlabs.com/thorProduct.cfm?partNumber=MC1000A Thorlabs MC1000A]<br />
** 25Hz to 1kHz chopping with one blade.<br />
** <100pp frequency drift.<br />
** RS232 control.<br />
** ''Location: Tower 1004''.<br />
** ''Contact: Steve Morgan''.<br />
<br />
<br />
* [http://search.newport.com/?x2=sku&q2=3501 New Focus 3501]<br />
** GPIB<br />
** ''Location: Tower 201 (Applied Optics Main Lab), left cupboard on the right hand side of the lab.''<br />
<br />
== Light Sources ==<br />
<br />
<br />
* [http://www.newport.com/Oriel-Radiometric-Fiber-Optic-Source/377984/1033/catalog.aspx Oriel 77501]<br />
** 100 W quartz tungsten halogen lamp<br />
** 11mm fibre ferrule connector.<br />
** 6mm spot size.<br />
** Variable voltage.<br />
** Adjustable iris.<br />
** Manual shutter.<br />
** 1" round filter holder.<br />
** ''Location: Tower 1004.''<br />
** ''Contact: [mailto:eexat5@nottingham.ac.uk Alkis Tsapanidis].''<br />
<br />
<br />
<br />
* [http://www.oceanoptics.com/Products/hl2000.asp Ocean Optics HL-2000-FHSA] light source.<br />
** 7W Tungsten Halogen lamp.<br />
** SMA 905 connector.<br />
** Adjustable iris.<br />
** Electronic shutter.<br />
** Filter holder.<br />
** ''Location: Tower 1004.''<br />
** ''Contact: [mailto:eexat5@nottingham.ac.uk Alkis Tsapanidis].''<br />
<br />
== Other stuff ==<br />
<br />
<br />
* [http://www.farnell.com/datasheets/25582.pdf Blackstar 4503 Intelligent Multimeter]<br />
** GPIB and RS232.<br />
** Needs calibration.<br />
** ''Location: Tower 1003 (Applied Optics VLSI Systems Lab), on top of the cupboard on the left. Ask someone in there about it.''<br />
<br />
* Hatfield 2105 50Ohm Co-axial step attenuator.<br />
** Switchable attenuation levels (4x20, 1x10, 1x5, 2x2 and 1x1dB).<br />
** Max 0.5W.<br />
** ''Location: Tower 1003 (Applied Optics VLSI Systems Lab), on top of the cupboard on the left. Ask someone in there about it.''<br />
<br />
== Dell 12" Laptop ==<br />
<br />
[http://www.dell.com/downloads/emea/products/latit/D430_specs%20_sheet.pdf Dell Latitude D430 12" Laptop]<br />
<br />
* Standard UoN "PC Contract" Notebook<br />
* Core 2 Duo CPU<br />
* 2GB memory<br />
* Docking station contains DVD RW (no DVD on laptop itself)<br />
* WiFi, ethernet and modem<br />
* SD card reader<br />
* Windows XP SP3<br />
* MS Office 2003 SP3<br />
* ''Location:'' Tower - see Steve (or you should already know)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** Kensington lock should be used when left around the lab<br />
** Bag and USB mouse available<br />
** Set up with static (optics) IP on ethernet, and DHCP (roaming/UoN) on WiFi<br />
<br />
== Apple Macbook Laptop - cracked screen ==<br />
<br />
Apple Macbook laptop, 1.8GHz Core 2 Duo processor. Has a cracked screen, making it pretty much unusable as a laptop. Now pensioned off to desktop duties.<br />
<br />
* Apple Keynote: presentations<br />
* Apple Pages: word processor<br />
* MS Office 2003 for Mac (runs slow as it's the PowerPC version and runs under interpreter)<br />
* QuickTime Pro: encodes movies and animations (possibly the most useful thing it does nowadays)<br />
* ''Location:'' Tower 305 (Laser Ultrasound Labs foyer)<br />
* ''Contact:'' [[Steve Sharples]]<br />
<br />
= Local Expertise =<br />
<br />
This section to be filled in another day.<br />
<br />
= External Facilities =<br />
<br />
== Ground floor workshop ==<br />
<br />
== Physics fabrication and coating facilities ==<br />
<br />
Talk to [[Teti Stratoudaki]] or Jing Zhang</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=AO_resources&diff=1346AO resources2012-10-26T12:36:16Z<p>Teti: </p>
<hr />
<div> Applied Optics Group Resources <br />
<br />
This is a list of resources for use within the Applied Optics Group. This can include:<br />
<br />
* Internal facilities<br />
* Equipment and instruments (bought on shared funding e.g. SRIF)<br />
* Local expertise<br />
* External facilities (that members of the Applied Optics Group use)<br />
<br />
Some of the facilities are "home-built" experiments - cutting edge facilities that may not be available anywhere else in the world, but on the other hand may be tied up/uncalibrated/moth-balled. Others are commercial.<br />
<br />
I (Steve) will make a start on this of the things I know about, and some of the things I vaguely know about. Please correct errors and omissions.<br />
<br />
= Internal Facilities =<br />
<br />
== ASOPs dual fs laser system ==<br />
TBA<br />
<br />
== Fab Lab ==<br />
<br />
Facility for fabricating samples. You need training to use any of this facility - if you aren't already using it please don't help yourself. Ask someone to show you around and train you on the kit you are interested in.<br />
<br />
You also need to keep logs of everything you do in this lab.<br />
<br />
Facilities for metal film evaporation/sputtering, photo-lithography and general chemical procedures that require working under a fume-cupboard and a clean-ish environment.<br />
<br />
* ''Location:'' SiOS Labs<br />
* ''Contact:'' Matt Clark or [[Teti Stratoudaki]]<br />
<br />
!!! Please Keep Clean at all times !!!<br />
<br />
*''The Lab is equipped with:''<br />
** Edwards 306A evaporator with 6 sources<br />
** Emitech K575XD [[Sputter coater|sputter coater]] with 2 sources<br />
** Carbolite oven<br />
** Cobilt mask aligner<br />
** Spin coater<br />
** Decent scales<br />
** Microscope (camera TBA)<br />
<br />
When using it please complete the log books (and indicate your supervisor).<br />
<br />
[[Fab Lab]] pages<br />
<br />
== Soldering and minor metalworking ==<br />
<br />
Pillar drill (fairly crap), small bench vice, hand files, hacksaw, clamps etc.<br />
<br />
Temperature-controlled soldering iron<br />
<br />
Various PSUs, signal generators and scopes - all old<br />
<br />
Stock components (resistors, fuses, cables, wire, plugs/sockets/connectors etc)<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]] (for missing bits of equipment)<br />
* ''Extra info:''<br />
** Make sure you know what you're doing and how to operate the drill. Seek instruction if you're unsure. Don't take risks. Wear safety goggles (should be some nearby). Set the drill speed appropriately. Unplug the drill from the wall when moving the belt between pulleys. Clamp things down when drilling them (use the brush not your hands).<br />
** Tidy up after yourself - especially bits of metal after drilling.<br />
** Replace what you use: solder, solder wick, wire, stock components, anything.<br />
** If you see some old equipment and notice the electrical testing label has expired, get it PAT tested in the stores - it only takes a few minutes.<br />
** Switch everything off at the plug after you've used it - especially important for the soldering iron.<br />
<br />
== O-SAM ==<br />
<br />
'''Description needs completing'''<br />
<br />
* SRAS: surface microstructure imaging, using surface acoustic wave (SAW) velocity as contrast mechanism<br />
* Coating thickness measurement (again using SAW velocity)<br />
* Surface defect detection (cracks, delamination)<br />
<br />
* ''Location:'' Tower 303 and 306 (Laser Ultrasound Labs)<br />
* ''Contact:'' [[Steve Sharples]] (for missing bits of equipment)<br />
* ''Extra info:''<br />
<br />
== Scanning tank ==<br />
<br />
* Ultrasonic scanning tank<br />
* 6-axis<br />
* 2 axes may be scanned simultaneously<br />
* Panametrics 35MHz pulser-receiver<br />
* Range of focused and plane beam transducers<br />
* Agilent DSO8010A oscilloscope for acquisition<br />
* Uses ''c_scan'' running under Linux for control and acquisition<br />
<br />
* [[Scanning Tank]] detailed instructions<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
<br />
= Equipment and Instruments =<br />
<br />
== Posh Zeiss Microscope ==<br />
<br />
'''Description needs completing'''<br />
<br />
PC-controlled, with eye-pieces and CCD camera. Can reportedly stitch several images together. Illuminate from above and below. Lots of fancy stuff...<br />
<br />
* ''Location:'' iBIOS Labs, somewhere.<br />
* ''Contact:'' Shugang Liu? Jing Zhang?<br />
* ''Extra info:''<br />
<br />
== Old Olympus Microscope ==<br />
<br />
Olympus optical microscope, fairly old, but quite good. Optical only - although has a port for attaching a camera, think it's some sort of old Olympus manual SLR fitting. Manual focus and manual x-y. Illuminates top and bottom, has some ND filters, facilities for phase contrast, Nomarski prism.<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' No-one really. Turn up and use it. If it's faulty, ask around or get it fixed yourself.<br />
* ''Extra info:''<br />
** There are 2 plugs. One powers the lower lamp, the other the top lamp. Top lamp is controlled by the external box that sits next to the microscope (switch on the side, use the knob to control brightness).<br />
** Switch the plugs off at the wall after use.<br />
** Put the eye-piece covers back on, and (after the microscope has cooled down) replace the dust cover.<br />
<br />
== Atomic Force Microscope (AFM) ==<br />
<br />
'''Description needs completing'''<br />
<br />
* ''Location:'' iBIOS Labs, somewhere<br />
* ''Contact:'' Shugang Liu<br />
* ''Extra info:''<br />
<br />
== Polytec Laser Vibrometer ==<br />
<br />
[http://www.polytec.com/eur/158_421.asp Polytec single-point vibrometer] comprising:<br />
# [http://www.polytec.com/eur/158_849.asp OFV-5000 Modular Vibrometer Controller]<br />
# [http://www.polytec.com/eur/158_8072.asp OFV-534 Compact Sensor Head]<br />
# [http://www.polytec.com/eur/158_1932.asp VD-02 velocity decoder (DC-1.5MHz)]<br />
# [http://www.polytec.com/eur/158_1932.asp DD-300 displacement decoder (50kHz-24MHz)]<br />
<br />
* Total range <1Hz - 24MHz<br />
* Calibrated output (convert volts to actual displacement)<br />
* Internal CCD camera so you can see what you're scanning<br />
<br />
* ''Location:'' usually 201 on the scanning tank, sometimes SiOS<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** Includes a couple of Mitutoyo objectives (x10 and x20) for very small spot size (useful for MEMs etc)<br />
** Includes a 15" flat screen TV for the internal CCD camera<br />
** Laser is class 2 (He:Ne) <1mW but don't look into the beam and follow all the usual precautions<br />
<br />
== Agilent 4GHz Oscilloscope ==<br />
<br />
[http://www.home.agilent.com/agilent/product.jspx?nid=-536902755.536908563.00&cc=AU&lc=eng Agilent Infiniium 80404B Oscilloscope]<br />
<br />
*4 channels<br />
*4GHz analogue bandwidth<br />
*40/20GSa/s (2/4 ch)<br />
*Extra waveform memory (2Mpts)<br />
*50 Ohm inputs; 2 adapters available to convert 2 inputs to 1M Ohm.<br />
*Matlab module<br />
<br />
* ''Location:'' Usually one of the Laser Ultrasound Labs (303-307)<br />
* ''Contact:'' [[Steve Sharples]] or whoever's lab it's in<br />
* ''Extra info:''<br />
** '''Sensitive inputs:''' they may look like regular BNCs, but if you start shoving 10V into them you're going to end up with a very large repair bill and will probably get a bollocking. Maximum voltage is written on the scopes. Use the 1M Ohm adapters if you need to look at bigger voltages (or have a high input impedance) but even with these the range of voltages that it can cope with is limited.<br />
** There is a Matlab module installed - I've never used it, but it might be useful<br />
** '''Grabbing data:'''<br />
***Windows: see the Agilent web site I guess<br />
***Linux: see [[Experimental PC#Scope (and AFG) utilities|this wiki page]] about installing ''agetwf'' (or install ''c_scan'' for more complex acquisition)<br />
<br />
== Tektronix MSO4034 Mixed Signal Oscilloscope ==<br />
<br />
[http://www.tek.com/products/oscilloscopes/mso4000/ Tektronix MSO4034 mixed signal oscilloscope]<br />
<br />
*4 analogue channels<br />
*16 digital channels<br />
*350MHz analogue bandwidth<br />
*2.5GSa/s<br />
*10Mpts waveform memory<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** This has lots of bit with it, for the digital inputs, in addition to the usual manuals, installation CDs etc. Keep them all in the supplied bag and don't lose them<br />
** '''Grabbing data:'''<br />
***Windows: see the Tek web site I guess, or the installation CD<br />
***Linux: see [[Experimental PC#Scope (and AFG) utilities|this wiki page]] about installing ''tgetwf'' (or install ''c_scan'' for more complex acquisition)<br />
<br />
== Laser Beam Profiler ==<br />
<br />
[http://www.newport.com/Laser-Beam-Profiler/318103/1033/catalog.aspx Newport LBP-2-USB laser beam profiler]<br />
<br />
* ''Location:'' Tower 201<br />
* ''Contact:'' [[Steve Sharples]] or Richard Smith<br />
* ''Extra info:''<br />
** Runs under Windows XP<br />
** '''Installation:'''<br />
*** Install software first<br />
*** Plug profiler into USB dongle<br />
*** Plug PSU brick into USB dongle<br />
*** Plug PSU brick into AC adapter (has US plug) and turn on mains<br />
*** Plug USB dongle into PC<br />
<br />
== Optical (Thermal) Power Meter ==<br />
<br />
[http://www.lambdaphoto.co.uk/xlp12 Gentec XLP-12] Thermopile-based optical power meter<br />
<br />
* ''Location:'' usually Laser Ultrasound Labs (303-307). Possibly 201.<br />
* ''Contact:'' [[Steve Sharples]] or whoever's experiment it's sat on<br />
* ''Extra info:''<br />
** Sensitivity ~1mW to ~2W<br />
** Works fine with mode-locked (e.g. femtosecond), Q-switched (Nd:YAG) and CW lasers (long time constant)<br />
<br />
== High Frequency Lock-in Amplifier ==<br />
<br />
[http://www.thinksrs.com/products/SR844.htm SR844 high frequency lock-in amplifier]<br />
<br />
* 25 kHz to 200 MHz frequency range<br />
* 80 dB dynamic reserve<br />
* Time constants from 100 µs to 30 ks (6, 12, 18 or 24 dB/oct rolloff)<br />
* "No Time Constant" mode (10 to 20 µs update rate)<br />
* Auto-gain, -phase, -reserve and -offset<br />
* Internal or external reference<br />
* Two 16-bit DACs and ADCs<br />
* GPIB and RS-232 interfaces<br />
<br />
* ''Location:'' usually Tower 304 (Ultrafast Lab)<br />
* ''Contact:'' Richard Smith<br />
* ''Extra info: MATLAB Instrument Control Toolbox driver available. Will be available on Mathworks File Exchange. Until then, contact [mailto:eexat5@nottingham.ac.uk Alkis Tsapanidis]''<br />
<br />
== Ultrasonic Pulser-Receiver ==<br />
<br />
[http://www.olympusndt.com/en/5072pr/ Olympus (formerly Panametrics) 5072PR Ultrasonic Pulser-Receiver]<br />
<br />
* 35MHz bandwidth<br />
* Spike excitation<br />
<br />
* ''Location:'' CBS<br />
* ''Contact:'' Melissa Mathers<br />
* ''Extra info:''<br />
<br />
== Signal Generators == <br />
<br />
* 2x Marconi 2019A 2U Rack Mount<br />
** 80kHz - 1040MHz sine wave generation with.<br />
** 10Hz resolution up to 520MHz, 20Hz above.<br />
** -127 to +13dBm output with 0.1dBm resolution.<br />
** 50Ohm Type-N RF output connector.<br />
** Keypad control interface.<br />
** GPIB.<br />
** Amplitude, frequency and phase modulation.<br />
*** External modulation input.<br />
*** Internal modulation oscillator running at 300Hz, 400Hz, 500Hz, 1kHz, 3kHz or 6kHz.<br />
** ''Location: Tower 201 (Applied Optics Main Lab), left cupboard on the right hand side of the lab.''<br />
** [http://bama.edebris.com/manuals/marconi/2018a/ Marconi 2018/9A manual]<br />
<br />
<br />
* 2x Marconi 2022C<br />
** 10kHz - 1040MHz sine wave generation.<br />
** 10Hz resolution up to 100MHz, 100Hz above.<br />
** -127 to +13dBm output with 0.1dBm resolution.<br />
** 50Ohm Type-N RF output connector.<br />
** Keypad control interface.<br />
** One of them has GPIB.<br />
** Amplitude, frequency and phase modulation with external modulation input.<br />
** ''Location: Tower 201 (Applied Optics Main Lab), left cupboard on the right hand side of the lab.''<br />
** Status: As of the 20th of April, these are in the hands of the technicians for repairs.<br />
<br />
<br />
* Marconi 2022D<br />
** 10kHz - 1040MHz sine wave generation.<br />
** 10Hz resolution up to 100MHz, 100Hz above.<br />
** -127 to +13dBm output with 0.1dBm resolution.<br />
** 50Ohm Type-N RF output connector.<br />
** Keypad control interface.<br />
** GPIB.<br />
** Amplitude, frequency and phase modulation.<br />
** External modulation input or internal modulation oscillator running at 400Hz, 1kHz or 3kHz.<br />
** ''Location: Tower 1003 (Applied Optics VLSI Systems Lab), on top of the cupboard on the left. Ask someone in there about it.''<br />
<br />
The manual for the Marconi 2022E seems to cover the functions for the C and D models. [http://bama.edebris.com/manuals/marconi/2022e/ Marconi 2022E manual].<br />
<br />
<br />
* [http://www.testequipmentconnection.com/specs/WAV%20180%20SPECS.PDF Wavetek Model 180]<br />
** .1Hz to 2MHz.<br />
** Sine, square or triangle wave.<br />
** 50mV to 20V output.<br />
** 50Ohm and TTL pulse outputs.<br />
** Adjustable DC offset.<br />
** 1000:1 adjustable frequency sweep.<br />
** VCG input and GCV output.<br />
** ''Location: Tower 1003 (Applied Optics VLSI Systems Lab), on top of the cupboard on the left. Ask someone in there about it.''<br />
<br />
<br />
* Leader Electronics 17A<br />
** 100kHz to 150MHz.<br />
** 100MHz to 450MHz harmonic.<br />
** Internal (1KHz) or external AM.<br />
** ''Location: Tower 1003 (Applied Optics VLSI Systems Lab), on top of the cupboard on the left. Ask someone in there about it.''<br />
<br />
== Ocean Optics USB Spectrometer and bits ==<br />
<br />
* [http://www.oceanoptics.com/Products/usb2000.asp Ocean Optics USB2000]<br />
** 450-750nm grating.<br />
** ~0.13nm wavelength resolution.<br />
** 250:1 SNR (at full signal)<br />
** 12-bit ADC <br />
** 3.2 RMS counts dark noise<br />
** 2 x 10^8 system dynamic range, 1300:1 for a single acquisition<br />
** 3 ms to 65s integration time.<br />
** USB bus powered.<br />
** [http://www.oceanoptics.com/Products/hl2000.asp Ocean Optics HL-2000-FHSA] light source.<br />
** [http://www.oceanoptics.com/Products/reflectionprobesstandard.asp Ocean Optics reflection/backscatter probe].<br />
** ''Contact: [mailto:eexat5@nottingham.ac.uk Alkis Tsapanidis]''<br />
** ''Location: Tower 1004.''<br />
** ''Extra Info: 32-bit version Windows *required*, we have no licence for the 64-bit driver. Can use a stand-alone application or a direct driver for acquisition. MATLAB driver wrapper and user interface available.''<br />
<br />
== Optical Choppers ==<br />
<br />
* [http://www.thorlabs.com/thorProduct.cfm?partNumber=MC1000A Thorlabs MC1000A]<br />
** 25Hz to 1kHz chopping with one blade.<br />
** <100pp frequency drift.<br />
** RS232 control.<br />
** ''Location: Tower 1004''.<br />
** ''Contact: Steve Morgan''.<br />
<br />
<br />
* [http://search.newport.com/?x2=sku&q2=3501 New Focus 3501]<br />
** GPIB<br />
** ''Location: Tower 201 (Applied Optics Main Lab), left cupboard on the right hand side of the lab.''<br />
<br />
== Light Sources ==<br />
<br />
<br />
* [http://www.newport.com/Oriel-Radiometric-Fiber-Optic-Source/377984/1033/catalog.aspx Oriel 77501]<br />
** 100 W quartz tungsten halogen lamp<br />
** 11mm fibre ferrule connector.<br />
** 6mm spot size.<br />
** Variable voltage.<br />
** Adjustable iris.<br />
** Manual shutter.<br />
** 1" round filter holder.<br />
** ''Location: Tower 1004.''<br />
** ''Contact: [mailto:eexat5@nottingham.ac.uk Alkis Tsapanidis].''<br />
<br />
<br />
<br />
* [http://www.oceanoptics.com/Products/hl2000.asp Ocean Optics HL-2000-FHSA] light source.<br />
** 7W Tungsten Halogen lamp.<br />
** SMA 905 connector.<br />
** Adjustable iris.<br />
** Electronic shutter.<br />
** Filter holder.<br />
** ''Location: Tower 1004.''<br />
** ''Contact: [mailto:eexat5@nottingham.ac.uk Alkis Tsapanidis].''<br />
<br />
