Difference between revisions of "Rikesh Patel"

From Applied Optics Wiki
Jump to: navigation, search
(18 intermediate revisions by the same user not shown)
Line 1: Line 1:
 
__NOTOC__
 
__NOTOC__
 
='''Rikesh Patel'''=
 
='''Rikesh Patel'''=
 +
[[Image:Rp_portrait.jpg|right|200px|link=]]
 +
Assistant Professor, Department of Electrical and Electronic Engineering, University of Nottingham
  
 +
Address: A46 Coates Building, University Park, Nottingham, NG7 2RD, UK
  
−
'''Location'''
+
Phone: +44 (0)115 84-67892
  
−
202/307 Tower, University Park
+
Email: rikesh.patel[[Image:Atnotts.png|110px|link=]]
  
−
C38 [[SIOS]] Pharmacy, University Park
+
ORCID: [https://orcid.org/0000-0003-0751-4533 0000-0003-0751-4533]
  
−
'''Phone'''
+
External links:
  
−
+44 (0)115 84-67892
+
[https://nottingham-repository.worktribe.com/person/234634/rikesh-patel/outputs UoN repository] [http://eprints.nottingham.ac.uk/view/people/Patel=3ARikesh=3A=3A.html (old link)]
  
−
'''Email'''
+
[https://scholar.google.com/citations?user=eDzvB5UAAAAJ Google Scholar]
  
−
rikesh.patel[[Image:Atnotts.png|133px|link=]]
+
[https://www.researchgate.net/profile/Rikesh-Patel-2 ResearchGate]
  
−
'''Education/Posts'''
+
[https://gow.epsrc.ukri.org/NGBOViewPerson.aspx?PersonId=-223355 Grants on the web]
  
−
2004-2008 MEng Electronic and Computer Engineering (1st Class), University of Nottingham
+
==Journal publications==
  
−
2008-2014 PhD Electrical and Electronic Engineering ([http://optics.eee.nottingham.ac.uk/w/images/0/06/Thesis_rp_2014.pdf Thesis]), University of Nottingham
+
<bibtex>
 +
@article{leeSimpleMethodMeasuring2021,
 +
  title = {Simple Method of Measuring Thicknesses of Surface-Hardened Layers by Laser Ultrasonic Technique},
 +
  author = {Lee, Yong and Kitazawa, So and Patel, Rikesh},
 +
  year = {2021},
 +
  url = {https://iopscience.iop.org/article/10.35848/1347-4065/ac030f},
 +
  journal = {Jpn. J. Appl. Phys.},
 +
  issn = {0021-4922, 1347-4065},
 +
  doi = {10.35848/1347-4065/ac030f}
 +
}
 +
</bibtex>
  
−
2013-2014 Research Assistant, University of Nottingham
+
<bibtex>
 +
@article{patelSinglePixelCamera2021,
 +
  title = {Single Pixel Camera Methodologies for Spatially Resolved Acoustic Spectroscopy},
 +
  author = {Patel, Rikesh and Sharples, Steve D. and Clark, Matt and Somekh, Mike G. and Li, Wenqi},
 +
  year = {2021},
 +
  url = {https://aip.scitation.org/doi/10.1063/5.0040123},
 +
  journal = {Appl. Phys. Lett.},
 +
  volume = {118},
 +
  number = {5},
 +
  pages = {051102},
 +
  issn = {0003-6951, 1077-3118},
 +
  doi = {10.1063/5.0040123},
 +
  language = {en}
 +
}
 +
</bibtex>
  
