Difference between revisions of "Richard Smith"

Revision as of 07:29, 1 April 2011

Richard Smith

Electronic engineer, specialities: optics, microscopy, femtoseconds lasers, ps ultrasonics. I completed my PhD in Electrical and Electronic Engineering in 2006 at the UoN. My early work focused on optical metrology and signal processing techniques to enable precise measurements to be made below the optical diffraction limit. I have been developing several picosecond ultrasonic systems at UoN, and have successfully developed a parallel detection scheme that has increased the data acquisition rate by over an order of magnitude compared with the traditional detector approach. Current research themes are developing instrumentation to provide true orientation imaging of material microstructure in primarily aerospace materials, and developing high frequency ultrasonic transducers for biological applications

Location: Tower Building – Applied optics office Room 202 or Ultrafast lab room 304, Pharmacy Building – SIOS, ASOPS lab

Email: Richard.j.smith@nottingham.ac.uk

Phone: (0115) 84-67892 (office) or 95-15606 (lab)

Awards

Winner of best contributed paper at the Rank Prize Funds mini symposia on 'optical aspects of NDT' 19-22nd May 2008, for my talk entitled ‘Parallel ultrafast ultrasonics’.

Peer Reviewed Publications

Journal of Physics: Conference Series 269:012012,2011

http://iopscience.iop.org/1742-6596/269/1/012012
Bibtex<div>Author : A Arca, T Stratoudaki, R Smith, M Clark, M G Somekh
Title : Evanescent CHOTs for the optical generation and detection of ultrahigh frequency {SAWs}
In : Journal of Physics: Conference Series -
Address :
Date : 2011
</div>

Journal of Physics: Conference Series 278:012035,2011

http://iopscience.iop.org/1742-6596/278/1/012035
Bibtex<div>Author : R Smith, A Arca, X Chen, L Marques, M Clark, J Aylott, M Somekh
Title : Design and fabrication of ultrasonic transducers with nanoscale dimensions
In : Journal of Physics: Conference Series -
Address :
Date : 2011
</div>

Journal of Physics: Conference Series 214:012006,2010

http://apps.isiknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=X1GJEFGKG1nbC9K6PlK&page=1&doc=2&colname=WOS
Bibtex<div>Author : R J Smith, R A Light, N Johnston, S Sharples, M C Pitter, M G Somekh
Title : Parallel detection in laser ultrasonics
In : Journal of Physics: Conference Series -
Address :
Date : 2010
</div>

Review of Scientific Instruments 81(2):024901,2010

http://apps.isiknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=X1GJEFGKG1nbC9K6PlK&page=2&doc=16&colname=WOS
Bibtex<div>Author : Richard J. Smith, Roger A. Light, Steve D. Sharples, Nicholas S. Johnston, Mark C. Pitter, Mike G. Somekh
Title : Multichannel, time-resolved picosecond laser ultrasound imaging and spectroscopy with custom complementary metal-oxide-semiconductor detector
In : Review of Scientific Instruments -
Address :
Date : 2010
</div>

Measurement Science and Technology 19(5):055301,2008

http://apps.isiknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=X1GJEFGKG1nbC9K6PlK&page=4&doc=39&colname=WOS
Bibtex<div>Author : R J Smith, M G Somekh, S D Sharples, M C Pitter, I Harrison, C Rossignol
Title : Parallel detection of low modulation depth signals: application to picosecond ultrasonics
In : Measurement Science and Technology -
Address :
Date : 2008
</div>

APPLIED OPTICS 46(22):4857--4866, @aug 2007

http://apps.isiknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=7&SID=X1GJEFGKG1nbC9K6PlK&page=1&doc=2
Bibtex<div>Author : RJ Smith, CW See, MG Somekh, A Yacoot
Title : Use of artificial neural networks on optical track width measurements
In : APPLIED OPTICS -
Address :
Date : @aug 2007
</div>

Measurement Science and Technology 16(12):2397--2404,2005

http://apps.isiknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=5&SID=X1GJEFGKG1nbC9K6PlK&page=1&doc=3&colname=WOS
Bibtex<div>Author : R J Smith, C W See, M G Somekh, A Yacoot, E Choi
Title : Optical track width measurements below 100 nm using artificial neural networks
In : Measurement Science and Technology -
Address :
Date : 2005
</div>

Non Peer Review Papers

Proceedings of SPIE pp. 65181F--65181F-11, Munich, Germany,2007

http://apps.isiknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=4&SID=X1GJEFGKG1nbC9K6PlK&page=1&doc=7&colname=WOS
Bibtex

Author : Chung W. See, Richard J. Smith, Michael G. Somekh, Andrew Yacoot
Title : Line width measurement below 60 nm using an optical interferometer and artificial neural network
In : Proceedings of SPIE -
Address : Munich, Germany
Date : 2007

pp. 75700U--75700U-10, San Francisco, California, {USA},2010

http://apps.isiknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=X1GJEFGKG1nbC9K6PlK&page=1&doc=3&colname=WOS
Bibtex<div>Author : Roger A. Light, Richard J. Smith, Nicholas S. Johnston, Steve D. Sharples, Michael G. Somekh, Mark C. Pitter
Title : Highly parallel CMOS lock-in optical sensor array for hyperspectral recording in scanned imaging systems
In : -
Address : San Francisco, California, {USA}
Date : 2010
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