== Other stuff ==<br />
<br />
<br />
* [http://www.farnell.com/datasheets/25582.pdf Blackstar 4503 Intelligent Multimeter]<br />
** GPIB and RS232.<br />
** Needs calibration.<br />
** ''Location: Tower 1003 (Applied Optics VLSI Systems Lab), on top of the cupboard on the left. Ask someone in there about it.''<br />
<br />
* Hatfield 2105 50Ohm Co-axial step attenuator.<br />
** Switchable attenuation levels (4x20, 1x10, 1x5, 2x2 and 1x1dB).<br />
** Max 0.5W.<br />
** ''Location: Tower 1003 (Applied Optics VLSI Systems Lab), on top of the cupboard on the left. Ask someone in there about it.''<br />
<br />
== Dell 12" Laptop ==<br />
<br />
[http://www.dell.com/downloads/emea/products/latit/D430_specs%20_sheet.pdf Dell Latitude D430 12" Laptop]<br />
<br />
* Standard UoN "PC Contract" Notebook<br />
* Core 2 Duo CPU<br />
* 2GB memory<br />
* Docking station contains DVD RW (no DVD on laptop itself)<br />
* WiFi, ethernet and modem<br />
* SD card reader<br />
* Windows XP SP3<br />
* MS Office 2003 SP3<br />
* ''Location:'' Tower - see Steve (or you should already know)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** Kensington lock should be used when left around the lab<br />
** Bag and USB mouse available<br />
** Set up with static (optics) IP on ethernet, and DHCP (roaming/UoN) on WiFi<br />
<br />
== Apple Macbook Laptop - cracked screen ==<br />
<br />
Apple Macbook laptop, 1.8GHz Core 2 Duo processor. Has a cracked screen, making it pretty much unusable as a laptop. Now pensioned off to desktop duties.<br />
<br />
* Apple Keynote: presentations<br />
* Apple Pages: word processor<br />
* MS Office 2003 for Mac (runs slow as it's the PowerPC version and runs under interpreter)<br />
* QuickTime Pro: encodes movies and animations (possibly the most useful thing it does nowadays)<br />
* ''Location:'' Tower 305 (Laser Ultrasound Labs foyer)<br />
* ''Contact:'' [[Steve Sharples]]<br />
<br />
= Local Expertise =<br />
<br />
This section to be filled in another day.<br />
<br />
= External Facilities =<br />
<br />
== Ground floor workshop ==<br />
<br />
== Physics fabrication and coating facilities ==<br />
<br />
Talk to [[Teti Stratoudaki]] or Jing Zhang</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Teti_Stratoudaki&diff=1345Teti Stratoudaki2012-10-26T12:35:03Z<p>Teti: </p>
<hr />
<div>'''[[Teti Stratoudaki]]'''<br />
<br />
Location: Pharmacy Building – SIOS Lab Room C40 or CHOTs lab C36<br />
<br />
Email: t.stratoudaki@nottingham.ac.uk<br />
<br />
Phone: (0115) 95-15556 (office)<br />
<br />
'''Current Research'''<br />
<br />
*[[CHeap Optical Transducers (CHOTs)]]<br />
<br />
Design, development and fabrication of novel optical transducers for generation/detection of surface and bulk acoustic waves. Commercialisation route ([[KTI Award]], [[Innovation Fellowship]]) <br />
<br />
*[[Nonlinear Laser Ultrasonics]]<br />
<br />
'''Current Project'''<br />
<br />
Follow on Fund: '''Commercialisation of CHOTs'''<br />
<br />
<br />
<br />
'''Previous Projects'''<br />
<br />
[[CHOTs]]<br />
<br />
<br />
[[AERONEWS]]<br />
<br />
[[% fatigue]]</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Teti_Stratoudaki&diff=1344Teti Stratoudaki2012-10-26T12:33:44Z<p>Teti: </p>
<hr />
<div>'''[[Teti Stratoudaki]]'''<br />
<br />
Location: Pharmacy Building – SIOS Lab Room C40 or CHOTs lab C36<br />
<br />
Email: t.stratoudaki@nottingham.ac.uk<br />
<br />
Phone: (0115) 95-15556 (office)<br />
<br />
'''Current Research'''<br />
<br />
*[[CHeap Optical Transducers (CHOTs)]]<br />
<br />
Design, development and fabrication of novel optical transducers for generation/detection of surface and bulk acoustic waves. Commercialisation route ([[KTI Award]], [[Innovation Fellowship]]) <br />
<br />
*[[Nonlinear Laser Ultrasonics]]<br />
<br />
'''Current Project'''<br />
<br />
Follow on Fund: '''Commercialisation of CHOTs'''<br />
<br />
Measurement of Percentage Fatigue Life Using Non Destructive Techniques<br />
<br />
<br />
'''Previous Projects'''<br />
<br />
[[CHOTs]]<br />
<br />
<br />
[[AERONEWS]]<br />
<br />
[[% fatigue]]</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1343Sputter coater2012-10-26T12:29:36Z<p>Teti: </p>
<hr />
<div>To calibrate the sputter coater [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spin-coated layer and mask exposure.<br />
<br />
<br />
*IMPORTANT INFORMATION REGARDING THE ID TAG SYSTEM!!!!<br />
An ID tag is required to run the sputterer. If you are new in the lab and you need to use the sputterer please contact [[Teti Stratoudaki]] or [[Richard Smith]] who can issue a tag for you.<br />
The tag must be left on the tag reader, on top of the sputter coater, while the sputtering is taking place. The tag reader of the sputter coater is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputter coater needs to be restarted as well:<br />
* cd /sputterer<br />
* sudo ./run_sputterer_access_control<br />
You will have to provide the password for the computer (sofa) and the sputterer should then be back in working order.<br />
<br />
* CHANGING METAL SOURCES<br />
<br />
If you need to change metal sources you need to understand the use of spacers.<br />
There are two kinds of spacers</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1299Sputter coater2012-07-31T14:47:54Z<p>Teti: </p>
<hr />
<div>To callibrate the sputterer [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spincoated layer and mask exposure.<br />
<br />
<br />
******* IMPORTANT !!!!<br />
An ID card is required to run the sputterer. The tag must be left on the tag reader, on top of the sputterer, while the sputtering is taking place. The tag reader of the sputterer is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputterer need to be restarted as well:<br />
* cd /sputterer<br />
* sudo ./run_sputterer_access_control<br />
You will have to provide the password for the computer (sofa) and the sputterer should then be back in working order.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Sputter_coater&diff=1298Sputter coater2012-07-31T14:43:16Z<p>Teti: </p>
<hr />
<div>To callibrate the sputterer [[FTM]] coat to a nominal thickness then pass the sample to Rod Dykeman who'll scratch the coating and measure it using a Tallystep.<br />
<br />
If the coating is too hard (eg [[ITO]]) then you'll have to mask out some areas using [[photoresist]] and [[lift off]] to provide an edge. This might be possible using some dabs of photoresist rather than a spincoated layer and mask exposure.<br />
<br />
<br />
******* IMPORTANT !!!!<br />
An ID card is required to run the sputterer. The tag must be left on the tag reader, on top of the sputterer, while the sputtering is taking place. The tag reader of the sputterer is linked to the computer (sofa), next to the sputterer. In the unlikely event that the computer needs to be restarted, the software that controls the sputterer need to be restarted as well:</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=%25_fatigue&diff=1262% fatigue2011-11-30T14:28:57Z<p>Teti: </p>
<hr />
<div>'''Measurement of Percentage Fatigue Life Using Non Destructive Techniques'''<br />
<br />
The aim of this project is to develop a non-destructive ultrasonic technique for determining the remaining fatigue reserve of engineering components. <br />
<br />
Ultrasound has proven to be a powerful and effective technique for nondestructive testing. Traditional linear techniques are based on the detection of an ultrasonic signal that contains information about possible defects and their position, followed by appropriate repair where necessary. The checks are performed periodically and therefore need to be reliable, time efficient and cost efficient. The detection of defects is based on linear methods such as signal reflected from a defect or obstruction of ultrasonic transmission altogether. Although most traditional techniques are competent in detecting gross cracks, they are insensitive to the presence of clusters of microcracks, contacting defects, diffusion bonds, or disbonded delaminations. General degradation of a component can be very well hidden and degraded materials can pass for flawless under standard ultrasonic tests. <br />
<br />
As engineering components go through their life cycle, they undergo microscale plastic deformation in response to stress from which they do not quite recover fully (fatigue). In metals, fatigue progressively leads to formation of microcracks which will eventually develop into critical cracks and failure. The question is to develop a method able to monitor the progress of fatigue before the initiation of critical cracks. <br />
<br />
The accumulation of microcracks due to fatigue produces subtle changes in the material's elastic constants. These changes can be observed in the nonlinear response of the material. The method we use to observe the nonlinear response of the material is based on monitoring of the phase modulation of a high frequency (HF) surface acoustic wave interacting with a low frequency (LF) high amplitude stress inducing surface acoustic wave. The HF is generated by a laser and the LF by a contact transducer. The detection is done optically by means of a knife edge detector. The use of laser based ultrasonics in this experiments answers several problems encountered using contact transducers: It is a non contacting method for generation and detection of ultrasound meaning that it can be used remotely (e.g. hostile environments) and it is couplant free, hence free from nonlinearities introduced by the couplant medium. It is also suitable for complex geometries.<br />
<br />
The project is funded by DTI and the principal investigators are Mike Somekh and Matt Clark. The lead researcher is [[Teti Stratoudaki]]. It is a follow up of research performed by Ian Collison during his PhD thesis, an effort that is continued by Rob Ellwood in his current PhD study.<br />
<br />
'''Publications and Conferences'''<br />
<br />
<br />
* Stratoudaki T., Ellwood R., Sharples S., Clark M., Somekh M.G., Collison I.J. (2011) Measurement of material nonlinearity using surface acoustic wave parametric interaction and laser ultrasonics. ''J. Acoust. Soc. Am.'' '''129'''(4), 1721-1728.<br />
<br />
* Stratoudaki T., Collison I.J., Ellwood R., Sharples S., Clark M., Somekh M.G. (2010) Measuring material nonlinearity using frequency mixing of surface acoustic waves. 10th Anglo-French Physical Acoustics Conference (Lake District, UK).<br />
* Sharples S., Stratoudaki T., Ellwood R., Collison I.J., Clark M., Somekh M.G. (2010) Laser ultrasonics for detection of elastic nonlinearity using collinear mixing of surface acoustic waves. ''Review of Progress in Quantitative Nondestructive Evaluation'', Ed. Thompson D.O. and Chimenti D.E. '''1211''', 287-294.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Theodosia_Stratoudaki&diff=1261Theodosia Stratoudaki2011-11-30T14:16:49Z<p>Teti: </p>
<hr />
<div>'''[[Teti Stratoudaki]]'''<br />
<br />
Location: Pharmacy Building – SIOS Lab Room C40 or CHOTs lab C36<br />
<br />
Email: t.stratoudaki@nottingham.ac.uk<br />
<br />
Phone: (0115) 95-15556 (office)<br />
<br />
'''Current Research'''<br />
Theodosia Stratoudaki has been developing a new breed of optical transducers (CHOTs) suitable for industrial applications. She has worked on CHOTs design, development, application, and commercialisation stage. CHOTs are activated and read optically and offer a range of advantages over the traditional contact transducers: remote, reliable, couplant free operation with low impact on the inspected structure, activated by light and eliminating the need of wires. Theodosia Stratoudaki is currently developing a portable CHOTs system for endoscopic, non destructive testing of turbine engines in collaboration with Rolls-Royce. <br />
Another research dimension has been the study of non linear behaviour of ultrasound. This research used parametric interaction between two ultrasonic beams to measure material nonlinearity and explored whether this measurement may be linked to the fatigue the material has experienced as it stems from the microscopic plastic deformation that has built up during use.<br />
<br />
'''Previous Projects'''<br />
<br />
[[% fatigue]]<br />
<br />
<br />
[[AERONEWS]]</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Theodosia_Stratoudaki&diff=1260Theodosia Stratoudaki2011-11-30T14:15:42Z<p>Teti: </p>
<hr />
<div>'''[[Teti Stratoudaki]]'''<br />
<br />
Location: Pharmacy Building – SIOS Lab Room C40 or CHOTs lab C36<br />
<br />
Email: t.stratoudaki@nottingham.ac.uk<br />
<br />
Phone: (0115) 95-15556 (office)<br />
<br />
'''Current Research'''<br />
Theodosia Stratoudaki has been developing a new breed of optical transducers (CHOTs) suitable for industrial applications. She has worked on CHOTs design, development, application, and commercialisation stage. CHOTs are activated and read optically and offer a range of advantages over the traditional contact transducers: remote, reliable, couplant free operation with low impact on the inspected structure, activated by light and eliminating the need of wires. Theodosia Stratoudaki is currently developing a portable CHOTs system for endoscopic, non destructive testing of turbine engines in collaboration with Rolls-Royce. <br />
Another research dimension has been the study of non linear behaviour of ultrasound. This research used parametric interaction between two ultrasonic beams to measure material nonlinearity and explored whether this measurement may be linked to the fatigue the material has experienced as it stems from the microscopic plastic deformation that has built up during use.<br />
<br />
'''Previous Projects'''<br />
<br />
[[%fatigue]]<br />
<br />
<br />
[[AERONEWS]]</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Articles&diff=1257Articles2011-11-18T13:07:44Z<p>Teti: /* Applied Optics Publications: Journal papers */</p>
<hr />
<div>__NOTOC__<br />
==Applied Optics Publications: Journal papers==<br />
<br />
The University of Nottingham's [[Applied Optics]] group is an active research group with many of its members publishing peer recognised research in a wide variety of journal papers. Details of these publications are listed on this page, with BibTex entries available to download. Downloadable PDF versions of papers are also available. <br />
<br />
===2011===<br />
<bibtex><br />
@article{arca_evanescent_2011, title = {Evanescent CHOTs for the optical generation and detection of ultrahigh frequency {SAWs}}, volume = {269}, issn = {1742-6596}, url = {http://iopscience.iop.org/1742-6596/269/1/012012}, doi = {10.1088/1742-6596/269/1/012012}, journal = {Journal of Physics: Conference Series}, author = {A Arca and T Stratoudaki and R Smith and M Clark and M G Somekh}, year = {2011}, pages = {012012}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/c/cd/Paper_2010_JoPCS_AFPAC2010_Echots_AA.pdf} }</bibtex> <br />
<br />
<bibtex><br />
@article{smith_design_2011, title = {Design and fabrication of ultrasonic transducers with nanoscale dimensions}, volume = {278}, issn = {1742-6596}, url = {http://iopscience.iop.org/1742-6596/278/1/012035}, doi = {10.1088/1742-6596/278/1/012035}, journal = {Journal of Physics: Conference Series}, author = {R Smith and A Arca and X Chen and L Marques and M Clark and J Aylott and M Somekh}, year = {2011}, pages = {012035}, pdf ={http://optics.eee.nottingham.ac.uk/w/images/7/79/Paper_2010_JoPCS_LU2010_NanoscaleTransducers_RJS.pdf}}</bibtex><br />
<br />
<bibtex><br />
@article{AOM63,<br />
title="Measurement of material nonlinearity using surface acoustic wave<br />
parametric interaction and laser ultrasonics",<br />
author="T Stratoudaki and R Ellwood and S Sharples and M Clark and M Somekh",<br />
journal="JASA",<br />
year="2011",<br />
pages="1721-1728",<br />
}<br />
</bibtex><br />
<br />
<br />
===2010===<br />
<bibtex><br />
@article{AOM59,<br />
title="Rough surface detection of ultrasound using speckle correlated spatial filtering",<br />
author="Matt Clark",<br />
journal="JPCS",<br />
year="Accepted 2010",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM60,<br />
title="Frequency spectrum spatially resolved acoustic spectroscopy for microstructure imaging",<br />
author="W Li and S Sharples and M Clark and M Somekh",<br />
journal="JPCS",<br />
year="Accepted 2010",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM61,<br />
title="Non-contact nanoscale ultrasonic transducers",<br />
author="A Arca and L Marques and X Chen and R Smith and M Clark and J Aylott and M Somekh",<br />
journal="JPCS",<br />
year="Accepted 2010",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM62,<br />
title="Investigation of the fatigue process using nonlinear ultrasound",<br />
author="R Ellwood and S Sharples and T Stratoudaki and M Clark and M Somekh",<br />
journal="JPCS",<br />
year="Accepted 2010",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM64,<br />
title="A laser-activated MEMS transducer for efficient generation of<br />
narrowband longitudinal ultrasonic waves",<br />
author="X Chen and T Stratoudaki and SD Sharples and M Clark",<br />
journal="UFFC",<br />
year="2010",<br />
pages="Accepted for publication",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM65,<br />
title="Modulated light camera for space applications and assessment via a test bench system",<br />
author="D Summers and M Clark and I Stockford and S Achamfuo-Yeboah and JP Do Carmo",<br />
journal="ACTA ASTRONAUTICA",<br />
volume="66",<br />
number="9-10",<br />
pages="1399-1403",<br />
year="2010"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM66,<br />
title="Surface plasmon resonator: Design, construction and observation in the farfield",<br />
author="A Arca and M Clark and MG Somekh",<br />
journal="JAP",<br />
volume="",<br />
number="",<br />
pages="Accepted 2010",<br />
year="2010"<br />
}<br />
</bibtex><br />
<bibtex>@article{smith_multichannel_2010, title = {Multichannel, time-resolved picosecond laser ultrasound imaging and spectroscopy with custom complementary metal-oxide-semiconductor detector}, volume = {81}, issn = {00346748}, url = {http://dx.doi.org/10.1063/1.3298606}, number = {2}, journal = {Review of Scientific Instruments}, author = {Richard J. Smith and Roger A. Light and Steve D. Sharples and Nicholas S. Johnston and Mark C. Pitter and Mike G. Somekh}, year = {2010}, pages = {024901}, pdf={http://optics.eee.nottingham.ac.uk/w/images/0/0d/Paper_2010_RevSciInstru_CMOS_Parallel_detection.pdf} }, </bibtex> <br />
<br />
<br />
<bibtex><br />
@article{smith_parallel_2010, title = {Parallel detection in laser ultrasonics}, volume = {214}, issn = {1742-6596}, url = {http://dx.doi.org/10.1088/1742-6596/214/1/012006}, journal = {Journal of Physics: Conference Series}, author = {R J Smith and R A Light and N Johnston and S Sharples and M C Pitter and M G Somekh}, year = {2010}, pages = {012006}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/8/8a/Paper_2009_ICPPP_Leuven_Parallel_Detection_RJS.pdf} }</bibtex> <br />
<br />
<br />
===2009===<br />
<bibtex><br />
@unpublished{AOM46,<br />
author = "L P J Marques and J W Aylott and M Clark",<br />
title = "Arrays of Photoswitchable Nanoparticles: Towards Optical Imaging with Nanometre Resolution",<br />
note = "Pittcon",<br />
year="2009",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM53,<br />
title="Study of a high efficiency optical MEMs transducer for the generation of narrowband laser ultrasound",<br />
author="X Chen and T Stratoudaki and SD Sharples and M Clark",<br />
journal="JPCS",<br />
pages="",<br />