−
2014- Research Associate, University of Nottingham
+
<bibtex>
 +
@article{brownNondestructiveDetectionMachininginduced2021a,
 +
  title = {Non-Destructive Detection of Machining-Induced White Layers through Grain Size and Crystallographic Texture-Sensitive Methods},
 +
  author = {Brown, M. and Pieris, D. and Wright, D. and Crawforth, P. and M'Saoubi, R. and McGourlay, J. and Mantle, A. and Patel, R. and Smith, R.J. and Ghadbeigi, H.},
 +
  year = {2021},
 +
  url = {https://linkinghub.elsevier.com/retrieve/pii/S0264127521000253},
 +
  journal = {Materials \& Design},
 +
  volume = {200},
 +
  pages = {109472},
 +
  issn = {02641275},
 +
  doi = {10.1016/j.matdes.2021.109472},
 +
  language = {en}
 +
}
 +
</bibtex>
  
−
----
+
<bibtex>
 +
@article{dryburgh_spatially_2019-1,
 +
  title = {Spatially Resolved Acoustic Spectroscopy for Integrity Assessment in Wire-Arc Additive Manufacturing},
 +
  author = {Dryburgh, Paul and Pieris, Don and Martina, Filomeno and Patel, Rikesh and Sharples, Steve and Li, Wenqi and Clare, Adam T. and Williams, Stewart and Smith, Richard J.},
 +
  year = {2019},
 +
  url = {https://linkinghub.elsevier.com/retrieve/pii/S2214860419302994},
 +
  journal = {Additive Manufacturing},
 +
  volume = {28},
 +
  pages = {236--251},
 +
  issn = {22148604},
 +
  doi = {10.1016/j.addma.2019.04.015},
 +
  language = {en}
 +
}
 +
</bibtex>
  
−
===Awards===
+
<bibtex>
−
 
+
@article{pieris_spatially_2019-1,
−
* University of Nottingham interdisciplinary research funding award (UNICAS) - 2014
+
  title = {Spatially Resolved Acoustic Spectroscopy Towards Online Inspection of Additive Manufacturing},
−
* Applied optics group internal research proposal review award (1st place) - 2015
+
  author = {Pieris, D and Patel, R and Dryburgh, P and Hirsch, M and Li, W and Sharples, S D and Smith, R J and Clare, A T and Clark, M},
−
 
+
  year = {2019},
−
===Journal publications===
+
  url = {https://www.ingentaconnect.com/content/10.1784/insi.2019.61.3.132},
−
 
+
  journal = {Insight - Non-Destructive Testing and Condition Monitoring},
−
[https://nottingham-repository.worktribe.com/search/all/rikesh%20patel/outputs University repository for Rikesh Patel] [http://eprints.nottingham.ac.uk/view/people/Patel=3ARikesh=3A=3A.html (old)]
+
  volume = {61},
 +
  number = {3},
 +
  pages = {132--137},
 +
  issn = {1354-2575},
 +
  doi = {10.1784/insi.2019.61.3.132},
 +
  language = {en}
 +
}
 +
</bibtex>
  
 
<bibtex>
 
<bibtex>
 
@article{patel_imaging_2018,
 
@article{patel_imaging_2018,
−
   title = {Imaging {{Material Texture}} of {{As}}-{{Deposited Selective Laser Melted Parts Using Spatially Resolved Acoustic Spectroscopy}}},
+
  langid = {english},
 +
   title = {Imaging Material Texture of As-Deposited Selective Laser Melted Parts Using Spatially Resolved Acoustic Spectroscopy},
 
   volume = {8},
 
   volume = {8},
−
  copyright = {All rights reserved},
 
 
   issn = {2076-3417},
 
   issn = {2076-3417},
 +
  url = {http://www.mdpi.com/2076-3417/8/10/1991},
 
   doi = {10.3390/app8101991},
 
   doi = {10.3390/app8101991},
−
  language = {en},
 
 
   number = {10},
 
   number = {10},
−
   journal = {Applied Sciences},
+
   journaltitle = {Applied Sciences},
−
   author = {Patel, Rikesh and Hirsch, Matthias and Dryburgh, Paul and Pieris, Don and {Achamfuo-Yeboah}, Samuel and Smith, Richard and Light, Roger and Sharples, Steve and Clare, Adam and Clark, Matt},
+
  urldate = {2018-10-25},
−
  month = oct,
+
  date = {2018-10-19},
−
  year = {2018},
+
  pages = {1991},
−
  pages = {1991}
+
   author = {Patel Rikesh and Hirsch Matthias and Dryburgh Paul and Pieris Don and Achamfuo-Yeboah Samuel and Smith Richard and Light Roger and Sharples Steve and Clare Adam and Clark Matt}
 
