Richard Smith

Richard Smith

Electronic engineer, specialities: optics, microscopy, femtoseconds lasers, ps ultrasonics. I completed my PhD in Electrical and Electronic Engineering in 2006 at the UoN. My early work focused on optical metrology and signal processing techniques to enable precise measurements to be made below the optical diffraction limit. I have been developing several picosecond ultrasonic systems at UoN, and have successfully developed a parallel detection scheme that has increased the data acquisition rate by over an order of magnitude compared with the traditional detector approach. Current research themes are developing instrumentation to provide true orientation imaging of material microstructure in primarily aerospace materials, and developing high frequency ultrasonic transducers for biological applications

Location: Tower Building – Applied optics office Room 202 or Ultrafast lab room 304, Pharmacy Building – SIOS, ASOPS lab

Email: Richard.j.smith@nottingham.ac.uk

Phone: (0115) 84-67892 (office) or 95-15606 (lab)

Awards

Winner of best contributed paper at the Rank Prize Funds mini symposia on 'optical aspects of NDT' 19-22nd May 2008, for my talk entitled ‘Parallel ultrafast ultrasonics’.

Publications

R J Smith, C W See, M G Somekh, A Yacoot, E Choi - Optical track width measurements below 100 nm using artificial neural networks

Measurement Science and Technology 16(12):2397--2404,2005

http://apps.isiknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=5&SID=X1GJEFGKG1nbC9K6PlK&page=1&doc=3&colname=WOS
Bibtex<div>Author : R J Smith, C W See, M G Somekh, A Yacoot, E Choi
Title : Optical track width measurements below 100 nm using artificial neural networks
In : Measurement Science and Technology -
Address :
Date : 2005
</div>

R J Smith, R A Light, N Johnston, S Sharples, M C Pitter, M G Somekh - Sub-0.1 ?m optical track width measurement

Proceedings of {SPIE} 214:012006, Munich, Germany,2010

http://apps.isiknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=X1GJEFGKG1nbC9K6PlK&page=1&doc=2&colname=WOS
Bibtex

Author : R J Smith, R A Light, N Johnston, S Sharples, M C Pitter, M G Somekh
Title : Sub-0.1 ?m optical track width measurement
In : Proceedings of {SPIE} -
Address : Munich, Germany
Date : 2010

R J Smith, M G Somekh, S D Sharples, M C Pitter, I Harrison, C Rossignol - Multichannel, time-resolved picosecond laser ultrasound imaging and spectroscopy with custom complementary metal-oxide-semiconductor detector

Measurement Science and Technology 19(5):055301,2008

http://apps.isiknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=X1GJEFGKG1nbC9K6PlK&page=4&doc=39&colname=WOS
Bibtex<div>Author : R J Smith, M G Somekh, S D Sharples, M C Pitter, I Harrison, C Rossignol
Title : Multichannel, time-resolved picosecond laser ultrasound imaging and spectroscopy with custom complementary metal-oxide-semiconductor detector
In : Measurement Science and Technology -
Address :
Date : 2008
</div>

RJ Smith, CW See, MG Somekh, A Yacoot - Use of artificial neural networks on optical track width measurements

APPLIED OPTICS 46(22):4857--4866, @aug 2007

http://apps.isiknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=7&SID=X1GJEFGKG1nbC9K6PlK&page=1&doc=2
Bibtex<div>Author : RJ Smith, CW See, MG Somekh, A Yacoot
Title : Use of artificial neural networks on optical track width measurements
In : APPLIED OPTICS -
Address :
Date : @aug 2007
</div>

A Arca, T Stratoudaki, R Smith, M Clark, M G Somekh - Evanescent CHOTs for the optical generation and detection of ultrahigh frequency {SAWs}

Journal of Physics: Conference Series 269:012012,2011

http://iopscience.iop.org/1742-6596/269/1/012012
Bibtex<div>Author : A Arca, T Stratoudaki, R Smith, M Clark, M G Somekh
Title : Evanescent CHOTs for the optical generation and detection of ultrahigh frequency {SAWs}
In : Journal of Physics: Conference Series -
Address :
Date : 2011
</div>

Roger A. Light, Richard J. Smith, Nicholas S. Johnston, Steve D. Sharples, Michael G. Somekh, Mark C. Pitter - Highly parallel CMOS lock-in optical sensor array for hyperspectral recording in scanned imaging systems

pp. 75700U--75700U-10, San Francisco, California, {USA},2010

http://apps.isiknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=X1GJEFGKG1nbC9K6PlK&page=1&doc=3&colname=WOS
Bibtex<div>Author : Roger A. Light, Richard J. Smith, Nicholas S. Johnston, Steve D. Sharples, Michael G. Somekh, Mark C. Pitter
Title : Highly parallel CMOS lock-in optical sensor array for hyperspectral recording in scanned imaging systems
In : -
Address : San Francisco, California, {USA}
Date : 2010
</div>

R Smith, A Arca, X Chen, L Marques, M Clark, J Aylott, M Somekh - Design and fabrication of ultrasonic transducers with nanoscale dimensions

Journal of Physics: Conference Series 278:012035,2011

http://iopscience.iop.org/1742-6596/278/1/012035
Bibtex<div>Author : R Smith, A Arca, X Chen, L Marques, M Clark, J Aylott, M Somekh
Title : Design and fabrication of ultrasonic transducers with nanoscale dimensions
In : Journal of Physics: Conference Series -
Address :
Date : 2011
</div>

Chung W. See, Richard J. Smith, Michael G. Somekh, Andrew Yacoot - Line width measurement below 60 nm using an optical interferometer and artificial neural network

Proceedings of SPIE pp. 65181F--65181F-11, San Jose, {CA,} {USA},2007

http://apps.isiknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=4&SID=X1GJEFGKG1nbC9K6PlK&page=1&doc=7&colname=WOS
Bibtex

Author : Chung W. See, Richard J. Smith, Michael G. Somekh, Andrew Yacoot
Title : Line width measurement below 60 nm using an optical interferometer and artificial neural network
In : Proceedings of SPIE -
Address : San Jose, {CA,} {USA}
Date : 2007