year="2009"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM54,<br />
title="Design and experimental study of microcantilever ultrasonic detection transducers",<br />
author="X Chen and T Stratoudaki and SD Sharples and M Clark",<br />
journal=UFFC,<br />
number="12",<br />
pages="2722-2732",<br />
volume="56",<br />
year="2009"<br />
}<br />
</bibtex><br />
<br />
<br />
===2008===<br />
<br />
<bibtex><br />
@article{AOM48,<br />
author ="I J Collison and T Stratoudaki and M Clark and M G Somekh",<br />
title ="Measurement of elastic nonlinearity using remote laser ultrasonics and CHeap Optical Transducers and dual frequency surface acoustic waves",<br />
journal ="Ultrasonics",<br />
volume ="48",<br />
number ="6-7",<br />
pages ="471-477",<br />
year ="2008"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM51,<br />
author ="Modha, K. N. and Stockford, I. M. and Kepiro, I. and Paterson, C. and Light, R. A. and Clark, M. and Pitter, M. and Hayes-Gill, B.",<br />
title ="A CMOS Camera for Pyramid Wavefront Sensors - art. no. 70155R",<br />
journal ="Adaptive Optics Systems, Pts 1-3",<br />
volume ="7015",<br />
pages ="R155-R155",<br />
note ="Hubin, N Max, CE Wizinowich, PL Conference on Adaptive Optics Systems JUN 23-28, 2008 Marseille, FRANCE",<br />
year ="2008"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM52,<br />
author ="K N Modha and I M Stockford and R Light and M Clark and M Pitter and B Hayes-Gill",<br />
title ="A Custom CMOS Sensor for Pyramidal Adaptive Optics System",<br />
journal ="2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop",<br />
pages ="3-6",<br />
note ="IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop JUN 18-20, 2008 Vancouver, CANADA",<br />
year ="2008"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{smith_parallel_2008, title = {Parallel detection of low modulation depth signals: application to picosecond ultrasonics}, volume = {19}, issn = {0957-0233}, shorttitle = {Parallel detection of low modulation depth signals},url = {http://dx.doi.org/10.1088/0957-0233/19/5/055301}, number = {5}, journal = {Measurement Science and Technology}, author = {R J Smith and M G Somekh and S D Sharples and M C Pitter and I Harrison}, postauth = {C Rossignol}, year = {2008}, pages = {055301},pdf={http://optics.eee.nottingham.ac.uk/w/images/8/89/Paper_2008_MST_Parallel_Detection_RJS.pdf} }</bibtex> <br />
<br />
<br />
===2007===<br />
<br />
<bibtex><br />
@article{AOM43,<br />
title="Cheap optical transducers (CHOTs) for narrowband ultrasonic applications",<br />
author="T Stratoudaki and JA Hernandez and M Clark and MG Somekh",<br />
journal="Measurement Science and Technology",<br />
volume="18",<br />
number="3",<br />
pages="843-851",<br />
year="2007"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM44,<br />
title="Aberrations in materials with random inhomogeneities",<br />
author="JA Hernandez and M Clark and SD Sharples and MG Somekh",<br />
journal=JASA,<br />
volume="121",<br />
number="3",<br />
Pages="1396-1405",<br />
year="2007"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM50,<br />
author ="M X Li and B Hayes-Gill and M Clark and M Pitter and M Somekh and I J Harrison",<br />
title = "5-GHz optical front-end for active pixel applications in standard 0.35-mu m CMOS - art. no. 647708",<br />
journal ="Silicon Photonics II",<br />
volume ="6477",<br />
pages ="47708-47708",<br />
note ="Kubby, JA Reed, GT Conference on Silicon Photonics II JAN 22-25, 2007 San Jose, CA",<br />
year ="2007"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{smith_use_2007, title = {Use of artificial neural networks on optical track width measurements}, volume = {46}, issn = {0003-6935},abstract = {We have demonstrated recently that, by using an ultrastable optical interferometer together with artificial neural networks {(ANNs),} track widths down to 60 nm can be measured with a 0.3 {NA} objective lens. We investigate the effective conditions for training {ANNs.} Experimental results will be used to show the characteristics of the training samples and the data format of the ANN inputs required to produce suitably trained {ANNs.} Results obtained with networks measuring double tracks, and classifying different structures, will be presented to illustrate the capability of the technique. We include a discussion on expansion of the application areas of the system, allowing it to be used as a general purpose instrument. (c) 2007 Optical Society of America.}, number = {22}, journal = {APPLIED OPTICS}, author = {RJ Smith and CW See and MG Somekh}, postauth = {A Yacoot}, year = {2007}, pages = {4857--4866},pdf={http://optics.eee.nottingham.ac.uk/w/images/4/4b/Paper_2007_AppliedOptics_ANN_RJS.pdf} }</bibtex> <br />
<br />
<br />
===2006===<br />
<br />
<bibtex><br />
@article{AOM42b,<br />
title="Spatially resolved acoustic spectroscopy (SRAS) for fast noncontact imaging of material microstructure",<br />
author="SD Sharples and M Clark and MG Somekh",<br />
journal="Optics Express",<br />
volume="14",<br />
number="22",<br />
pages="10435-10440",<br />
year="2006"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM42,<br />
title="Spatially resolved acoustic spectroscopy for fast noncontact imaging of material microstructure",<br />
author="SD Sharples and M Clark and MG Somekh",<br />
journal="Optics Express",<br />
volume="14",<br />
number="22",<br />
pages="10435-10440",<br />
year="2006"<br />
}<br />
</bibtex><br />
<br />
===2005===<br />
<br />
<bibtex><br />
@article{AOM41,<br />
title="Adaptive acoustic imaging using aberration correction in difficult materials",<br />
author="S D Sharples and M Clark and I J Collison and M G Somekh",<br />
journal="Insight",<br />
volume="47",<br />
number="2",<br />
pages="78-80",<br />
year="2005"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM49,<br />
author ="J A Hernandez and M Clark and I J Collison and M Somekh and S D Sharples",<br />
title ="Statistical characterisation of metals from ultrasonic aberrations",<br />
journal = "2005 IEEE Ultrasonics Symposium",<br />
pages ="1139-1142",<br />
note ="IEEE International Ultrasonics Symposium",<br />
year ="2005"<br />
}<br />
</bibtex><br />
<bibtex> @article{smith_optical_2005,title = {Optical track width measurements below 100 nm using artificial neural networks}, volume = {16}, issn = {0957-0233}, url = {http://dx.doi.org/10.1088/0957-0233/16/12/001}, number = {12}, journal = {Measurement Science and Technology}, author = {R J Smith and C W See and M G Somekh}, postauth = {A Yacoot and E Choi}, year = {2005}, pages = {2397--2404}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/4/42/Paper_2005_MST_ANN_RJS.pdf} }</bibtex><br />
<br />
<br />
===2004===<br />
<br />
<bibtex><br />
@article{AOM31,<br />
title="Integration of a photodiode array and centroid processing on a single CMOS chip for a real-time Shack-Hartmann wavefront sensor",<br />
author="B H Pui and B Hayes-Gill and M Clark and M G Somekh and CW See and S Morgan and Ng A",<br />
journal="IEEE Sensors Journal",<br />
volume="4",<br />
number="6",<br />
pages="787-794",<br />
year="2004"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@ARTICLE{AOM32,<br />
author ="Matthew Clark and Steve D Sharples and Mike Somekh",<br />
title ="Optimisation using measured Green's function for improving spatial coherence in acoustic measurements",<br />
journal ="Ultrasonics",<br />
year ="2004",<br />
volume ="42",<br />
pages ="205-212"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@ARTICLE{AOM33,<br />
author ="S D Sharples and M Clark and M Somekh",<br />
title ="Surface acoustic wavefront sensor using custom optics",<br />
journal ="Ultrasonics",<br />
year ="2004",<br />
volume ="42",<br />
pages ="647-651"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@ARTICLE{AOM34,<br />
author ="Y Hong and S D Sharples and M Clark and M G Somekh",<br />
title ="Rapid and accurate analysis of surface and pseudo-surface waves using adaptive laser ultrasound techniques",<br />
journal ="Ultrasonics",<br />
year ="2004",<br />
volume ="42",<br />
number ="1-9",<br />
pages ="515-518"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM35,<br />
title="Acoustic aberrations and statistical techniques",<br />
author="Jose Hernandez and Steve Sharples and Mike Somekh and Matt Clark",<br />
journal="Review of Progress in QNDE",<br />
year="2004",<br />
volume="",<br />
pages=""<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM36,<br />
title="Adaptive Correction for Acoustic Imaging in Difficult Materials",<br />
author="Ian Collinson and Steve Sharples and Mike Somekh and Matt Clark",<br />
journal="Review of Progress in QNDE",<br />
year="2004",<br />
volume="",<br />
pages=""<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM37,<br />
title="Dual-phase synchronous light detection with 64x64 CMOS modulated light camera",<br />
author="M C Pitter and R A Light and M G Somekh and M Clark and B R Hayes-Gill",<br />
journal="Electronics Letters",<br />
volume="40",<br />
number="22",<br />
pages="",<br />
year="2004",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM38,<br />
title="Camera pixel for coherent detection of modulated light",<br />
author="P R Dmochowski and B R Hayes-Gill and M Clark and J A Crowe and M G Somekh and S P Morgan",<br />
journal="Electronics Letters",<br />
volume="40",<br />
number="22",<br />
pages="1404-1405",<br />
year="2004",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{smartmoves,<br />
title="Modulated Light Cameras",<br />
author="Matt Clark",<br />
journal="Smartmoves",<br />
volume="5",<br />
pages="2-4",<br />
yaer="2004"<br />
}<br />
</bibtex><br />
<br />
<br />
===2003===<br />
<br />
<bibtex><br />
@article{AOM28,<br />
author="Steve D. Sharples and Matt Clark and Mike G. Somekh",<br />
title="All-optical adaptive scanning acoustic microscope",<br />
journal="Ultrasonics", <br />
volume="41", <br />
number="4", <br />
year="2003", <br />
pages="295-299",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@ARTICLE{AOM29,<br />
author ="Hong, Y. and Sharples, S. D. and Clark, M. and Somekh,<br />
M. G.",<br />
title ="Rapid measurement of surface acoustic wave velocity on<br />
single crystals using an all-optical adaptive scanning acoustic<br />
microscope",<br />
journal ="APL",<br />
year ="2003",<br />
volume ="83",<br />
pages ="3260-3262"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@ARTICLE{AOM30,<br />
author ="M C Pitter and J Y L Goh and M G Somekh and<br />
B R Hayes-Gill and M Clark and S P Morgan",<br />
title = "Phase-sensitive CMOS photo-circuit array for modulated<br />
thermoreflectance measurements",<br />
journal ="Electronics Letters",<br />
year ="2003",<br />
volume ="39",<br />
pages ="1339-1340"<br />
}<br />
</bibtex><br />
<br />
<br />
===2002===<br />
<br />
<bibtex><br />
@article{AOM25,<br />
title="The design and characterisation of an optical VLSI processor for real time centroid detection",<br />
author="B H Pui and B Hayes-Gill and M Clark and M G Somekh and C W See and J F Pieri and S P Morgan and A Ng",<br />
journal="Analog integrated circuits and signal processing",<br />
volume="32",<br />
number="1",<br />
year="2002",<br />
pages="67-75",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM26,<br />
title="Dynamic higher-order correction of acoustic aberration due to material microstructure",<br />
author="S D Sharples and M Clark and M G Somekh",<br />
journal="APL",<br />
volume="81",<br />
number="12",<br />
pages="2288-2290",<br />
year="2002",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM27,<br />
title="Laser ultrasonic microscopy",<br />
author="M Clark and S D Sharples and M G Somekh",<br />
journal="Material Evaluation",<br />
volume="60",<br />
number="9",<br />
year="2002",<br />
pages="1094-1098",<br />
}<br />
</bibtex><br />
<br />
<br />
===2001===<br />
<br />
<br />
<bibtex><br />
@article{AOM23,<br />
title= "Efficient and flexible laser ultrasound generation using spatial light modulators",<br />
author="S D Sharples and M Clark and M Somekh",<br />
journal="Electronics Letters",<br />
volume="37",<br />
number="18",<br />
year="2001",<br />
pages="1145-1146",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM24,<br />
title="Laser ultrasonic microscopy",<br />
author="M Clark and S D Sharples and M Somekh",<br />
journal="Progress in Natural Science",<br />
volume="11",<br />
number="S",<br />
year="2001",<br />
pages="S252-S257"<br />
}<br />
</bibtex><br />
<br />
<br />
===2000===<br />
<br />
<bibtex><br />
@article{AOM15,<br />
title="Diffractive acoustic elements for laser ultrasonics",<br />
author = "Matthew Clark and Steve D Sharples and Mike Somekh", <br />
journal="Journal of the Acoustical Society of America",<br />
volume= "107",<br />
number="6",<br />
pages= "3179-3185",<br />
year="2000",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM19,<br />
title="Non-contact surface acoustic microscopy",<br />
author="Matt Clark and Steve D Sharples and Mike Somekh",<br />
journal="Measurement Science and Technology",<br />
volume="11",<br />
pages="1792-1801",<br />
year="2000"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM20,<br />
title="All-optical scanning acoustic microscope: Rapid phase imaging",<br />
author="S D Sharples and M Clark and M G Somekh",<br />
journal="Electronics Letters",<br />
volume="36",<br />
number="25",<br />
pages="2112-2113",<br />
year="2000"<br />
}<br />
</bibtex><br />
<br />
<br />
===1999===<br />
<br />
<bibtex><br />
@article{AOM11,<br />
title="Fast all optical Rayleigh wave microscope: Imaging on isotropic and anisotropic materials",<br />
author = "Matthew Clark and Steve D Sharples and Mike Somekh", <br />
journal=UFFC,<br />
volume= "47",<br />
number="1",<br />
pages="65-74",<br />
year="1999"<br />
} <br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM13,<br />
title="Two-Dimensional, Three-Dimensional, and Gray-Scale Images Reconstructed from Computer-Generated Holograms Designed by use of a Direct-Search Method ",<br />
author = "Matthew Clark", <br />
journal="Applied Optics",<br />
volume= "38",<br />
number="25",<br />
pages="5331-5337",<br />
year="1999"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM14,<br />
title="Noncontact continuous wavefront/diffractive acoustic elements for Rayleigh wave control",<br />
author = "Steve D Sharples and Matthew Clark and Mike Somekh", <br />
journal="APL",<br />
volume= "74",<br />
number="24",<br />
pages ="3604-3606", <br />
year="1999"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM16,<br />
title="Lamb wave contrast in non-contacting surface acoustic microscopy",<br />
author = "M G Somekh and S D Sharples and M Clark and C W See",<br />
journal="Electronics Letters",<br />
volume= "35",<br />
number="21",<br />
pages="1886-1887",<br />
year="1999"<br />
}<br />
</bibtex><br />
<br />
<br />
===1998===<br />
<br />
<bibtex><br />
@article{AOM6,<br />
title = "Application of laser ultrasound for surface acoustic wave microscopy",<br />
author = "M G Somekh and F Linnane and M Clark and C W See",<br />
journal= "Trans Inst MC",<br />
volume= "20",<br />
number= "9",<br />
pages= "74-81",<br />
year="1998"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM7,<br />
title="Frequency control in laser ultrasound with computer generated holography",<br />
author="M Clark and F Linnane and S D Sharples and M G Somekh",<br />
journal = "APL",<br />
volume= "72",<br />
number="16",<br />
pages="1963-1965",<br />
year="1998"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM9,<br />
title="Ultrastable absolute-phase common-path optical profiler based on a computer-generated hologram",<br />
author="Nicholas B E Sawyer and Chung Wah See and Matthew Clark and Michael G Somekh and Jason Y L Goh",<br />
journal = appopt,<br />
volume= "37",<br />
number="28",<br />
pages="6716-6720",<br />
year="1998"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM10,<br />
title="Non contacting holographic surface acoustic wave microscope",<br />
author = "Matthew Clark and Steve D Sharples and Mike Somekh and Adam S Leitch",<br />
journal="Electronics Letters",<br />
volume= "35",<br />
pages="346-347",<br />
year="1999"<br />
}<br />
</bibtex><br />
<br />
===1997===<br />
<br />
<br />
===1996=== <br />
<br />
<bibtex><br />
<br />
@article{AOM3,<br />
title="A direct-search method for the computer design of holograms",<br />
author="Matthew Clark and Robin Smith",<br />
journal = "Optics Communications",<br />
volume= "124",<br />
number="1-2",<br />
pages="150-164",<br />
year="1996"<br />
}<br />
</bibtex><br />
<br />
<br />
===1995===<br />
===1994===<br />
===1993=== <br />
===1992===<br />
===1991=== <br />
===1990===<br />
===Pre 1990===</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Articles&diff=1256Articles2011-11-18T13:06:23Z<p>Teti: /* Applied Optics Publications: Journal papers */</p>
<hr />
<div>__NOTOC__<br />
==Applied Optics Publications: Journal papers==<br />
<br />
The University of Nottingham's [[Applied Optics]] group is an active research group with many of its members publishing peer recognised research in a wide variety of journal papers. Details of these publications are listed on this page, with BibTex entries available to download. Downloadable PDF versions of papers are also available. <br />
<br />
===2011===<br />
<bibtex><br />
@article{arca_evanescent_2011, title = {Evanescent CHOTs for the optical generation and detection of ultrahigh frequency {SAWs}}, volume = {269}, issn = {1742-6596}, url = {http://iopscience.iop.org/1742-6596/269/1/012012}, doi = {10.1088/1742-6596/269/1/012012}, journal = {Journal of Physics: Conference Series}, author = {A Arca and T Stratoudaki and R Smith and M Clark and M G Somekh}, year = {2011}, pages = {012012}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/c/cd/Paper_2010_JoPCS_AFPAC2010_Echots_AA.pdf} }</bibtex> <br />
<br />
<bibtex><br />
@article{smith_design_2011, title = {Design and fabrication of ultrasonic transducers with nanoscale dimensions}, volume = {278}, issn = {1742-6596}, url = {http://iopscience.iop.org/1742-6596/278/1/012035}, doi = {10.1088/1742-6596/278/1/012035}, journal = {Journal of Physics: Conference Series}, author = {R Smith and A Arca and X Chen and L Marques and M Clark and J Aylott and M Somekh}, year = {2011}, pages = {012035}, pdf ={http://optics.eee.nottingham.ac.uk/w/images/7/79/Paper_2010_JoPCS_LU2010_NanoscaleTransducers_RJS.pdf}}</bibtex><br />
<br />
<bibtex><br />
@article{AOM63,<br />
title="Measurement of material nonlinearity using surface acoustic wave<br />
parametric interaction and laser ultrasonics",<br />
author="T Stratoudaki and R Ellwood and S Sharples and M Clark and M Somekh",<br />
journal="JASA",<br />
year="2011",<br />
pages="1721-1728",<br />
}<br />
</bibtex><br />
<br />
<br />
===2010===<br />
<bibtex><br />
@article{AOM59,<br />
title="Rough surface detection of ultrasound using speckle correlated spatial filtering",<br />
author="Matt Clark",<br />
journal="JPCS",<br />
year="Accepted 2010",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM60,<br />
title="Frequency spectrum spatially resolved acoustic spectroscopy for microstructure imaging",<br />
author="W Li and S Sharples and M Clark and M Somekh",<br />
journal="JPCS",<br />
year="Accepted 2010",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM61,<br />
title="Non-contact nanoscale ultrasonic transducers",<br />
author="A Arca and L Marques and X Chen and R Smith and M Clark and J Aylott and M Somekh",<br />
journal="JPCS",<br />
year="Accepted 2010",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM62,<br />