}
 
}
 
</bibtex>
 
</bibtex>
Line 57: Line 117:
 
<bibtex>
 
<bibtex>
 
@article{speidel_crystallographic_2018,
 
@article{speidel_crystallographic_2018,
 +
  langid = {english},
 
   title = {Crystallographic Texture Can Be Rapidly Determined by Electrochemical Surface Analytics},
 
   title = {Crystallographic Texture Can Be Rapidly Determined by Electrochemical Surface Analytics},
 
   volume = {159},
 
   volume = {159},
 
   issn = {13596454},
 
   issn = {13596454},
 +
  url = {https://linkinghub.elsevier.com/retrieve/pii/S1359645418305998},
 
   doi = {10.1016/j.actamat.2018.07.059},
 
   doi = {10.1016/j.actamat.2018.07.059},
−
   language = {en},
+
   journaltitle = {Acta Materialia},
−
   journal = {Acta Materialia},
+
   urldate = {2018-09-10},
−
   author = {Speidel, Alistair and Su, Rong and {Mitchell-Smith}, Jonathon and Dryburgh, Paul and Bisterov, Ivan and Pieris, Don and Li, Wenqi and Patel, Rikesh and Clark, Matt and Clare, Adam T.},
+
  date = {2018-10},
−
  month = oct,
+
  pages = {89-101},
−
  year = {2018},
+
   author = {Speidel Alistair and Su Rong and Mitchell-Smith Jonathon and Dryburgh Paul and Bisterov Ivan and Pieris Don and Li Wenqi and Patel Rikesh and Clark Matt and Clare Adam T.}
−
  pages = {89-101}
 
 
}
 
}
 
</bibtex>
 
</bibtex>
Line 180: Line 241:
 
@ARTICLE{Patel2011a,  author = {Rikesh Patel and Samuel Achamfuo-Yeboah and Roger Light and Matt Clark},  title = {Widefield heterodyne interferometry using a custom CMOS modulated light camera},  journal = {Opt. Express},  year = {2011},  volume = {19},  pages = {24546--24556},  number = {24},  month = {Nov},  abstract = {In this paper a method of taking widefield heterodyne interferograms using a prototype modulated light camera is described. This custom CMOS modulated light camera (MLC) uses analogue quadrature demodulation at each pixel to output the phase and amplitude of the modulated light as DC voltages. The heterodyne interference fringe patterns are generated using an acousto-optical frequency shifter (AOFS) in an arm of a Mach-Zehnder interferometer. Widefield images of fringe patterns acquired using the prototype MLC are presented. The phase can be measured to an accuracy of {\textpm}6.6{\textdegree}. The added value of this method to acquire widefield images are discussed along with the advantages.},  doi = {10.1364/OE.19.024546},  owner = {rp},  publisher = {OSA},  timestamp = {2012.01.13},  url = {http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/d/d6/Pap1.pdf}}
 
