Journals
http://ieeexplore.ieee.org/rss/TOC92.XML
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=92
http://ieeexplore.ieee.org/rss/TOC4.XML Solid-State Circuits, IEEE Journal of http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4
http://ieeexplore.ieee.org/rss/TOC4159607.XML Signal Processing, IET http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4159607
http://ieeexplore.ieee.org/rss/TOC7361.XML
Sensors Journal, IEEE
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7361
http://ieeexplore.ieee.org/rss/TOC66.XML Semiconductor Manufacturing, IEEE Transactions on http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=66
http://ieeexplore.ieee.org/rss/TOC3.XML
Quantum Electronics, IEEE Journal of
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=3
http://ieeexplore.ieee.org/rss/TOC42.XML Medical Imaging, IEEE Transactions on http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=42
http://ieeexplore.ieee.org/rss/TOC19.XML
Instrumentation and Measurement, IEEE Transactions on
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=19
http://ieeexplore.ieee.org/rss/TOC2220.XML Electronics Letters http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=2220
http://ieeexplore.ieee.org/rss/TOC16.XML Electron Devices, IEEE Transactions on http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=16
http://ieeexplore.ieee.org/rss/TOC55.XML Electron Device Letters, IEEE http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=55
http://ieeexplore.ieee.org/rss/TOC4123966.XML Circuits, Devices & Systems, IET http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4123966
http://ieeexplore.ieee.org/rss/TOC8919.XML Circuits and Systems I: Regular Papers, IEEE Transactions on http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8919
http://ieeexplore.ieee.org/rss/TOC8920.XML
Circuits and Systems II: Express Briefs, IEEE Transactions on
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8920