title="Investigation of the fatigue process using nonlinear ultrasound",<br />
author="R Ellwood and S Sharples and T Stratoudaki and M Clark and M Somekh",<br />
journal="JPCS",<br />
year="Accepted 2010",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM63,<br />
title="Measurement of material nonlinearity using surface acoustic wave<br />
parametric interaction and laser ultrasonics",<br />
author="T Stratoudaki and R Ellwood and S Sharples and M Clark and M Somekh",<br />
journal="JASA",<br />
year="2010",<br />
pages="Accepted for publication",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM64,<br />
title="A laser-activated MEMS transducer for efficient generation of<br />
narrowband longitudinal ultrasonic waves",<br />
author="X Chen and T Stratoudaki and SD Sharples and M Clark",<br />
journal="UFFC",<br />
year="2010",<br />
pages="Accepted for publication",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM65,<br />
title="Modulated light camera for space applications and assessment via a test bench system",<br />
author="D Summers and M Clark and I Stockford and S Achamfuo-Yeboah and JP Do Carmo",<br />
journal="ACTA ASTRONAUTICA",<br />
volume="66",<br />
number="9-10",<br />
pages="1399-1403",<br />
year="2010"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM66,<br />
title="Surface plasmon resonator: Design, construction and observation in the farfield",<br />
author="A Arca and M Clark and MG Somekh",<br />
journal="JAP",<br />
volume="",<br />
number="",<br />
pages="Accepted 2010",<br />
year="2010"<br />
}<br />
</bibtex><br />
<bibtex>@article{smith_multichannel_2010, title = {Multichannel, time-resolved picosecond laser ultrasound imaging and spectroscopy with custom complementary metal-oxide-semiconductor detector}, volume = {81}, issn = {00346748}, url = {http://dx.doi.org/10.1063/1.3298606}, number = {2}, journal = {Review of Scientific Instruments}, author = {Richard J. Smith and Roger A. Light and Steve D. Sharples and Nicholas S. Johnston and Mark C. Pitter and Mike G. Somekh}, year = {2010}, pages = {024901}, pdf={http://optics.eee.nottingham.ac.uk/w/images/0/0d/Paper_2010_RevSciInstru_CMOS_Parallel_detection.pdf} }, </bibtex> <br />
<br />
<br />
<bibtex><br />
@article{smith_parallel_2010, title = {Parallel detection in laser ultrasonics}, volume = {214}, issn = {1742-6596}, url = {http://dx.doi.org/10.1088/1742-6596/214/1/012006}, journal = {Journal of Physics: Conference Series}, author = {R J Smith and R A Light and N Johnston and S Sharples and M C Pitter and M G Somekh}, year = {2010}, pages = {012006}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/8/8a/Paper_2009_ICPPP_Leuven_Parallel_Detection_RJS.pdf} }</bibtex> <br />
<br />
<br />
===2009===<br />
<bibtex><br />
@unpublished{AOM46,<br />
author = "L P J Marques and J W Aylott and M Clark",<br />
title = "Arrays of Photoswitchable Nanoparticles: Towards Optical Imaging with Nanometre Resolution",<br />
note = "Pittcon",<br />
year="2009",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM53,<br />
title="Study of a high efficiency optical MEMs transducer for the generation of narrowband laser ultrasound",<br />
author="X Chen and T Stratoudaki and SD Sharples and M Clark",<br />
journal="JPCS",<br />
pages="",<br />
year="2009"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM54,<br />
title="Design and experimental study of microcantilever ultrasonic detection transducers",<br />
author="X Chen and T Stratoudaki and SD Sharples and M Clark",<br />
journal=UFFC,<br />
number="12",<br />
pages="2722-2732",<br />
volume="56",<br />
year="2009"<br />
}<br />
</bibtex><br />
<br />
<br />
===2008===<br />
<br />
<bibtex><br />
@article{AOM48,<br />
author ="I J Collison and T Stratoudaki and M Clark and M G Somekh",<br />
title ="Measurement of elastic nonlinearity using remote laser ultrasonics and CHeap Optical Transducers and dual frequency surface acoustic waves",<br />
journal ="Ultrasonics",<br />
volume ="48",<br />
number ="6-7",<br />
pages ="471-477",<br />
year ="2008"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM51,<br />
author ="Modha, K. N. and Stockford, I. M. and Kepiro, I. and Paterson, C. and Light, R. A. and Clark, M. and Pitter, M. and Hayes-Gill, B.",<br />
title ="A CMOS Camera for Pyramid Wavefront Sensors - art. no. 70155R",<br />
journal ="Adaptive Optics Systems, Pts 1-3",<br />
volume ="7015",<br />
pages ="R155-R155",<br />
note ="Hubin, N Max, CE Wizinowich, PL Conference on Adaptive Optics Systems JUN 23-28, 2008 Marseille, FRANCE",<br />
year ="2008"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM52,<br />
author ="K N Modha and I M Stockford and R Light and M Clark and M Pitter and B Hayes-Gill",<br />
title ="A Custom CMOS Sensor for Pyramidal Adaptive Optics System",<br />
journal ="2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop",<br />
pages ="3-6",<br />
note ="IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop JUN 18-20, 2008 Vancouver, CANADA",<br />
year ="2008"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{smith_parallel_2008, title = {Parallel detection of low modulation depth signals: application to picosecond ultrasonics}, volume = {19}, issn = {0957-0233}, shorttitle = {Parallel detection of low modulation depth signals},url = {http://dx.doi.org/10.1088/0957-0233/19/5/055301}, number = {5}, journal = {Measurement Science and Technology}, author = {R J Smith and M G Somekh and S D Sharples and M C Pitter and I Harrison}, postauth = {C Rossignol}, year = {2008}, pages = {055301},pdf={http://optics.eee.nottingham.ac.uk/w/images/8/89/Paper_2008_MST_Parallel_Detection_RJS.pdf} }</bibtex> <br />
<br />
<br />
===2007===<br />
<br />
<bibtex><br />
@article{AOM43,<br />
title="Cheap optical transducers (CHOTs) for narrowband ultrasonic applications",<br />
author="T Stratoudaki and JA Hernandez and M Clark and MG Somekh",<br />
journal="Measurement Science and Technology",<br />
volume="18",<br />
number="3",<br />
pages="843-851",<br />
year="2007"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM44,<br />
title="Aberrations in materials with random inhomogeneities",<br />
author="JA Hernandez and M Clark and SD Sharples and MG Somekh",<br />
journal=JASA,<br />
volume="121",<br />
number="3",<br />
Pages="1396-1405",<br />
year="2007"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM50,<br />
author ="M X Li and B Hayes-Gill and M Clark and M Pitter and M Somekh and I J Harrison",<br />
title = "5-GHz optical front-end for active pixel applications in standard 0.35-mu m CMOS - art. no. 647708",<br />
journal ="Silicon Photonics II",<br />
volume ="6477",<br />
pages ="47708-47708",<br />
note ="Kubby, JA Reed, GT Conference on Silicon Photonics II JAN 22-25, 2007 San Jose, CA",<br />
year ="2007"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{smith_use_2007, title = {Use of artificial neural networks on optical track width measurements}, volume = {46}, issn = {0003-6935},abstract = {We have demonstrated recently that, by using an ultrastable optical interferometer together with artificial neural networks {(ANNs),} track widths down to 60 nm can be measured with a 0.3 {NA} objective lens. We investigate the effective conditions for training {ANNs.} Experimental results will be used to show the characteristics of the training samples and the data format of the ANN inputs required to produce suitably trained {ANNs.} Results obtained with networks measuring double tracks, and classifying different structures, will be presented to illustrate the capability of the technique. We include a discussion on expansion of the application areas of the system, allowing it to be used as a general purpose instrument. (c) 2007 Optical Society of America.}, number = {22}, journal = {APPLIED OPTICS}, author = {RJ Smith and CW See and MG Somekh}, postauth = {A Yacoot}, year = {2007}, pages = {4857--4866},pdf={http://optics.eee.nottingham.ac.uk/w/images/4/4b/Paper_2007_AppliedOptics_ANN_RJS.pdf} }</bibtex> <br />
<br />
<br />
===2006===<br />
<br />
<bibtex><br />
@article{AOM42b,<br />
title="Spatially resolved acoustic spectroscopy (SRAS) for fast noncontact imaging of material microstructure",<br />
author="SD Sharples and M Clark and MG Somekh",<br />
journal="Optics Express",<br />
volume="14",<br />
number="22",<br />
pages="10435-10440",<br />
year="2006"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM42,<br />
title="Spatially resolved acoustic spectroscopy for fast noncontact imaging of material microstructure",<br />
author="SD Sharples and M Clark and MG Somekh",<br />
journal="Optics Express",<br />
volume="14",<br />
number="22",<br />
pages="10435-10440",<br />
year="2006"<br />
}<br />
</bibtex><br />
<br />
===2005===<br />
<br />
<bibtex><br />
@article{AOM41,<br />
title="Adaptive acoustic imaging using aberration correction in difficult materials",<br />
author="S D Sharples and M Clark and I J Collison and M G Somekh",<br />
journal="Insight",<br />
volume="47",<br />
number="2",<br />
pages="78-80",<br />
year="2005"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM49,<br />
author ="J A Hernandez and M Clark and I J Collison and M Somekh and S D Sharples",<br />
title ="Statistical characterisation of metals from ultrasonic aberrations",<br />
journal = "2005 IEEE Ultrasonics Symposium",<br />
pages ="1139-1142",<br />
note ="IEEE International Ultrasonics Symposium",<br />
year ="2005"<br />
}<br />
</bibtex><br />
<bibtex> @article{smith_optical_2005,title = {Optical track width measurements below 100 nm using artificial neural networks}, volume = {16}, issn = {0957-0233}, url = {http://dx.doi.org/10.1088/0957-0233/16/12/001}, number = {12}, journal = {Measurement Science and Technology}, author = {R J Smith and C W See and M G Somekh}, postauth = {A Yacoot and E Choi}, year = {2005}, pages = {2397--2404}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/4/42/Paper_2005_MST_ANN_RJS.pdf} }</bibtex><br />
<br />
<br />
===2004===<br />
<br />
<bibtex><br />
@article{AOM31,<br />
title="Integration of a photodiode array and centroid processing on a single CMOS chip for a real-time Shack-Hartmann wavefront sensor",<br />
author="B H Pui and B Hayes-Gill and M Clark and M G Somekh and CW See and S Morgan and Ng A",<br />
journal="IEEE Sensors Journal",<br />
volume="4",<br />
number="6",<br />
pages="787-794",<br />
year="2004"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@ARTICLE{AOM32,<br />
author ="Matthew Clark and Steve D Sharples and Mike Somekh",<br />
title ="Optimisation using measured Green's function for improving spatial coherence in acoustic measurements",<br />
journal ="Ultrasonics",<br />
year ="2004",<br />
volume ="42",<br />
pages ="205-212"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@ARTICLE{AOM33,<br />
author ="S D Sharples and M Clark and M Somekh",<br />
title ="Surface acoustic wavefront sensor using custom optics",<br />
journal ="Ultrasonics",<br />
year ="2004",<br />
volume ="42",<br />
pages ="647-651"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@ARTICLE{AOM34,<br />
author ="Y Hong and S D Sharples and M Clark and M G Somekh",<br />
title ="Rapid and accurate analysis of surface and pseudo-surface waves using adaptive laser ultrasound techniques",<br />
journal ="Ultrasonics",<br />
year ="2004",<br />
volume ="42",<br />
number ="1-9",<br />
pages ="515-518"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM35,<br />
title="Acoustic aberrations and statistical techniques",<br />
author="Jose Hernandez and Steve Sharples and Mike Somekh and Matt Clark",<br />
journal="Review of Progress in QNDE",<br />
year="2004",<br />
volume="",<br />
pages=""<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM36,<br />
title="Adaptive Correction for Acoustic Imaging in Difficult Materials",<br />
author="Ian Collinson and Steve Sharples and Mike Somekh and Matt Clark",<br />
journal="Review of Progress in QNDE",<br />
year="2004",<br />
volume="",<br />
pages=""<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM37,<br />
title="Dual-phase synchronous light detection with 64x64 CMOS modulated light camera",<br />
author="M C Pitter and R A Light and M G Somekh and M Clark and B R Hayes-Gill",<br />
journal="Electronics Letters",<br />
volume="40",<br />
number="22",<br />
pages="",<br />
year="2004",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM38,<br />
title="Camera pixel for coherent detection of modulated light",<br />
author="P R Dmochowski and B R Hayes-Gill and M Clark and J A Crowe and M G Somekh and S P Morgan",<br />
journal="Electronics Letters",<br />
volume="40",<br />
number="22",<br />
pages="1404-1405",<br />
year="2004",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{smartmoves,<br />
title="Modulated Light Cameras",<br />
author="Matt Clark",<br />
journal="Smartmoves",<br />
volume="5",<br />
pages="2-4",<br />
yaer="2004"<br />
}<br />
</bibtex><br />
<br />
<br />
===2003===<br />
<br />
<bibtex><br />
@article{AOM28,<br />
author="Steve D. Sharples and Matt Clark and Mike G. Somekh",<br />
title="All-optical adaptive scanning acoustic microscope",<br />
journal="Ultrasonics", <br />
volume="41", <br />
number="4", <br />
year="2003", <br />
pages="295-299",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@ARTICLE{AOM29,<br />
author ="Hong, Y. and Sharples, S. D. and Clark, M. and Somekh,<br />
M. G.",<br />
title ="Rapid measurement of surface acoustic wave velocity on<br />
single crystals using an all-optical adaptive scanning acoustic<br />
microscope",<br />
journal ="APL",<br />
year ="2003",<br />
volume ="83",<br />
pages ="3260-3262"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@ARTICLE{AOM30,<br />
author ="M C Pitter and J Y L Goh and M G Somekh and<br />
B R Hayes-Gill and M Clark and S P Morgan",<br />
title = "Phase-sensitive CMOS photo-circuit array for modulated<br />
thermoreflectance measurements",<br />
journal ="Electronics Letters",<br />
year ="2003",<br />
volume ="39",<br />
pages ="1339-1340"<br />
}<br />
</bibtex><br />
<br />
<br />
===2002===<br />
<br />
<bibtex><br />
@article{AOM25,<br />
title="The design and characterisation of an optical VLSI processor for real time centroid detection",<br />
author="B H Pui and B Hayes-Gill and M Clark and M G Somekh and C W See and J F Pieri and S P Morgan and A Ng",<br />
journal="Analog integrated circuits and signal processing",<br />
volume="32",<br />
number="1",<br />
year="2002",<br />
pages="67-75",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM26,<br />
title="Dynamic higher-order correction of acoustic aberration due to material microstructure",<br />
author="S D Sharples and M Clark and M G Somekh",<br />
journal="APL",<br />
volume="81",<br />
number="12",<br />
pages="2288-2290",<br />
year="2002",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM27,<br />
title="Laser ultrasonic microscopy",<br />
author="M Clark and S D Sharples and M G Somekh",<br />
journal="Material Evaluation",<br />
volume="60",<br />
number="9",<br />
year="2002",<br />
pages="1094-1098",<br />
}<br />
</bibtex><br />
<br />
<br />
===2001===<br />
<br />
<br />
<bibtex><br />
@article{AOM23,<br />
title= "Efficient and flexible laser ultrasound generation using spatial light modulators",<br />
author="S D Sharples and M Clark and M Somekh",<br />
journal="Electronics Letters",<br />
volume="37",<br />
number="18",<br />
year="2001",<br />
pages="1145-1146",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM24,<br />
title="Laser ultrasonic microscopy",<br />
author="M Clark and S D Sharples and M Somekh",<br />
journal="Progress in Natural Science",<br />
volume="11",<br />
number="S",<br />
year="2001",<br />
pages="S252-S257"<br />
}<br />
</bibtex><br />
<br />
<br />
===2000===<br />
<br />
<bibtex><br />
@article{AOM15,<br />
title="Diffractive acoustic elements for laser ultrasonics",<br />
author = "Matthew Clark and Steve D Sharples and Mike Somekh", <br />
journal="Journal of the Acoustical Society of America",<br />
volume= "107",<br />
number="6",<br />
pages= "3179-3185",<br />
year="2000",<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM19,<br />
title="Non-contact surface acoustic microscopy",<br />
author="Matt Clark and Steve D Sharples and Mike Somekh",<br />
journal="Measurement Science and Technology",<br />
volume="11",<br />
pages="1792-1801",<br />
year="2000"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM20,<br />
title="All-optical scanning acoustic microscope: Rapid phase imaging",<br />
author="S D Sharples and M Clark and M G Somekh",<br />
journal="Electronics Letters",<br />
volume="36",<br />
number="25",<br />
pages="2112-2113",<br />
year="2000"<br />
}<br />
</bibtex><br />
<br />
<br />
===1999===<br />
<br />
<bibtex><br />
@article{AOM11,<br />
title="Fast all optical Rayleigh wave microscope: Imaging on isotropic and anisotropic materials",<br />
author = "Matthew Clark and Steve D Sharples and Mike Somekh", <br />
journal=UFFC,<br />
volume= "47",<br />
number="1",<br />
pages="65-74",<br />
year="1999"<br />
} <br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM13,<br />
title="Two-Dimensional, Three-Dimensional, and Gray-Scale Images Reconstructed from Computer-Generated Holograms Designed by use of a Direct-Search Method ",<br />
author = "Matthew Clark", <br />
journal="Applied Optics",<br />
volume= "38",<br />
number="25",<br />
pages="5331-5337",<br />
year="1999"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM14,<br />
title="Noncontact continuous wavefront/diffractive acoustic elements for Rayleigh wave control",<br />
author = "Steve D Sharples and Matthew Clark and Mike Somekh", <br />
journal="APL",<br />
volume= "74",<br />
number="24",<br />
pages ="3604-3606", <br />
year="1999"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM16,<br />
title="Lamb wave contrast in non-contacting surface acoustic microscopy",<br />
author = "M G Somekh and S D Sharples and M Clark and C W See",<br />
journal="Electronics Letters",<br />
volume= "35",<br />
number="21",<br />
pages="1886-1887",<br />
year="1999"<br />
}<br />
</bibtex><br />
<br />
<br />
===1998===<br />
<br />
<bibtex><br />
@article{AOM6,<br />
title = "Application of laser ultrasound for surface acoustic wave microscopy",<br />
author = "M G Somekh and F Linnane and M Clark and C W See",<br />
journal= "Trans Inst MC",<br />
volume= "20",<br />
number= "9",<br />
pages= "74-81",<br />
year="1998"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM7,<br />
title="Frequency control in laser ultrasound with computer generated holography",<br />
author="M Clark and F Linnane and S D Sharples and M G Somekh",<br />
journal = "APL",<br />
volume= "72",<br />
number="16",<br />
pages="1963-1965",<br />
year="1998"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM9,<br />
title="Ultrastable absolute-phase common-path optical profiler based on a computer-generated hologram",<br />
author="Nicholas B E Sawyer and Chung Wah See and Matthew Clark and Michael G Somekh and Jason Y L Goh",<br />
journal = appopt,<br />
volume= "37",<br />
number="28",<br />
pages="6716-6720",<br />
year="1998"<br />
}<br />
</bibtex><br />
<br />
<bibtex><br />
@article{AOM10,<br />
title="Non contacting holographic surface acoustic wave microscope",<br />
author = "Matthew Clark and Steve D Sharples and Mike Somekh and Adam S Leitch",<br />
journal="Electronics Letters",<br />
volume= "35",<br />
pages="346-347",<br />
year="1999"<br />
}<br />
</bibtex><br />
<br />
===1997===<br />
<br />
<br />
===1996=== <br />
<br />
<bibtex><br />