@ARTICLE{Patel2011a,  author = {Rikesh Patel and Samuel Achamfuo-Yeboah and Roger Light and Matt Clark},  title = {Widefield heterodyne interferometry using a custom CMOS modulated light camera},  journal = {Opt. Express},  year = {2011},  volume = {19},  pages = {24546--24556},  number = {24},  month = {Nov},  abstract = {In this paper a method of taking widefield heterodyne interferograms using a prototype modulated light camera is described. This custom CMOS modulated light camera (MLC) uses analogue quadrature demodulation at each pixel to output the phase and amplitude of the modulated light as DC voltages. The heterodyne interference fringe patterns are generated using an acousto-optical frequency shifter (AOFS) in an arm of a Mach-Zehnder interferometer. Widefield images of fringe patterns acquired using the prototype MLC are presented. The phase can be measured to an accuracy of {\textpm}6.6{\textdegree}. The added value of this method to acquire widefield images are discussed along with the advantages.},  doi = {10.1364/OE.19.024546},  owner = {rp},  publisher = {OSA},  timestamp = {2012.01.13},  url = {http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/d/d6/Pap1.pdf}}
 
</bibtex>
 
</bibtex>
−
 
−
===Conferences ===
 
−
 
−
* UON Institute of Aerospace exposition, Nottingham UK - 2010
 
−
* KTP innovate event, London UK - 2011
 
−
* OSA Optics and Photonics Congress, Toronto Canada - 2011
 
−
* IOP Photon12, Durham UK - 2012
 
−
* IOP Anglo-French physical acoustic conference AFPAC2015, Frejus France - 2015
 
−
* BINDT Aerospace event 2015, Sheffield UK - 2015
 
−
* 4th International Symposium on Laser Ultrasonics LU2015, Evanston IL USA - 2015
 
−
* 5th International Symposium on Laser Ultrasonics LU2015, Linz, Austria – 2016
 
−
* Early Stage Researchers RCNDE event, Manchester UK - 2016
 
−
* RCNDE University of Nottingham industrial tour, Nottingham UK - 2016
 
−
* Optics+Ultrasound III, Nottingham UK – 2016
 
−
* RCNDE technology transfer event, Warwick, UK - 2017
 

Revision as of 10:31, 31 August 2021

Rikesh Patel

Rp portrait.jpg

Assistant Professor, Department of Electrical and Electronic Engineering, University of Nottingham

Address: A46 Coates Building, University Park, Nottingham, NG7 2RD, UK

Phone: +44 (0)115 84-67892

Email: rikesh.patelAtnotts.png

ORCID: 0000-0003-0751-4533

External links:

UoN repository (old link)

Google Scholar

ResearchGate

Grants on the web

Journal publications

Lee, Yong, Kitazawa, So, Patel, Rikesh - Simple Method of Measuring Thicknesses of Surface-Hardened Layers by Laser Ultrasonic Technique
Jpn. J. Appl. Phys. ,2021
https://iopscience.iop.org/article/10.35848/1347-4065/ac030f
Bibtex
Author : Lee, Yong, Kitazawa, So, Patel, Rikesh
Title : Simple Method of Measuring Thicknesses of Surface-Hardened Layers by Laser Ultrasonic Technique
In : Jpn. J. Appl. Phys. -
Address :
Date : 2021

Patel, Rikesh, Sharples, Steve D., Clark, Matt, Somekh, Mike G., Li, Wenqi - Single Pixel Camera Methodologies for Spatially Resolved Acoustic Spectroscopy
Appl. Phys. Lett. 118(5):051102,2021
https://aip.scitation.org/doi/10.1063/5.0040123
Bibtex
Author : Patel, Rikesh, Sharples, Steve D., Clark, Matt, Somekh, Mike G., Li, Wenqi
Title : Single Pixel Camera Methodologies for Spatially Resolved Acoustic Spectroscopy
In : Appl. Phys. Lett. -
Address :
Date : 2021

Brown, M., Pieris, D., Wright, D., Crawforth, P., M'Saoubi, R., McGourlay, J., Mantle, A., Patel, R., Smith, R.J., Ghadbeigi, H. - Non-Destructive Detection of Machining-Induced White Layers through Grain Size and Crystallographic Texture-Sensitive Methods
Materials \& Design 200:109472,2021
https://linkinghub.elsevier.com/retrieve/pii/S0264127521000253
Bibtex
Author : Brown, M., Pieris, D., Wright, D., Crawforth, P., M'Saoubi, R., McGourlay, J., Mantle, A., Patel, R., Smith, R.J., Ghadbeigi, H.
Title : Non-Destructive Detection of Machining-Induced White Layers through Grain Size and Crystallographic Texture-Sensitive Methods
In : Materials \& Design -
Address :
Date : 2021

Dryburgh, Paul, Pieris, Don, Martina, Filomeno, Patel, Rikesh, Sharples, Steve, Li, Wenqi, Clare, Adam T., Williams, Stewart, Smith, Richard J. - Spatially Resolved Acoustic Spectroscopy for Integrity Assessment in Wire-Arc Additive Manufacturing
Additive Manufacturing 28:236--251,2019
https://linkinghub.elsevier.com/retrieve/pii/S2214860419302994
Bibtex
Author : Dryburgh, Paul, Pieris, Don, Martina, Filomeno, Patel, Rikesh, Sharples, Steve, Li, Wenqi, Clare, Adam T., Williams, Stewart, Smith, Richard J.
Title : Spatially Resolved Acoustic Spectroscopy for Integrity Assessment in Wire-Arc Additive Manufacturing
In : Additive Manufacturing -
Address :
Date : 2019

Pieris, D, Patel, R, Dryburgh, P, Hirsch, M, Li, W, Sharples, S D, Smith, R J, Clare, A T, Clark, M - Spatially Resolved Acoustic Spectroscopy Towards Online Inspection of Additive Manufacturing
Insight - Non-Destructive Testing and Condition Monitoring 61(3):132--137,2019
https://www.ingentaconnect.com/content/10.1784/insi.2019.61.3.132
Bibtex
Author : Pieris, D, Patel, R, Dryburgh, P, Hirsch, M, Li, W, Sharples, S D, Smith, R J, Clare, A T, Clark, M
Title : Spatially Resolved Acoustic Spectroscopy Towards Online Inspection of Additive Manufacturing
In : Insight - Non-Destructive Testing and Condition Monitoring -
Address :
Date : 2019

Patel Rikesh, Hirsch Matthias, Dryburgh Paul, Pieris Don, Achamfuo-Yeboah Samuel, Smith Richard, Light Roger, Sharples Steve, Clare Adam, Clark Matt - Imaging Material Texture of As-Deposited Selective Laser Melted Parts Using Spatially Resolved Acoustic Spectroscopy
8(10):1991
http://www.mdpi.com/2076-3417/8/10/1991
Bibtex
Author : Patel Rikesh, Hirsch Matthias, Dryburgh Paul, Pieris Don, Achamfuo-Yeboah Samuel, Smith Richard, Light Roger, Sharples Steve, Clare Adam, Clark Matt
Title : Imaging Material Texture of As-Deposited Selective Laser Melted Parts Using Spatially Resolved Acoustic Spectroscopy
In : -
Address :
Date :

Speidel Alistair, Su Rong, Mitchell-Smith Jonathon, Dryburgh Paul, Bisterov Ivan, Pieris Don, Li Wenqi, Patel Rikesh, Clark Matt, Clare Adam T. - Crystallographic Texture Can Be Rapidly Determined by Electrochemical Surface Analytics
159:89-101
https://linkinghub.elsevier.com/retrieve/pii/S1359645418305998
Bibtex
Author : Speidel Alistair, Su Rong, Mitchell-Smith Jonathon, Dryburgh Paul, Bisterov Ivan, Pieris Don, Li Wenqi, Patel Rikesh, Clark Matt, Clare Adam T.
Title : Crystallographic Texture Can Be Rapidly Determined by Electrochemical Surface Analytics
In : -
Address :
Date :