<br />
@article{AOM3,<br />
title="A direct-search method for the computer design of holograms",<br />
author="Matthew Clark and Robin Smith",<br />
journal = "Optics Communications",<br />
volume= "124",<br />
number="1-2",<br />
pages="150-164",<br />
year="1996"<br />
}<br />
</bibtex><br />
<br />
<br />
===1995===<br />
===1994===<br />
===1993=== <br />
===1992===<br />
===1991=== <br />
===1990===<br />
===Pre 1990===</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Laser_ultrasonics&diff=1255Laser ultrasonics2011-11-18T12:33:21Z<p>Teti: /* Laser ultrasonics */</p>
<hr />
<div>==Laser ultrasonics==<br />
{| class="wikitable" style="border: 1px solid darkgray"<br />
|- <br />
| [[Exotic Ultrasonics for the real world]]<br />
| We have developed a custom CMOS linear array detector for picosecond ultrasound measurements. Performing many measurements in parallel allows us to dramatically reduce the time it takes to perform each measurement. <br />
| [[Image:Ultrafast_Camera.PNG | 100px ]] <br />
|- <br />
| [[SRAS for materials characterisation]]<br />
| Spatially Resolved Acoustic Spectroscopy, it is a technique for mapping the surface acoustic wave velocity of a material. <br />
| [[Image:SRAS_300dpi_sras_austenitic_ss.png | 100px]]<br />
|- <br />
| [[CHOTs main|Cheap Optical Transducers]]<br />
| This is a new breed of ultrasonic transducers that are activated and read optically. CHOTs offer a range of advantages over the traditional contact transducers: remote, reliable, couplant free operation with low impact on the inspected structure, activated by light and eliminating the need of wires.<br />
| [[Image:Focused_SAW_CHOT.jpg | 100px]]<br />
<br />
|- <br />
| [[Nanoscale Ultrasonic Transducers]]<br />
| We have created new ultrasonic transducers operating at the nanoscale with frequencies in the gigahertz range and with wavelengths smaller than those of visible light. These will enable the diagnostic power of ultrasonics to be used at the nanoscale.<br />
| [[Image:BNC_hair2highlightred.PNG | 100px]]<br />
|}</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Laser_ultrasonics&diff=1254Laser ultrasonics2011-11-18T12:32:36Z<p>Teti: /* Laser ultrasonics */</p>
<hr />
<div>==Laser ultrasonics==<br />
{| class="wikitable" style="border: 1px solid darkgray"<br />
|- <br />
| [[Exotic Ultrasonics for the real world]]<br />
| We have developed a custom CMOS linear array detector for picosecond ultrasound measurements. Performing many measurements in parallel allows us to dramatically reduce the time it takes to perform each measurement. <br />
| [[Image:Ultrafast_Camera.PNG | 100px ]] <br />
|- <br />
| [[SRAS for materials characterisation]]<br />
| Spatially Resolved Acoustic Spectroscopy, it is a technique for mapping the surface acoustic wave velocity of a material. <br />
| [[Image:SRAS_300dpi_sras_austenitic_ss.png | 100px]]<br />
|- <br />
| [[CHOTs main|Cheap Optical Transducers]]<br />
| This is a new breed of ultrasonic transducers that are activated and read optically. CHOTs offer a range of advantages over the traditional contact transducers: remote, reliable, couplant free operation with low impact on the inspected structure, activated by light eliminating the need of wires.<br />
| [[Image:Focused_SAW_CHOT.jpg | 100px]]<br />
<br />
|- <br />
| [[Nanoscale Ultrasonic Transducers]]<br />
| We have created new ultrasonic transducers operating at the nanoscale with frequencies in the gigahertz range and with wavelengths smaller than those of visible light. These will enable the diagnostic power of ultrasonics to be used at the nanoscale.<br />
| [[Image:BNC_hair2highlightred.PNG | 100px]]<br />
|}</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=File:Focused_SAW_CHOT.jpg&diff=1253File:Focused SAW CHOT.jpg2011-11-18T12:30:44Z<p>Teti: Focused 20MHz SAW CHOT</p>
<hr />
<div>Focused 20MHz SAW CHOT</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Laser_ultrasonics&diff=1252Laser ultrasonics2011-11-18T12:22:19Z<p>Teti: /* Laser ultrasonics */</p>
<hr />
<div>==Laser ultrasonics==<br />
{| class="wikitable" style="border: 1px solid darkgray"<br />
|- <br />
| [[Exotic Ultrasonics for the real world]]<br />
| We have developed a custom CMOS linear array detector for picosecond ultrasound measurements. Performing many measurements in parallel allows us to dramatically reduce the time it takes to perform each measurement. <br />
| [[Image:Ultrafast_Camera.PNG | 100px ]] <br />
|- <br />
| [[SRAS for materials characterisation]]<br />
| Spatially Resolved Acoustic Spectroscopy, it is a technique for mapping the surface acoustic wave velocity of a material. <br />
| [[Image:SRAS_300dpi_sras_austenitic_ss.png | 100px]]<br />
|- <br />
| [[CHOTs main|Cheap Optical Transducers]]<br />
| This is a new breed of ultrasonic transducers that are activated and read optically. CHOTs offer a range of advantages over the traditional contact transducers: remote, reliable, couplant free operation with low impact on the inspected structure, activated by light eliminating the need of wires.<br />
| image<br />
<br />
|- <br />
| [[Nanoscale Ultrasonic Transducers]]<br />
| We have created new ultrasonic transducers operating at the nanoscale with frequencies in the gigahertz range and with wavelengths smaller than those of visible light. These will enable the diagnostic power of ultrasonics to be used at the nanoscale.<br />
| [[Image:BNC_hair2highlightred.PNG | 100px]]<br />
|}</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=How_to_SU8&diff=1245How to SU82011-08-19T12:40:17Z<p>Teti: </p>
<hr />
<div>!!!ALWAYS WORK UNDER THE FUME CUPBOARD WHEN HANDLING SU8 AND ITS ASSORTED CHEMICALS!!!<br />
<br />
(The following instructions are for SU8-100 and can also be applied to SU8-50. Check with microchem for guidelines for other version of SU8)<br />
<br />
(1) Put SU8 in a small beaker (~10ml in total)<br />
<br />
(2) Heat ~7ml of SU8<br />
<br />
(3) Heat up a hot plate @66°C for 10'(until it's runny).<br />
<br />
(4) Calculate 1ml/inch (or 1ml/2cm).<br />
<br />
(5) Use a glass syringe to spread (2ml volume would be OK). Keep it in acetone until needed.<br />
<br />
<br />
(6) Measure 1ml of SU8 (slowly because the barrel might run outof travel) and spread it in a spiral motion, so that it covers all thesurface of the sample.<br />
<br />
(7) Set the spinner.<br />
* Do a manual spread: You have 10“ to set the spread from 0 to 500rpm.<br />
* Set the spin spread @2500rpm for 30“ (or adjust spread as required)<br />
(8) Spin coat.<br />
<br />
(9) Bake on a hot plate @66°C for 20' and then @95°C for 50'. Make sure hot plate is flat to avoid thickness fluctuations. Let sample cool down to room temperature on hot plate.<br />
<br />
(10) Turn on mask aligner.<br />
<br />
(11) Develop pattern. Exposure time depends on how old the UV lamp is, so adjust accordingly.<br />
<br />
(12) Post exposure bake: 1' @65°C then 12'@95°C. The pattern will start developing by now.<br />
<br />
(13) After the sample has been heated, switch off the hot plate and let the sample cool down SLOWLY on the hot plate.<br />
<br />
(14) The developer for SU8 is the EC solvent (smells really bad, so keep the sash of the hood as low as possible!)<br />
<br />
(15) When cooled at room temperature, it needs to be developed.<br />
* put some developer in a beaker and let the sample in for ~5' while it's agitated.<br />
* stop the procedure with IPA.<br />
* if it's "milky" it means it's underdeveloped and needs to go back in to the developer.<br />
<br />
Good Luck!</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=How_to_SU8&diff=1244How to SU82011-08-19T12:08:27Z<p>Teti: </p>
<hr />
<div>!!!ALWAYS WORK UNDER THE FUME CUPBOARD WHEN HANDLING SU8 AND ITS ASSORTED CHEMICALS!!!<br />
<br />
(The following instructions are for SU8-100 and can also be applied to SU8-50. Check with microchem for guidelines for other version of SU8)<br />
<br />
(1) Put SU8 in a small beaker (~10ml in total)<br />
<br />
(2) Heat ~7ml of SU8<br />
<br />
(3) Heat up a hot plate @66°C for 10'(until it's runny).<br />
<br />
(4) Calculate 1ml/inch (or 1ml/2cm).<br />
<br />
(5) Set the spinner.<br />
<br />
(6) Do a manual spread: You have 10“ to set the spread from 0 to 500rpm.<br />
<br />
(7) Set the spin spread @2500rpm for 30“ (or adjust spread as required)<br />
<br />
(8) Use a glass syringe to spread (2ml volume would be OK). Keep it in acetone until needed.<br />
<br />
(9) Measure 1ml of SU8 (slowly because the barrel might run out of travel) and spread it in a spiral motion, so that it covers all the surface of the sample.<br />
<br />
(10) Clean the syringe immediately.<br />
<br />
(11) Spin coat.<br />
<br />
(12) Bake on a hot plate @66°C for 20' and then @95°C for 50'. Make sure hot plate is flat to avoid thickness fluctuations. Let sample cool down to room temperature on hot plate.<br />
<br />
(13) Turn on mask aligner.<br />
<br />
(14) Develop pattern. Exposure time depends on how old the UV lamp is, so adjust accordingly.<br />
<br />
(15) Post exposure bake: 1' @65°C then 12'@95°C. The pattern will start developing by now.<br />
<br />
(16) After the sample has been heated, switch off the hot plate and let the sample cool down SLOWLY on the hot plate.<br />
<br />
(17) The developer for SU8 is the EC solvent (smells really bad, so keep the sash of the hood as low as possible!)<br />
<br />
(18) When cooled at room temperature, it needs to be developed.<br />
* put some developer in a beaker and let the sample in for ~5' while it's agitated.<br />
* stop the procedure with IPA.<br />
* if it's "milky" it means it's underdeveloped and needs to go back in to the developer.<br />
<br />
Good Luck!</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=How_to_SU8&diff=1243How to SU82011-08-19T12:06:44Z<p>Teti: </p>
<hr />
<div>!!!ALWAYS WORK UNDER THE FUME CUPBOARD WHEN HANDLING SU8 AND ITS ASSORTED CHEMICALS!!!<br />
<br />
(The following instructions are for SU8-100 and can also be applied to SU8-50. Check with microchem for guidelines for other version of SU8)<br />
<br />
(1) Put SU8 in a small beaker (~10ml in total)<br />
<br />
(2) Heat ~7ml of SU8<br />
<br />
(3) Heat up a hot plate @66°C for 10'(until it's runny).<br />
<br />
(4) Calculate 1ml/inch (or 1ml/2cm).<br />
<br />
(5) Set the spinner.<br />
<br />
(6) Do a manual spread: You have 10“ to set the spread from 0 to 500rpm.<br />
<br />
(7) Set the spin spread @2500rpm for 30“ (or adjust spread as required)<br />
<br />
(8) Use a glass syringe to spread (2ml volume would be OK). Keep it in [[aceton]] until needed.<br />
<br />
(9) Measure 1ml of SU8 (slowly because the barrel might run out of travel) and spread it in a spiral motion, so that it covers all the surface of the sample.<br />
<br />
(10) Clean the syringe immediately.<br />
<br />
(11) Spin coat.<br />
<br />
(12) Bake on a hot plate @66°C for 20' and then @95°C for 50'. Make sure hot plate is flat to avoid thickness fluctuations. Let sample cool down to room temperature on hot plate.<br />
<br />
(13) Turn on mask aligner.<br />
<br />
(14) Develop pattern. Exposure time depends on how old the UV lamp is, so adjust accordingly.<br />
<br />
(15) Post exposure bake: 1' @65°C then 12'@95°C. The pattern will start developing by now.<br />
<br />
(16) After the sample has been heated, switch off the hot plate and let the sample cool down SLOWLY on the hot plate.<br />
<br />
(17) The developer for SU8 is the EC solvent (smells really bad, so keep the sash of the hood as low as possible!)<br />
<br />
(18) When cooled at room temperature, it needs to be developed.<br />
* put some developer in a beaker and let the sample in for ~5' while it's agitated.<br />
* stop the procedure with IPA.<br />
* if it's "milky" it means it's underdeveloped and needs to go back in to the developer.<br />
<br />
Good Luck!</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=How_to_SU8&diff=1242How to SU82011-08-19T12:05:44Z<p>Teti: </p>
<hr />
<div>!!!ALWAYS WORK UNDER THE FUME CUPBOARD WHEN HANDLING SU8 AND ITS ASSORTED CHEMICALS!!!<br />
<br />
(The following instructions are for SU8-100 and can also be applied to SU8-50. Check with microchem for guidelines for other version of SU8)<br />
<br />
(1) Put SU8 in a small beaker (~10ml in total)<br />
<br />
(2) Heat ~7ml of SU8<br />
<br />
(3) Heat up a hot plate @66°C for 10'(until it's runny).<br />
<br />
(4) Calculate 1ml/inch (or 1ml/2cm).<br />
<br />
(5) Set the spinner.<br />
<br />
(6) Do a manual spread: You have 10“ to set the spread from 0 to 500rpm.<br />
<br />
(7) Set the spin spread @2500rpm for 30“ (or adjust spread as required)<br />
<br />
(8) Use a glass syringe to spread (2ml volume would be OK). Keep it in [[aceton]] until needed.<br />
<br />
(9) Measure 1ml of SU8 (slowly because the barrel might run out of travel) and spread it in a spiral motion, so that it covers all the surface of the sample.<br />
<br />
(10) Clean the syringe immediately.<br />
<br />
(11) Spin coat.<br />
<br />
(12) Bake on a hot plate @66°C for 20' and then @95°C for 50'. Make sure hot plate is flat to avoid thickness fluctuations. Let sample cool down to room temperature on hot plate.<br />
<br />
(13) Turn on mask aligner.<br />
<br />
(14) Develop pattern. Exposure time depends on how old the UV lamp is, so adjust accordingly.<br />
<br />
(15) Post exposure bake: 1' @65°C then 12'@95°C. The pattern will start developing by now.<br />
<br />
(16) After the sample has been heated, switch off the hot plate and let the sample cool down SLOWLY on the hot plate.<br />
<br />
(17) The developer for SU8 is the EC solvent (smells really bad, so keep the sash of the hood as low as possible!)<br />
<br />
(18) When cooled at room temperature, it needs to be developed.<br />
:put some developer in a beaker and let the sample in for ~5' while it's agitated.<br />
:stop the procedure with IPA.<br />
:If it's "milky" it means it's underdeveloped and needs to go back in to the developer.<br />
<br />
Good Luck!</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=How_to_SU8&diff=1241How to SU82011-08-19T12:03:05Z<p>Teti: </p>
<hr />
<div>!!!ALWAYS WORK UNDER THE FUME CUPBOARD WHEN HANDLING SU8 AND ITS ASSORTED CHEMICALS!!!<br />
<br />
(The following instructions are for SU8-100 and can also be applied to SU8-50. Check with microchem for guidelines for other version of SU8)<br />
<br />
(1) Put SU8 in a small beaker (~10ml in total)<br />
<br />
(2) Heat ~7ml of SU8<br />
<br />
(3) Heat up a hot plate @66°C for 10'(until it's runny).<br />
<br />
(4) Calculate 1ml/inch (or 1ml/2cm).<br />
<br />
(5) Set the spinner.<br />
<br />
(6) Do a manual spread: You have 10'' to set the spread from 0 to 500rpm.<br />
<br />
(7) Set the spin spread @2500rpm for 30'' (or adjust spread as required)<br />
<br />
(8) Use a glass syringe to spread (2ml volume would be OK). Keep it in [[aceton]] until needed.<br />
<br />
(9) Measure 1ml of SU8 (slowly because the barrel might run out of travel) and spread it in a spiral motion, so that it covers all the surface of the sample.<br />
<br />
(10) Clean the syringe immediately.<br />
<br />
(11) Spin coat.<br />
<br />
(12) Bake on a hot plate @66°C for 20' and then @95°C for 50'. Make sure hot plate is flat to avoid thickness fluctuations. Let sample cool down to room temperature on hot plate.<br />
<br />
(13) Turn on mask aligner.<br />
<br />
(14) Develop pattern. Exposure time depends on how old the UV lamp is, so adjust accordingly.<br />
<br />
(15) Post exposure bake: 1' @65°C then 12'@95°C. The pattern will start developing by now.<br />
<br />
(16) After the sample has been heated, switch off the hot plate and let the sample cool down SLOWLY on the hot plate.<br />
<br />
(17) The developer for SU8 is the EC solvent (smells really bad, so keep the sash of the hood as low as possible!)<br />
<br />
(18) When cooled at room temperature, it needs to be developed.<br />
:put some developer in a beaker and let the sample in for ~5' while it's agitated.<br />
:stop the procedure with IPA.<br />
:If it's "milky" it means it's underdeveloped and needs to go back in to the developer.<br />
<br />
Good Luck!</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=How_to_SU8&diff=1240How to SU82011-08-19T12:01:29Z<p>Teti: </p>
<hr />
<div>!!!ALWAYS WORK UNDER THE FUME CUPBOARD WHEN HANDLING SU8 AND ITS ASSORTED CHEMICALS!!!<br />
(The following instructions are for SU8-100 and can also be applied to SU8-50. Check with microchem for guidelines for other version of SU8)<br />
<br />
(1) Put SU8 in a small beaker (~10ml in total)<br />
<br />
(2) Heat ~7ml of SU8<br />
<br />
<br />
(3) Heat up a hot plate @66°C for 10'(until it's runny).<br />
<br />
(4) Calculate 1ml/inch (or 1ml/2cm).<br />
<br />
(5) Set the spinner.<br />
<br />
(6) Do a manual spread: You have 10'' to set the spread from 0 to 500rpm.<br />
<br />
(7) Set the spin spread @2500rpm for 30'' (or adjust spread as required)<br />
<br />
(8) Use a glass syringe to spread (2ml volume would be OK). Keep it in [[aceton]] until needed.<br />
<br />
(9) Measure 1ml of SU8 (slowly because the barrel might run out of travel) and spread it in a spiral motion, so that it covers all the surface of the sample.<br />
<br />
(10) Clean the syringe immediately.<br />
<br />
(11) Spin coat.<br />
<br />
(12) Bake on a hot plate @66°C for 20' and then @95°C for 50'. Make sure hot plate is flat to avoid thickness fluctuations. Let sample cool down to room temperature on hot plate.<br />
<br />
(13) Turn on mask aligner.<br />
<br />
(14) Develop pattern. Exposure time depends on how old the UV lamp is, so adjust accordingly.<br />
<br />
(15) Post exposure bake: 1' @65°C then 12'@95°C. The pattern will start developing by now.<br />
<br />
(16) The developer for SU8 is the EC solvent (smells really bad, so keep the sash of the hood as low as possible!)<br />
<br />
(17) Wash your photolith mask with [[aceton]].<br />
<br />
(18) After the sample has been heated, switch off the hot plate and let the sample cool down SLOWLY on the hot plate.<br />
<br />
(19) When cooled at room temperature, it needs to be developed.<br />
:put some developer in a beaker and let the sample in for ~5' while it's agitated.<br />
:stop the procedure with IPA.<br />
:If it's "milky" it means it's underdeveloped and needs to go back in to the developer.<br />
<br />
Good Luck!</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=How_to_SU8&diff=1239How to SU82011-08-19T11:49:51Z<p>Teti: Created page with "!!!ALWAYS WORK UNDER THE FUME CUPBOARD WHEN HANDLING SU8 AND ITS ASSORTED CHEMICALS!!! (The following instructions are for SU8-100 and can also be applied to SU8-50. Check with m..."</p>
<hr />
<div>!!!ALWAYS WORK UNDER THE FUME CUPBOARD WHEN HANDLING SU8 AND ITS ASSORTED CHEMICALS!!!<br />
(The following instructions are for SU8-100 and can also be applied to SU8-50. Check with microchem for guidelines for other version of SU8)<br />
<br />
(1) Put SU8 in a small beaker (~10ml in total)<br />
<br />
(2) Heat ~7ml of SU8<br />
<br />
<br />
(3) Heat up a hot plate @66°C for 10'(until it's runny).<br />
<br />
(4) Calculate 1ml/inch (or 1ml/2cm).<br />
<br />
(5) Set the spinner.<br />
<br />
(6) Do a manual spread: You have 10'' to set the spread from 0 to 500rpm.<br />
<br />
(7) Set the spin spread @2500rpm for 30'' (or adjust spread as required)<br />
<br />
(8) Use a glass syringe to spread (2ml volume would be OK). Keep it in [[aceton]] until needed.<br />
<br />
Cleaning of substrates / samples should always be done in the fumecupboard. Lab coat, goggles and gloves should be worn at all times.<br />