Colombi, Andrea, Ageeva, Victoria, Smith, Richard J., Clare, Adam, Patel, Rikesh, Clark, Matt, Colquitt, Daniel, Roux, Philippe, Guenneau, Sebastien, Craster, Richard V. - Enhanced sensing and conversion of ultrasonic Rayleigh waves by elastic metasurfaces
Scientific Reports 7(1), Dec 2017
http://www.nature.com/articles/s41598-017-07151-6
Bibtex
Author : Colombi, Andrea, Ageeva, Victoria, Smith, Richard J., Clare, Adam, Patel, Rikesh, Clark, Matt, Colquitt, Daniel, Roux, Philippe, Guenneau, Sebastien, Craster, Richard V.
Title : Enhanced sensing and conversion of ultrasonic Rayleigh waves by elastic metasurfaces
In : Scientific Reports -
Address :
Date : Dec 2017

M. Hirsch, P. Dryburgh, S. Catchpole-Smith, R. Patel, L. Parry, S.D. Sharples, I.A. Ashcroft, A.T. Clare - Targeted rework strategies for powder bed additive manufacture
Additive Manufacturing 19:127 - 133,2018
https://www.sciencedirect.com/science/article/pii/S2214860417303925
Bibtex
Author : M. Hirsch, P. Dryburgh, S. Catchpole-Smith, R. Patel, L. Parry, S.D. Sharples, I.A. Ashcroft, A.T. Clare
Title : Targeted rework strategies for powder bed additive manufacture
In : Additive Manufacturing -
Address :
Date : 2018

Rikesh Patel, Wenqi Li, Richard J. Smith, Steve D. Sharples, Matt Clark - Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy
Scripta Materialia 140(Supplement C):67 - 70,2017
http://www.sciencedirect.com/science/article/pii/S1359646217303846
Bibtex
Author : Rikesh Patel, Wenqi Li, Richard J. Smith, Steve D. Sharples, Matt Clark
Title : Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy
In : Scripta Materialia -
Address :
Date : 2017

Hirsch, M., Catchpole-Smith, S., Patel, R., Marrow, P., Li, Wenqi, Tuck, C., Sharples, S. D., Clare, A. T. - Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy
Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences 473(2205),2017
http://rspa.royalsocietypublishing.org/content/473/2205/20170194
Bibtex
Author : Hirsch, M., Catchpole-Smith, S., Patel, R., Marrow, P., Li, Wenqi, Tuck, C., Sharples, S. D., Clare, A. T.
Title : Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy
In : Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences -
Address :
Date : 2017

Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare - Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
Additive Manufacturing 13:135 - 142,2017
http://www.sciencedirect.com/science/article/pii/S2214860416301877
Bibtex
Author : Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare
Title : Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
In : Additive Manufacturing -
Address :
Date : 2017

Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples - Spatially resolved acoustic spectroscopy for selective laser melting
Journal of Materials Processing Technology 236:93 - 102,2016
http://www.sciencedirect.com/science/article/pii/S0924013616301352
Bibtex
Author : Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples
Title : Spatially resolved acoustic spectroscopy for selective laser melting
In : Journal of Materials Processing Technology -
Address :
Date : 2016

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield two laser interferometry
Opt. Express 22(22):27094--27101, Nov 2014
http://www.opticsexpress.org/abstract.cfm?URI=oe-22-22-27094
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield two laser interferometry
In : Opt. Express -
Address :
Date : Nov 2014

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Ultrastable heterodyne interferometer system using a CMOS modulated light camera
Opt. Express 20(16):17722--17733, Jul 2012
http://www.opticsexpress.org/abstract.cfm?URI=oe-20-16-17722
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Ultrastable heterodyne interferometer system using a CMOS modulated light camera
In : Opt. Express -
Address :
Date : Jul 2012

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield heterodyne interferometry using a custom CMOS modulated light camera
Opt. Express 19(24):24546--24556, Nov 2011
http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield heterodyne interferometry using a custom CMOS modulated light camera
In : Opt. Express -
Address :
Date : Nov 2011
Retrieved from "https://optics.eee.nottingham.ac.uk/w/index.php?title=Rikesh_Patel&oldid=4211"