<br />
Useclean glassware, the ultrasonic bath should be ~half full of water, topup with [[ultrapure water]] or [[distilled]] if required and samples<br />
should be placed in clean glassware, just covered in solvent in the bath. <br />
<br />
The [[nitrogen]] should be on at the bottle and the N2 gun line should be set to 1 bar.<br />
<br />
(1) 8 minutes in [[ethyl lactate]] (yellow bottle) in the ultrasonic bath.<br />
<br />
Dry with the [[nitrogen]] gun.<br />
<br />
(2) 8 minutes in [[acetone]] in the ultrasonic bath.<br />
<br />
Do not dry with the [[nitrogen]] gun as actetone fumes are to be avoided.<br />
<br />
(3) Rinse with [[methanol]] then 8 minutes in the ultrasonic bath.<br />
<br />
Dry with the [[nitrogen]] gun.<br />
<br />
(4) 8 minutes in [[isopropanol]] (blue bottle) in the ultrasonic bath.<br />
<br />
Finally dry the samples and put into a clean beaker. The samples are now clean and ready to use.<br />
<br />
Betweenthe stages the beakers should be cleaned. to do this, wash out thebeaker with the same chemicals in order as above and place upside downat the back of the fume cupboard on a tissue to dry. Once dry they canbe used again or put into the glassware cupboard.<br />
<br />
Ifthe wash bottles get low/empty, they can be refilled by topping up fromthe main store bottles in the chemical cupboard. bottles should betopped up in the fume cupboard and any spillage wiped off the mainbottle before being put back into the cupboard.<br />
<br />
When finished turn off the nitrogen both at the main bottle and at the fume cupboard.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Fab_Lab&diff=1238Fab Lab2011-08-19T11:37:06Z<p>Teti: </p>
<hr />
<div>Fab Lab located in SIOS<br />
<br />
*''The Lab is equipped with:''<br />
** Edwards 306A [[evaporator]] with 6 sources<br />
** Emitech K575XD [[sputter coater]] with 2 sources<br />
** Carbolite [[oven]]<br />
** Cobilt [[mask aligner]]<br />
** [[Spin coater]]<br />
** Decent [[scales]]<br />
** [[Microscope]] (camera TBA)<br />
** [[Fume cupboard]]<br />
<br />
When using it please complete the log books (and indicate your supervisor).<br />
<br />
* Various howtos:<br />
<br />
** [[How to clean a sample prior to lithography]]<br />
** [[Where to get various things]]<br />
** [[Making a photomask]]<br />
** [[Polystyrene sacrificial layer]]<br />
** [[How to SU8]]</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=AERONEWS&diff=393AERONEWS2008-10-21T13:06:27Z<p>Teti: </p>
<hr />
<div>'''Health Monitoring of Aircraft by Nonlinear Elastic Wave Spectroscopy '''<br />
<br />
Nonlinear Elastic Wave Spectroscopy (NEWS) and related acoustic and ultrasonic methods comprise a new class of innovative non-destructive techniques that provide extreme sensitivity in detecting and imaging incipient damage in the form of microcracks or delaminations, weakening of adhesive bonds, thermal and chemical damage, etc. The sensitivity and applicability of nonlinear methods to damage are superior to those obtained by currently used technologies. NEWS methods are in various stages of development and have not yet been applied to aircraft health monitoring. The project’s goal was to examine, confirm and exploit the successful results of these techniques, using fundamental materials research on fatigue loading, and to apply them to the particular field of aeronautics.<br />
<br />
The project joined the efforts of 19 different partners from the industry and the academic world, spread in 8 different European countries. Our role in this project had a dual aspect:<br />
<br />
* Development of novel optical transducer suitable for NEWS and aerospace applications that would allow generation of narrowband ultrasonic signals and filtering of harmonics. <br />
<br />
* Experiments with dual sources (low and high frequency) for non linear mixing<br />
<br />
For the first task we developed CHOTs (Cheap Optical Transducers). These are structures that are printed, deposited or in someway attached to the surface of the sample and are optically excited to generate and detect ultrasound. They can be broken down in to two parts, one for generation and one for detection and each part can work independently from the other for example generating ultrasound that will be detected by other means or detect ultrasound that is generated by other means. Most importantly, the user has full control of the generated/detected wavemode, the directivity of the wave and its frequency content.<br />
<br />
One of the fields that CHOTs are most useful for is nonlinear acoustics. For such experiments we need narrowband ultrasound for generation and appropriate filtering for detection. This brings us to the second task within this project. The experiment is based on the interaction between a Low Frequency (LF) Surface Acoustic Wave (in our case a 1MHz SAW generated by a transducer) and a High Frequency (HF) SAW (the laser generated 82MHz SAW). By varying the delay between the 2 waves we can observe a phase modulation of the HF. This modulation is dependant on the degree of stress that the transducer is putting on the sample. The concept is that when the HF interacts with for example with the peak of the LF, the degree of phase modulation is different than when they interact at (for example) a trough. It can be shown that this phase variation is proportional to the non-linear change of the material's elastic constants and the detection of the change can be used to detect early stage defects. A pair of CHOTs have been successfully incorporated in this experiment for generation of the HF SAW and detection of the ultrasonic signal on a fused silica sample to measure the phase modulation of the HF.<br />
<br />
The project was funded by the EU and finished in March 2008. [[Teti Stratoudaki]] was work package leader and lead researcher. The work on the nonlinear experiment was conducted by Ian Collison as part of his PhD study. Matt Clark and Mike Somekh held the direction for our participation in AERONEWS.<br />
<br />
'''Publications and Conferences '''<br />
<br />
* Collison I.J., Stratoudaki T., Clark M., Somekh M.G. Measurement of elastic nonlinearity using remote laser ultrasonics and CHeap Optical Transducers and dual frequency surface acoustic waves. DOI: 10-1016/j.ultras.2008.07.003.<br />
<br />
*Stratoudaki T., Hernandez J.A., Clark M., Somekh M.G. (2007) CHeap Optical Transducers (CHOTs) for narrowband ultrasonic applications. Meas. Sci. Technol, 18, 843-851.<br />
<br />
* Collison I.J., Stratoudaki T., Clark M., Somekh M.G. (2007) Measurement of elastic nonlinearity using remote laser ultrasonics and CHeap Optical Transducers and dual frequency surface acoustic waves. 2007 International Congress on Ultrasonics (Vienna).<br />
<br />
* Stratoudaki T., Clark M., Somekh M.G (2006) Novel optical transducers for nonlinear ultrasonic applications. 9th European Conference on Non-Destructive Testing (Berlin).</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=KTI_Award&diff=392KTI Award2008-10-21T13:02:49Z<p>Teti: </p>
<hr />
<div>'''CHOTs: from lab to the real world'''<br />
<br />
The University of Nottingham has developed a novel ultrasonic transducer for non-destructive testing that allow for the first time remote and couplant free operation. This system is referred to as Cheap Optical Transducers, CHOTs. The transducers can be placed on the surface of a component and generate and detect ultrasound signals when activated by a laser; therefore offers truly remote operation without need for attached cables or power supplies of any kind.<br />
<br />
A patent has been filed (publication number WO 2007/135439) in order to protect and fully exploit the new technology. Due to the nature of the market the commercialisation strategy is to license the CHOTs technology to Non-Destructive Testing (NDT) equipment manufacturers.<br />
The CHOTs technology has been presented and discussed with various key players within the international NDT market space and valuable feedback has been gained. All companies have stressed that one of the major key factors for supporting this technology is to bring proof of their use on samples similar in size, shape and materials to the ones used for testing by their clients. Therefore, t''he aim of this project is to demonstrate the use of CHOTs on samples similar in size, shape and materials to the ones used in potential licensees' markets (for example an aeroengine component)''.<br />
<br />
The Knowledge Transfer and Innovation Award is funded by the University of Nottingham.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Innovation_Fellowship&diff=391Innovation Fellowship2008-10-21T13:02:04Z<p>Teti: </p>
<hr />
<div>'''Novel Non-destructive testing method: cheap, remote, simple and portable testing'''<br />
<br />
<br />
Many engineering systems and especially those related to safety critical applications, require on-going testing using Non-Destructive Testing (NDT). For example, aircraft turbine blades can develop cracks over time and need regular testing: being able to identify when a blade might be at risk of failing without having to dismantle the engine and ground the aircraft would be of enormous benefit for both safety and cost reasons. However, current ultrasonic testing involves attaching a wired-transducer to the blade before any measurements can be made and this means dismantling the aircraft engine. Another example is testing in radioactive areas: containers with radioactive waste need to be tested regularly to ensure safety. In such hostile environments the testing needs to be remote and the testing component needs to be able to withstand the radiation and/or high temperature.<br />
<br />
We have developed a new approach based on ultrasound which, for the first time, enables remote operation. Importantly, it is also inexpensive, simple to use and can be used in hostile environments. Existing methods have none of these advantages. The system is referred to as CHOTs (Cheap Optical Transducers). A fully operational CHOTs NDT system comprises a “pulser”, analogous to the “pulser” in traditional contact ultrasonic NDT, but, instead of connecting to the transducer via a cable it connects to the CHOTs via two laser beams.<br />
<br />
The CHOTs technology has been protected by a patent application and has been presented and discussed with various key players within the international NDT market space, including Olympus, GE and Physical Acoustic Corporation, all of whom liked the technology. Valuable feedback has been gained. What they want to see before they take a licence, is system portability and a 10-fold enhancement to sensitivity. We have already resolved the problem of increased sensitivity. The one remaining issue is the development of a portable prototype. Therefore, ''the objective of this proposal is to construct a self-contained portable device based on our existing lab system which can be used for on-site demonstration of the ease of use and utility of CHOTs to NDT businesses''.<br />
<br />
The Innovation Fellowship is funded by the East Midlands Development Agency.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Innovation_Fellowship&diff=390Innovation Fellowship2008-10-21T13:01:03Z<p>Teti: New page: '''Novel Non-destructive testing method: cheap, remote, simple and portable testing''' Many engineering systems and especially those related to safety critical applications, require on-g...</p>
<hr />
<div>'''Novel Non-destructive testing method: cheap, remote, simple and portable testing'''<br />
<br />
<br />
Many engineering systems and especially those related to safety critical applications, require on-going testing using Non-Destructive Testing (NDT). For example, aircraft turbine blades can develop cracks over time and need regular testing: being able to identify when a blade might be at risk of failing without having to dismantle the engine and ground the aircraft would be of enormous benefit for both safety and cost reasons. However, current ultrasonic testing involves attaching a wired-transducer to the blade before any measurements can be made and this means dismantling the aircraft engine. Another example is testing in radioactive areas: containers with radioactive waste need to be tested regularly to ensure safety. In such hostile environments the testing needs to be remote and the testing component needs to be able to withstand the radiation and/or high temperature.<br />
<br />
We have developed a new approach based on ultrasound which, for the first time, enables remote operation. Importantly, it is also inexpensive, simple to use and can be used in hostile environments. Existing methods have none of these advantages. The system is referred to as CHOTs (Cheap Optical Transducers). A fully operational CHOTs NDT system comprises a “pulser”, analogous to the “pulser” in traditional contact ultrasonic NDT, but, instead of connecting to the transducer via a cable it connects to the CHOTs via two laser beams.<br />
<br />
The CHOTs technology has been protected by a patent application and has been presented and discussed with various key players within the international NDT market space, including Olympus, GE and Physical Acoustic Corporation, all of whom liked the technology. Valuable feedback has been gained. What they want to see before they take a licence, is system portability and a 10-fold enhancement to sensitivity. We have already resolved the problem of increased sensitivity. The one remaining issue is the development of a portable prototype. Therefore, the objective of this proposal is to construct a self-contained portable device based on our existing lab system which can be used for on-site demonstration of the ease of use and utility of CHOTs to NDT businesses.<br />
<br />
The Innovation Fellowship is funded by the East Midlands Development Agency.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=KTI_Award&diff=389KTI Award2008-10-21T12:54:20Z<p>Teti: </p>
<hr />
<div>'''CHOTs: from lab to the real world'''<br />
<br />
The University of Nottingham has developed a novel ultrasonic transducer for non-destructive testing that allow for the first time remote and couplant free operation. This system is referred to as Cheap Optical Transducers, CHOTs. The transducers can be placed on the surface of a component and generate and detect ultrasound signals when activated by a laser; therefore offers truly remote operation without need for attached cables or power supplies of any kind.<br />
<br />
A patent has been filed (publication number WO 2007/135439) in order to protect and fully exploit the new technology. Due to the nature of the market the commercialisation strategy is to license the CHOTs technology to Non-Destructive Testing (NDT) equipment manufacturers.<br />
The CHOTs technology has been presented and discussed with various key players within the international NDT market space and valuable feedback has been gained. All companies have stressed that one of the major key factors for supporting this technology is to bring proof of their use on samples similar in size, shape and materials to the ones used for testing by their clients. Therefore, the aim of this project is to demonstrate the use of CHOTs on samples similar in size, shape and materials to the ones used in potential licensees' markets (for example an aeroengine component).<br />
<br />
The Knowledge Transfer and Innovation Award is funded by the University of Nottingham.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=KTI_Award&diff=388KTI Award2008-10-21T12:48:18Z<p>Teti: </p>
<hr />
<div>''CHOTs – from lab to the real world''<br />
<br />
The University of Nottingham has developed a novel ultrasonic transducer for non-destructive testing that allow for the first time remote and couplant free operation. This system is referred to as Cheap Optical Transducers, CHOTs. The transducers can be placed on the surface of a component and generate and detect ultrasound signals when activated by a laser; therefore offers truly remote operation without need for attached cables or power supplies of any kind.<br />
<br />
A patent has been filed (publication number WO 2007/135439) in order to protect and fully exploit the new technology. Due to the nature of the market the commercialisation strategy is to license the CHOTs technology to Non-Destructive Testing (NDT) equipment manufacturers.<br />
The CHOTs technology has been presented and discussed with various key players within the international NDT market space and valuable feedback has been gained. All companies have stressed that one of the major key factors for supporting this technology is to bring proof of their use on samples similar in size, shape and materials to the ones used for testing by their clients. Therefore, the aim of this project is to demonstrate the use of CHOTs on samples similar in size, shape and materials to the ones used in potential licensees' markets (for example an aeroengine component).</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=KTI_Award&diff=387KTI Award2008-10-21T12:47:28Z<p>Teti: New page: The University of Nottingham has developed a novel ultrasonic transducer for non-destructive testing that allow for the first time remote and couplant free operation. This system is referr...</p>
<hr />
<div>The University of Nottingham has developed a novel ultrasonic transducer for non-destructive testing that allow for the first time remote and couplant free operation. This system is referred to as Cheap Optical Transducers, CHOTs. The transducers can be placed on the surface of a component and generate and detect ultrasound signals when activated by a laser; therefore offers truly remote operation without need for attached cables or power supplies of any kind.<br />
<br />
A patent has been filed (publication number WO 2007/135439) in order to protect and fully exploit the new technology. Due to the nature of the market the commercialisation strategy is to license the CHOTs technology to Non-Destructive Testing (NDT) equipment manufacturers.<br />
The CHOTs technology has been presented and discussed with various key players within the international NDT market space and valuable feedback has been gained. All companies have stressed that one of the major key factors for supporting this technology is to bring proof of their use on samples similar in size, shape and materials to the ones used for testing by their clients. Therefore, the aim of this project is to demonstrate the use of CHOTs on samples similar in size, shape and materials to the ones used in potential licensees' markets (for example an aeroengine component).</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=AERONEWS&diff=382AERONEWS2008-10-15T14:01:59Z<p>Teti: </p>
<hr />
<div>'''Health Monitoring of Aircraft by Nonlinear Elastic Wave Spectroscopy '''<br />
<br />
Nonlinear Elastic Wave Spectroscopy (NEWS) and related acoustic and ultrasonic methods comprise a new class of innovative non-destructive techniques that provide extreme sensitivity in detecting and imaging incipient damage in the form of microcracks or delaminations, weakening of adhesive bonds, thermal and chemical damage, etc. The sensitivity and applicability of nonlinear methods to damage are superior to those obtained by currently used technologies. NEWS methods are in various stages of development and have not yet been applied to aircraft health monitoring. The project’s goal was to examine, confirm and exploit the successful results of these techniques, using fundamental materials research on fatigue loading, and to apply them to the particular field of aeronautics.<br />
<br />
The project joined the efforts of 19 different partners from the industry and the academic world, spread in 8 different European countries. Our role in this project had a dual aspect:<br />
<br />
* Development of novel optical transducer suitable for NEWS and aerospace applications that would allow generation of narrowband ultrasonic signals and filtering of harmonics. <br />
<br />
* Experiments with dual sources (low and high frequency) for non linear mixing<br />
<br />
For the first task we developed CHOTs (Cheap Optical Transducers). These are structures that are printed, deposited or in someway attached to the surface of the sample and are optically excited to generate and detect ultrasound. They can be broken down in to two parts, one for generation and one for detection and each part can work independently from the other for example generating ultrasound that will be detected by other means or detect ultrasound that is generated by other means. Most importantly, the user has full control of the generated/detected wavemode, the directivity of the wave and its frequency content.<br />
<br />
One of the fields that CHOTs are most useful for is nonlinear acoustics. For such experiments we need narrowband ultrasound for generation and appropriate filtering for detection. This brings us to the second task within this project. The experiment is based on the interaction between a Low Frequency (LF) Surface Acoustic Wave (in our case a 1MHz SAW generated by a transducer) and a High Frequency (HF) SAW (the laser generated 82MHz SAW). By varying the delay between the 2 waves we can observe a phase modulation of the HF. This modulation is dependant on the degree of stress that the transducer is putting on the sample. The concept is that when the HF interacts with for example with the peak of the LF, the degree of phase modulation is different than when they interact at (for example) a trough. It can be shown that this phase variation is proportional to the non-linear change of the material's elastic constants and the detection of the change can be used to detect early stage defects. A pair of CHOTs have been successfully incorporated in this experiment for generation of the HF SAW and detection of the ultrasonic signal on a fused silica sample to measure the phase modulation of the HF.<br />
<br />
The project was funded by the EU and finished in March 2008. [[Teti Stratoudaki]] was work package leader and lead researcher. The work on the nonlinear experiment was conducted by Ian Collison as part of his PhD study. Matt Clark and Mike Somekh held the direction for our participation in AERONEWS.<br />
<br />
'''Publications and Conferences '''</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=AERONEWS&diff=372AERONEWS2008-10-09T18:35:23Z<p>Teti: </p>
<hr />
<div>'''Health Monitoring of Aircraft by Nonlinear Elastic Wave Spectroscopy '''<br />
<br />
Nonlinear Elastic Wave Spectroscopy (NEWS) and related acoustic and ultrasonic methods comprise a new class of innovative non-destructive techniques that provide extreme sensitivity in detecting and imaging incipient damage in the form of microcracks or delaminations, weakening of adhesive bonds, thermal and chemical damage, etc. The sensitivity and applicability of nonlinear methods to damage are superior to those obtained by currently used technologies. NEWS methods are in various stages of development and have not yet been applied to aircraft health monitoring. The project’s goal was to examine, confirm and exploit the successful results of these techniques, using fundamental materials research on fatigue loading, and to apply them to the particular field of aeronautics.<br />
<br />
The project joined the efforts of 19 different partners from the industry and the academic world, spread in 8 different European countries. Our role in this project had a dual aspect:<br />
<br />
* Development of novel optical transducer suitable for NEWS and aerospace applications that would allow generation of narrowband ultrasonic signals and filtering of harmonics. <br />
<br />
* Experiments with dual sources (low and high frequency) for non linear mixing<br />
<br />
For the first task we developed CHOTs (Cheap Optical Transducers). These are structures that are printed, deposited or in someway attached to the surface of the sample and are optically excited to generate and detect ultrasound. They can be broken down in to two parts, one for generation and one for detection and each part can work independently from the other for example generating ultrasound that will be detected by other means or detect ultrasound that is generated by other means. Most importantly, the user has full control of the generated/detected wavemode, the directivity of the wave and its frequency content.<br />
<br />
One of the fields that CHOTs are most useful for is nonlinear acoustics. For such experiments we need narrowband ultrasound for generation and appropriate filtering for detection. This brings us to the second task within this project. The experiment is based on the interaction between a Low Frequency (LF) Surface Acoustic Wave (in our case a 1MHz SAW generated by a transducer) and a High Frequency (HF) SAW (the laser generated 82MHz SAW). By varying the delay between the 2 waves we can observe a phase modulation of the HF. This modulation is dependant on the degree of stress that the transducer is putting on the sample. The concept is that when the HF interacts with for example with the peak of the LF, the degree of phase modulation is different than when they interact at (for example) a trough. It can be shown that this phase variation is proportional to the non-linear change of the material's elastic constants and the detection of the change can be used to detect early stage defects. A pair of CHOTs have been successfully incorporated in this experiment for generation of the HF SAW and detection of the ultrasonic signal on a fused silica sample to measure the phase modulation of the HF.<br />
<br />
The project was funded by the EU and finished in March 2008. [[Teti Stratoudaki]] was work package leader and lead researcher. The work on the nonlinear experiment was conducted by Ian Collison as part of his PhD study. Matt Clark and Mike Somekh held the direction for our participation in AERONEWS.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=%25_fatigue&diff=371% fatigue2008-10-09T18:33:56Z<p>Teti: </p>
<hr />
<div>'''Measurement of Percentage Fatigue Life Using Non Destructive Techniques'''<br />
<br />
The aim of this project is to develop a non-destructive ultrasonic technique for determining the remaining fatigue reserve of engineering components. <br />
<br />
Ultrasound has proven to be a powerful and effective technique for nondestructive testing. Traditional linear techniques are based on the detection of an ultrasonic signal that contains information about possible defects and their position, followed by appropriate repair where necessary. The checks are performed periodically and therefore need to be reliable, time efficient and cost efficient. The detection of defects is based on linear methods such as signal reflected from a defect or obstruction of ultrasonic transmission altogether. Although most traditional techniques are competent in detecting gross cracks, they are insensitive to the presence of clusters of microcracks, contacting defects, diffusion bonds, or disbonded delaminations. General degradation of a component can be very well hidden and degraded materials can pass for flawless under standard ultrasonic tests. <br />
<br />
As engineering components go through their life cycle, they undergo microscale plastic deformation in response to stress from which they do not quite recover fully (fatigue). In metals, fatigue progressively leads to formation of microcracks which will eventually develop into critical cracks and failure. The question is to develop a method able to monitor the progress of fatigue before the initiation of critical cracks. <br />
<br />
The accumulation of microcracks due to fatigue produces subtle changes in the material's elastic constants. These changes can be observed in the nonlinear response of the material. The method we use to observe the nonlinear response of the material is based on monitoring of the phase modulation of a high frequency (HF) surface acoustic wave interacting with a low frequency (LF) high amplitude stress inducing surface acoustic wave. The HF is generated by a laser and the LF by a contact transducer. The detection is done optically by means of a knife edge detector. The use of laser based ultrasonics in this experiments answers several problems encountered using contact transducers: It is a non contacting method for generation and detection of ultrasound meaning that it can be used remotely (e.g. hostile environments) and it is couplant free, hence free from nonlinearities introduced by the couplant medium. It is also suitable for complex geometries.<br />
<br />
The project is funded by DTI and the principal investigators are Mike Somekh and Matt Clark. The lead researcher is [[Teti Stratoudaki]]. It is a follow up of research performed by Ian Collison during his PhD thesis, an effort that is continued by Rob Ellwood in his current PhD study.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=AO_resources&diff=370AO resources2008-10-09T18:32:39Z<p>Teti: /* Physics fabrication and coating facilities */</p>
<hr />
<div>= Applied Optics Group Resources =<br />
<br />
This is a list of resources for use within the Applied Optics Group. This can include:<br />
<br />
* Internal facilities<br />
* Equipment and instruments (bought on shared funding e.g. SRIF)<br />
* Local expertise<br />
* External facilities (that members of the Applied Optics Group use)<br />
<br />
Some of the facilities are "home-built" experiments - cutting edge facilities that may not be available anywhere else in the world, but on the other hand may be tied up/uncalibrated/moth-balled. Others are commercial.<br />
<br />
I (Steve) will make a start on this of the things I know about, and some of the things I vaguely know about. Please correct errors and omissions.<br />
<br />
== Internal Facilities ==<br />
<br />
=== Fab Lab ===<br />
<br />
Facility for fabricating samples.<br />
Facilities for metal film evaporation/sputtering, photo-lithography and general chemical procedures that require working under a fume-cupboard and a clean-ish environment.<br />
<br />
* ''Location:'' SiOS Labs<br />
* ''Contact:'' Matt Clark or [[Teti Stratoudaki]]<br />
<br />
!!! Please Keep Clean at all times !!!<br />
<br />
*''The Lab is equipped with:''<br />
** Edwards 306A evaporator with 6 sources<br />
** Emitech K575XD sputter coater with 2 sources<br />
** Carbolite oven<br />
** Cobilt mask aligner<br />
** Spin coater (home built)<br />
<br />
=== Soldering and minor metalworking ===<br />
<br />
Pillar drill (fairly crap), small bench vice, hand files, hacksaw, clamps etc.<br />
<br />
Temperature-controlled soldering iron<br />
<br />
Various PSUs, signal generators and scopes - all old<br />
<br />
Stock components (resistors, fuses, cables, wire, plugs/sockets/connectors etc)<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]] (for missing bits of equipment)<br />
* ''Extra info:''<br />
** Make sure you know what you're doing and how to operate the drill. Seek instruction if you're unsure. Don't take risks. Wear safety goggles (should be some nearby). Set the drill speed appropriately. Unplug the drill from the wall when moving the belt between pulleys. Clamp things down when drilling them (use the brush not your hands).<br />
** Tidy up after yourself - especially bits of metal after drilling.<br />
** Replace what you use: solder, solder wick, wire, stock components, anything.<br />
** If you see some old equipment and notice the electrical testing label has expired, get it PAT tested in the stores - it only takes a few minutes.<br />
** Switch everything off at the plug after you've used it - especially important for the soldering iron.<br />
<br />
=== O-SAM ===<br />
<br />
'''Description needs completing'''<br />
<br />
* SRAS: surface microstructure imaging, using surface acoustic wave (SAW) velocity as contrast mechanism<br />
* Coating thickness measurement (again using SAW velocity)<br />
* Surface defect detection (cracks, delamination)<br />
<br />
* ''Location:'' Tower 303 and 306 (Laser Ultrasound Labs)<br />
* ''Contact:'' [[Steve Sharples]] (for missing bits of equipment)<br />
* ''Extra info:''<br />
<br />
=== Scanning tank ===<br />
<br />
* Ultrasonic scanning tank<br />
* 6-axis<br />
* 2 axes may be scanned simultaneously<br />
* Panametrics 35MHz pulser-receiver<br />
* Range of focused and plane beam transducers<br />
* Agilent DSO8010A oscilloscope for acquisition<br />
* Uses ''c_scan'' running under Linux for control and acquisition<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
<br />
<br />
== Equipment and Instruments ==<br />
<br />
=== Posh Zeiss Microscope ===<br />
<br />
'''Description needs completing'''<br />
<br />
PC-controlled, with eye-pieces and CCD camera. Can reportedly stitch several images together. Illuminate from above and below. Lots of fancy stuff...<br />
<br />
* ''Location:'' iBIOS Labs, somewhere.<br />
* ''Contact:'' Shugang Liu? Jing Zhang?<br />
* ''Extra info:''<br />
<br />
=== Old Olympus Microscope ===<br />
<br />
Olympus optical microscope, fairly old, but quite good. Optical only - although has a port for attaching a camera, think it's some sort of old Olympus manual SLR fitting. Manual focus and manual x-y. Illuminates top and bottom, has some ND filters, facilities for phase contrast, Nomarski prism.<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' No-one really. Turn up and use it. If it's faulty, ask around or get it fixed yourself.<br />
* ''Extra info:''<br />
** There are 2 plugs. One powers the lower lamp, the other the top lamp. Top lamp is controlled by the external box that sits next to the microscope (switch on the side, use the knob to control brightness).<br />
** Switch the plugs off at the wall after use.<br />
** Put the eye-piece covers back on, and (after the microscope has cooled down) replace the dust cover.<br />
<br />
=== Atomic Force Microscope (AFM) ===<br />
<br />
'''Description needs completing'''<br />
<br />
* ''Location:'' iBIOS Labs, somewhere<br />
* ''Contact:'' Shugang Liu<br />
* ''Extra info:''<br />
<br />
=== Polytec Laser Vibrometer ===<br />
<br />
[http://www.polytec.com/eur/158_421.asp Polytec single-point vibrometer] comprising:<br />
# [http://www.polytec.com/eur/158_849.asp OFV-5000 Modular Vibrometer Controller]<br />
# [http://www.polytec.com/eur/158_8072.asp OFV-534 Compact Sensor Head]<br />
# [http://www.polytec.com/eur/158_1932.asp VD-02 velocity decoder (DC-1.5MHz)]<br />
# [http://www.polytec.com/eur/158_1932.asp DD-300 displacement decoder (50kHz-24MHz)]<br />
<br />
* Total range <1Hz - 24MHz<br />
* Calibrated output (convert volts to actual displacement)<br />
* Internal CCD camera so you can see what you're scanning<br />
<br />
* ''Location:'' usually 201 on the scanning tank, sometimes SiOS<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** Includes a couple of Mitutoyo objectives (x10 and x20) for very small spot size (useful for MEMs etc)<br />
** Includes a 15" flat screen TV for the internal CCD camera<br />
** Laser is class 2 (He:Ne) <1mW but don't look into the beam and follow all the usual precautions<br />
<br />
=== Agilent 4GHz Oscilloscope ===<br />
<br />
[http://www.home.agilent.com/agilent/product.jspx?nid=-536902755.536908563.00&cc=AU&lc=eng Agilent Infiniium 80404B Oscilloscope]<br />
<br />
*4 channels<br />
*4GHz analogue bandwidth<br />
*40/20GSa/s (2/4 ch)<br />
*Extra waveform memory (2Mpts)<br />
*50 Ohm inputs; 2 adapters available to convert 2 inputs to 1M Ohm.<br />
*Matlab module<br />
<br />
* ''Location:'' Usually one of the Laser Ultrasound Labs (303-307)<br />
* ''Contact:'' [[Steve Sharples]] or whoever's lab it's in<br />
* ''Extra info:''<br />
** '''Sensitive inputs:''' they may look like regular BNCs, but if you start shoving 10V into them you're going to end up with a very large repair bill and will probably get a bollocking. Maximum voltage is written on the scopes. Use the 1M Ohm adapters if you need to look at bigger voltages (or have a high input impedance) but even with these the range of voltages that it can cope with is limited.<br />
** There is a Matlab module installed - I've never used it, but it might be useful<br />
** '''Grabbing data:'''<br />
***Windows: see the Agilent web site I guess<br />
***Linux: see [[Experimental PC#Scope (and AFG) utilities|this wiki page]] about installing ''agetwf'' (or install ''c_scan'' for more complex acquisition)<br />
<br />
=== Tektronix MSO4034 Mixed Signal Oscilloscope ===<br />
<br />
[http://www.tek.com/products/oscilloscopes/mso4000/ Tektronix MSO4034 mixed signal oscilloscope]<br />
<br />
*4 analogue channels<br />
*16 digital channels<br />
*350MHz analogue bandwidth<br />
*2.5GSa/s<br />
*10Mpts waveform memory<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** This has lots of bit with it, for the digital inputs, in addition to the usual manuals, installation CDs etc. Keep them all in the supplied bag and don't lose them<br />
** '''Grabbing data:'''<br />
***Windows: see the Tek web site I guess, or the installation CD<br />
***Linux: see [[Experimental PC#Scope (and AFG) utilities|this wiki page]] about installing ''tgetwf'' (or install ''c_scan'' for more complex acquisition)<br />
<br />
=== Laser Beam Profiler ===<br />
<br />
[http://www.newport.com/Laser-Beam-Profiler/318103/1033/catalog.aspx Newport LBP-2-USB laser beam profiler]<br />
<br />
* ''Location:'' Tower 201<br />
* ''Contact:'' [[Steve Sharples]] or Richard Smith<br />
* ''Extra info:''<br />
** Runs under Windows XP<br />
** '''Installation:'''<br />
*** Install software first<br />
*** Plug profiler into USB dongle<br />
*** Plug PSU brick into USB dongle<br />
*** Plug PSU brick into AC adapter (has US plug) and turn on mains<br />
*** Plug USB dongle into PC<br />
<br />
=== Optical (Thermal) Power Meter ===<br />
<br />
[http://www.lambdaphoto.co.uk/xlp12 Gentec XLP-12] Thermopile-based optical power meter<br />
<br />
* ''Location:'' usually Laser Ultrasound Labs (303-307). Possibly 201.<br />
* ''Contact:'' [[Steve Sharples]] or whoever's experiment it's sat on<br />
* ''Extra info:''<br />
** Sensitivity ~1mW to ~2W<br />
** Works fine with mode-locked (e.g. femtosecond), Q-switched (Nd:YAG) and CW lasers (long time constant)<br />
<br />
=== High Frequency Lock-in Amplifier ===<br />
<br />
[http://www.thinksrs.com/products/SR844.htm SR844 high frequency lock-in amplifier]<br />
<br />
* 25 kHz to 200 MHz frequency range<br />
* 80 dB dynamic reserve<br />
* Time constants from 100 µs to 30 ks (6, 12, 18 or 24 dB/oct rolloff)<br />
* "No Time Constant" mode (10 to 20 µs update rate)<br />
* Auto-gain, -phase, -reserve and -offset<br />
* Internal or external reference<br />
* Two 16-bit DACs and ADCs<br />
* GPIB and RS-232 interfaces<br />
<br />
* ''Location:'' usually Tower 304 (Ultrafast Lab)<br />
* ''Contact:'' Richard Smith<br />
* ''Extra info:''<br />
<br />
=== Ultrasonic Pulser-Receiver ===<br />
<br />
[http://www.olympusndt.com/en/5072pr/ Olympus (formerly Panametrics) 5072PR Ultrasonic Pulser-Receiver]<br />
<br />
* 35MHz bandwidth<br />
* Spike excitation<br />
<br />
* ''Location:'' CBS<br />
* ''Contact:'' Melissa Mathers<br />
* ''Extra info:''<br />
<br />
=== Dell 12" Laptop ===<br />
<br />
[http://www.dell.com/downloads/emea/products/latit/D430_specs%20_sheet.pdf Dell Latitude D430 12" Laptop]<br />
<br />
* Standard UoN "PC Contract" Notebook<br />
* Core 2 Duo CPU<br />
* 2GB memory<br />
* Docking station contains DVD RW (no DVD on laptop itself)<br />
* WiFi, ethernet and modem<br />
* SD card reader<br />
* Windows XP SP3<br />
* MS Office 2003 SP3<br />
* ''Location:'' Tower - see Steve (or you should already know)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** Kensington lock should be used when left around the lab<br />
** Bag and USB mouse available<br />
** Set up with static (optics) IP on ethernet, and DHCP (roaming/UoN) on WiFi<br />
<br />
=== Apple Macbook Laptop - cracked screen ===<br />
<br />
Apple Macbook laptop, 1.8GHz Core 2 Duo processor. Has a cracked screen, making it pretty much unusable as a laptop. Now pensioned off to desktop duties.<br />
<br />
* Apple Keynote: presentations<br />
* Apple Pages: word processor<br />
* MS Office 2003 for Mac (runs slow as it's the PowerPC version and runs under interpreter)<br />
* QuickTime Pro: encodes movies and animations (possibly the most useful thing it does nowadays)<br />
* ''Location:'' Tower 305 (Laser Ultrasound Labs foyer)<br />
* ''Contact:'' [[Steve Sharples]]<br />
<br />
== Local Expertise ==<br />
<br />
This section to be filled in another day.<br />
<br />
== External Facilities ==<br />
<br />
=== Ground floor workshop ===<br />
<br />
=== Medical School workshop ===<br />
<br />
Talk to Ian Stockford or Matt Clark<br />
<br />
=== Physics fabrication and coating facilities ===<br />
<br />
Talk to [[Teti Stratoudaki]] or Jing Zhang</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=AO_resources&diff=369AO resources2008-10-09T18:30:11Z<p>Teti: /* Fab Lab */</p>
<hr />
<div>= Applied Optics Group Resources =<br />
<br />
This is a list of resources for use within the Applied Optics Group. This can include:<br />
<br />
* Internal facilities<br />
* Equipment and instruments (bought on shared funding e.g. SRIF)<br />
* Local expertise<br />
* External facilities (that members of the Applied Optics Group use)<br />
<br />
Some of the facilities are "home-built" experiments - cutting edge facilities that may not be available anywhere else in the world, but on the other hand may be tied up/uncalibrated/moth-balled. Others are commercial.<br />
<br />
I (Steve) will make a start on this of the things I know about, and some of the things I vaguely know about. Please correct errors and omissions.<br />
<br />
== Internal Facilities ==<br />
<br />
=== Fab Lab ===<br />
<br />
Facility for fabricating samples.<br />
Facilities for metal film evaporation/sputtering, photo-lithography and general chemical procedures that require working under a fume-cupboard and a clean-ish environment.<br />
<br />
* ''Location:'' SiOS Labs<br />
* ''Contact:'' Matt Clark or [[Teti Stratoudaki]]<br />
<br />
!!! Please Keep Clean at all times !!!<br />
<br />
*''The Lab is equipped with:''<br />
** Edwards 306A evaporator with 6 sources<br />
** Emitech K575XD sputter coater with 2 sources<br />
** Carbolite oven<br />
** Cobilt mask aligner<br />
** Spin coater (home built)<br />
<br />
=== Soldering and minor metalworking ===<br />
<br />
Pillar drill (fairly crap), small bench vice, hand files, hacksaw, clamps etc.<br />
<br />
Temperature-controlled soldering iron<br />
<br />
Various PSUs, signal generators and scopes - all old<br />
<br />
Stock components (resistors, fuses, cables, wire, plugs/sockets/connectors etc)<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]] (for missing bits of equipment)<br />
* ''Extra info:''<br />
** Make sure you know what you're doing and how to operate the drill. Seek instruction if you're unsure. Don't take risks. Wear safety goggles (should be some nearby). Set the drill speed appropriately. Unplug the drill from the wall when moving the belt between pulleys. Clamp things down when drilling them (use the brush not your hands).<br />
** Tidy up after yourself - especially bits of metal after drilling.<br />
** Replace what you use: solder, solder wick, wire, stock components, anything.<br />
** If you see some old equipment and notice the electrical testing label has expired, get it PAT tested in the stores - it only takes a few minutes.<br />
** Switch everything off at the plug after you've used it - especially important for the soldering iron.<br />
<br />
=== O-SAM ===<br />
<br />
'''Description needs completing'''<br />
<br />
* SRAS: surface microstructure imaging, using surface acoustic wave (SAW) velocity as contrast mechanism<br />
* Coating thickness measurement (again using SAW velocity)<br />
* Surface defect detection (cracks, delamination)<br />
<br />
* ''Location:'' Tower 303 and 306 (Laser Ultrasound Labs)<br />
* ''Contact:'' [[Steve Sharples]] (for missing bits of equipment)<br />
* ''Extra info:''<br />
<br />
=== Scanning tank ===<br />
<br />
* Ultrasonic scanning tank<br />
* 6-axis<br />
* 2 axes may be scanned simultaneously<br />
* Panametrics 35MHz pulser-receiver<br />
* Range of focused and plane beam transducers<br />
* Agilent DSO8010A oscilloscope for acquisition<br />
* Uses ''c_scan'' running under Linux for control and acquisition<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
<br />
<br />
== Equipment and Instruments ==<br />
<br />
=== Posh Zeiss Microscope ===<br />
<br />
'''Description needs completing'''<br />
<br />
PC-controlled, with eye-pieces and CCD camera. Can reportedly stitch several images together. Illuminate from above and below. Lots of fancy stuff...<br />
<br />
* ''Location:'' iBIOS Labs, somewhere.<br />
* ''Contact:'' Shugang Liu? Jing Zhang?<br />
* ''Extra info:''<br />
<br />
=== Old Olympus Microscope ===<br />
<br />
Olympus optical microscope, fairly old, but quite good. Optical only - although has a port for attaching a camera, think it's some sort of old Olympus manual SLR fitting. Manual focus and manual x-y. Illuminates top and bottom, has some ND filters, facilities for phase contrast, Nomarski prism.<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' No-one really. Turn up and use it. If it's faulty, ask around or get it fixed yourself.<br />
* ''Extra info:''<br />
** There are 2 plugs. One powers the lower lamp, the other the top lamp. Top lamp is controlled by the external box that sits next to the microscope (switch on the side, use the knob to control brightness).<br />
** Switch the plugs off at the wall after use.<br />
** Put the eye-piece covers back on, and (after the microscope has cooled down) replace the dust cover.<br />
<br />
=== Atomic Force Microscope (AFM) ===<br />
<br />
'''Description needs completing'''<br />
<br />
* ''Location:'' iBIOS Labs, somewhere<br />
* ''Contact:'' Shugang Liu<br />
* ''Extra info:''<br />
<br />
=== Polytec Laser Vibrometer ===<br />
<br />
[http://www.polytec.com/eur/158_421.asp Polytec single-point vibrometer] comprising:<br />
# [http://www.polytec.com/eur/158_849.asp OFV-5000 Modular Vibrometer Controller]<br />
# [http://www.polytec.com/eur/158_8072.asp OFV-534 Compact Sensor Head]<br />
# [http://www.polytec.com/eur/158_1932.asp VD-02 velocity decoder (DC-1.5MHz)]<br />
# [http://www.polytec.com/eur/158_1932.asp DD-300 displacement decoder (50kHz-24MHz)]<br />
<br />
* Total range <1Hz - 24MHz<br />
* Calibrated output (convert volts to actual displacement)<br />
* Internal CCD camera so you can see what you're scanning<br />
<br />
* ''Location:'' usually 201 on the scanning tank, sometimes SiOS<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** Includes a couple of Mitutoyo objectives (x10 and x20) for very small spot size (useful for MEMs etc)<br />
** Includes a 15" flat screen TV for the internal CCD camera<br />
** Laser is class 2 (He:Ne) <1mW but don't look into the beam and follow all the usual precautions<br />
<br />
=== Agilent 4GHz Oscilloscope ===<br />
<br />
[http://www.home.agilent.com/agilent/product.jspx?nid=-536902755.536908563.00&cc=AU&lc=eng Agilent Infiniium 80404B Oscilloscope]<br />
<br />
*4 channels<br />
*4GHz analogue bandwidth<br />
*40/20GSa/s (2/4 ch)<br />
*Extra waveform memory (2Mpts)<br />
*50 Ohm inputs; 2 adapters available to convert 2 inputs to 1M Ohm.<br />
*Matlab module<br />
<br />
* ''Location:'' Usually one of the Laser Ultrasound Labs (303-307)<br />
* ''Contact:'' [[Steve Sharples]] or whoever's lab it's in<br />
* ''Extra info:''<br />
** '''Sensitive inputs:''' they may look like regular BNCs, but if you start shoving 10V into them you're going to end up with a very large repair bill and will probably get a bollocking. Maximum voltage is written on the scopes. Use the 1M Ohm adapters if you need to look at bigger voltages (or have a high input impedance) but even with these the range of voltages that it can cope with is limited.<br />
** There is a Matlab module installed - I've never used it, but it might be useful<br />
** '''Grabbing data:'''<br />
***Windows: see the Agilent web site I guess<br />
***Linux: see [[Experimental PC#Scope (and AFG) utilities|this wiki page]] about installing ''agetwf'' (or install ''c_scan'' for more complex acquisition)<br />
<br />
=== Tektronix MSO4034 Mixed Signal Oscilloscope ===<br />
<br />
[http://www.tek.com/products/oscilloscopes/mso4000/ Tektronix MSO4034 mixed signal oscilloscope]<br />
<br />
*4 analogue channels<br />
*16 digital channels<br />
*350MHz analogue bandwidth<br />
*2.5GSa/s<br />
*10Mpts waveform memory<br />
<br />
* ''Location:'' Tower 201 (Applied Optics Main Lab)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** This has lots of bit with it, for the digital inputs, in addition to the usual manuals, installation CDs etc. Keep them all in the supplied bag and don't lose them<br />
** '''Grabbing data:'''<br />
***Windows: see the Tek web site I guess, or the installation CD<br />
***Linux: see [[Experimental PC#Scope (and AFG) utilities|this wiki page]] about installing ''tgetwf'' (or install ''c_scan'' for more complex acquisition)<br />
<br />
=== Laser Beam Profiler ===<br />
<br />
[http://www.newport.com/Laser-Beam-Profiler/318103/1033/catalog.aspx Newport LBP-2-USB laser beam profiler]<br />
<br />
* ''Location:'' Tower 201<br />
* ''Contact:'' [[Steve Sharples]] or Richard Smith<br />
* ''Extra info:''<br />
** Runs under Windows XP<br />
** '''Installation:'''<br />
*** Install software first<br />
*** Plug profiler into USB dongle<br />
*** Plug PSU brick into USB dongle<br />
*** Plug PSU brick into AC adapter (has US plug) and turn on mains<br />
*** Plug USB dongle into PC<br />
<br />
=== Optical (Thermal) Power Meter ===<br />
<br />
[http://www.lambdaphoto.co.uk/xlp12 Gentec XLP-12] Thermopile-based optical power meter<br />
<br />
* ''Location:'' usually Laser Ultrasound Labs (303-307). Possibly 201.<br />
* ''Contact:'' [[Steve Sharples]] or whoever's experiment it's sat on<br />
* ''Extra info:''<br />
** Sensitivity ~1mW to ~2W<br />
** Works fine with mode-locked (e.g. femtosecond), Q-switched (Nd:YAG) and CW lasers (long time constant)<br />
<br />
=== High Frequency Lock-in Amplifier ===<br />
<br />
[http://www.thinksrs.com/products/SR844.htm SR844 high frequency lock-in amplifier]<br />
<br />
* 25 kHz to 200 MHz frequency range<br />
* 80 dB dynamic reserve<br />
* Time constants from 100 µs to 30 ks (6, 12, 18 or 24 dB/oct rolloff)<br />
* "No Time Constant" mode (10 to 20 µs update rate)<br />
* Auto-gain, -phase, -reserve and -offset<br />
* Internal or external reference<br />
* Two 16-bit DACs and ADCs<br />
* GPIB and RS-232 interfaces<br />
<br />
* ''Location:'' usually Tower 304 (Ultrafast Lab)<br />
* ''Contact:'' Richard Smith<br />
* ''Extra info:''<br />
<br />
=== Ultrasonic Pulser-Receiver ===<br />
<br />
[http://www.olympusndt.com/en/5072pr/ Olympus (formerly Panametrics) 5072PR Ultrasonic Pulser-Receiver]<br />
<br />
* 35MHz bandwidth<br />
* Spike excitation<br />
<br />
* ''Location:'' CBS<br />
* ''Contact:'' Melissa Mathers<br />
* ''Extra info:''<br />
<br />
=== Dell 12" Laptop ===<br />
<br />
[http://www.dell.com/downloads/emea/products/latit/D430_specs%20_sheet.pdf Dell Latitude D430 12" Laptop]<br />
<br />
* Standard UoN "PC Contract" Notebook<br />
* Core 2 Duo CPU<br />
* 2GB memory<br />
* Docking station contains DVD RW (no DVD on laptop itself)<br />
* WiFi, ethernet and modem<br />
* SD card reader<br />
* Windows XP SP3<br />
* MS Office 2003 SP3<br />
* ''Location:'' Tower - see Steve (or you should already know)<br />
* ''Contact:'' [[Steve Sharples]]<br />
* ''Extra info:''<br />
** Kensington lock should be used when left around the lab<br />
** Bag and USB mouse available<br />
** Set up with static (optics) IP on ethernet, and DHCP (roaming/UoN) on WiFi<br />
<br />
=== Apple Macbook Laptop - cracked screen ===<br />
<br />
Apple Macbook laptop, 1.8GHz Core 2 Duo processor. Has a cracked screen, making it pretty much unusable as a laptop. Now pensioned off to desktop duties.<br />
<br />
* Apple Keynote: presentations<br />
* Apple Pages: word processor<br />
* MS Office 2003 for Mac (runs slow as it's the PowerPC version and runs under interpreter)<br />
* QuickTime Pro: encodes movies and animations (possibly the most useful thing it does nowadays)<br />
* ''Location:'' Tower 305 (Laser Ultrasound Labs foyer)<br />
* ''Contact:'' [[Steve Sharples]]<br />
<br />
== Local Expertise ==<br />
<br />
This section to be filled in another day.<br />
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== External Facilities ==<br />
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=== Ground floor workshop ===<br />
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=== Medical School workshop ===<br />
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Talk to Ian Stockford or Matt Clark<br />
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=== Physics fabrication and coating facilities ===<br />
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Talk to Teti Stratoudaki, someone else is trained up too, don't know who</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Ultrafast&diff=368Ultrafast2008-10-09T18:29:07Z<p>Teti: </p>
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<div>'''Exotic ultrasonics for the real world (Ultrafast project)'''<br />
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The main aim of this project is to dramatically increase the speed of picosecond ultrasonic experiments. Pico second ultrasonics is a well established laser ultrasound technique that is used for material characterisation. <br />
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The experiments are based around the pump-probe technique where a pump laser pulse generates the acoustic waves and a time delayed probe pulse measures the interaction of the sound wave with the sample. The time delay is controlled by scanning a large (and typically slow) mechanical stage. Due to the high frequency waves generated (in the low to hundreds of GHz) the pump beam is modulated at a lower intermediate frequency so that low frequency electronics can be used to capture the signals. <br />
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A traditional detector arrangement is to focus the returning probe light onto a photodiode, the output of which goes to a lock-in amplifier, whose reference is the drive signal for the modulator. This yields a very sensitive detection system capable of measuring modulation depths in the range of 1 part in 10^6-10^7. Due to the slow speed of the mechanical delay line and the point measurement system, experiments can take a long time to perform making imaging applications impractical. We have developed custom made detectors that increase the data acquisition speed by more than an order of magnitude. We have achieved this by parallelising the detection by building a custom linear array detector which has very large light capturing ability. This combined with a suitable algorithm can replace the traditional photodiode/lock-in amplifier combination and provide a similar signal to noise ratio. The speed increases we have achieved have allowed us capture both 1D scans and more recently 2D images. Work progresses to improve the detectors and our system still further. <br />
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This project has involved many people to date; Richard Smith has built up the main optical system and code to drive the experiment, with help and advice from Steve Sharples. Some of the samples that have been measured were prepared by [[Teti Stratoudaki]]. The custom detectors were designed and laid out primarily by Mark Pitter, Roger Light and Nick Johnston. The direction and drive of the project has been managed by Mike Somekh who brought us all together for this very successful project.<br />
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'''Conferences & Publications'''<br />
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Parallel detection of low modulation depth signals: application to picosecond ultrasonics, R J Smith, M G Somekh, S D Sharples, M C Pitter, I Harrison and C Rossignol , Meas. Sci. Technol. 19 (2008) 055301 (8pp)<br />
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Parallel Ultrafast ultrasonics, R Smith, M Somekh S Sharples, M Pitter, R Light, N Johnston, Rank prize funds - mini symposia on optical aspects of NDT, 19-22nd May 2008 Grasmere cumbria <br />
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Parallel Detection for picosecond ultrasonics, RJSmith MG somekh, S Sharples, M Pitter, R light, N Johnston, Acoustics ’08,Paris, June 2008, article 003508<br />
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Parallel detection in picosecond ultrasonics with both commercial and custom array detection,R Smith, M Somekh, S Sharples, M Pitter, R Light, N Johnston, 1st Symposium of Laser ultrasonics, Montreal Canada, July 2008.</div>Tetihttps://optics.eee.nottingham.ac.uk/w/index.php?title=Teti_Stratoudaki&diff=367Teti Stratoudaki2008-10-09T18:25:41Z<p>Teti: </p>
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<div>'''[[Teti Stratoudaki]]'''<br />
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Location: Pharmacy Building – SIOS Lab Room C40 or CHOTs lab C36<br />
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Email: t.stratoudaki@nottingham.ac.uk<br />
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Phone: (0115) 95-15556 (office)<br />
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'''Current Research'''<br />
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*[[CHeap Optical Transducers (CHOTs)]]<br />
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Design, development and fabrication of novel optical transducers for generation/detection of surface and bulk acoustic waves. Commercialisation route ([[KTI Award]], [[Innovation Fellowship]]) <br />
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*[[Nonlinear Laser Ultrasonics]]<br />
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'''Current Project'''<br />
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[[% fatigue]]<br />
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Measurement of Percentage Fatigue Life Using Non Destructive Techniques<br />
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'''Previous Projects'''<br />
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[[CHOTs]]<br />
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[[AERONEWS]]</div>Teti