Difference between revisions of "Rikesh Patel"

From Applied Optics Wiki
Jump to: navigation, search
(Journal publications)
Line 46: Line 46:
 
<bibtex>
 
<bibtex>
 
@ARTICLE{Patel2011a,  author = {Rikesh Patel and Samuel Achamfuo-Yeboah and Roger Light and Matt Clark},  title = {Widefield heterodyne interferometry using a custom CMOS modulated light camera},  journal = {Opt. Express},  year = {2011},  volume = {19},  pages = {24546--24556},  number = {24},  month = {Nov},  abstract = {In this paper a method of taking widefield heterodyne interferograms using a prototype modulated light camera is described. This custom CMOS modulated light camera (MLC) uses analogue quadrature demodulation at each pixel to output the phase and amplitude of the modulated light as DC voltages. The heterodyne interference fringe patterns are generated using an acousto-optical frequency shifter (AOFS) in an arm of a Mach-Zehnder interferometer. Widefield images of fringe patterns acquired using the prototype MLC are presented. The phase can be measured to an accuracy of {\textpm}6.6{\textdegree}. The added value of this method to acquire widefield images are discussed along with the advantages.},  doi = {10.1364/OE.19.024546},  owner = {rp},  publisher = {OSA},  timestamp = {2012.01.13},  url = {http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/d/d6/Pap1.pdf}}
 
@ARTICLE{Patel2011a,  author = {Rikesh Patel and Samuel Achamfuo-Yeboah and Roger Light and Matt Clark},  title = {Widefield heterodyne interferometry using a custom CMOS modulated light camera},  journal = {Opt. Express},  year = {2011},  volume = {19},  pages = {24546--24556},  number = {24},  month = {Nov},  abstract = {In this paper a method of taking widefield heterodyne interferograms using a prototype modulated light camera is described. This custom CMOS modulated light camera (MLC) uses analogue quadrature demodulation at each pixel to output the phase and amplitude of the modulated light as DC voltages. The heterodyne interference fringe patterns are generated using an acousto-optical frequency shifter (AOFS) in an arm of a Mach-Zehnder interferometer. Widefield images of fringe patterns acquired using the prototype MLC are presented. The phase can be measured to an accuracy of {\textpm}6.6{\textdegree}. The added value of this method to acquire widefield images are discussed along with the advantages.},  doi = {10.1364/OE.19.024546},  owner = {rp},  publisher = {OSA},  timestamp = {2012.01.13},  url = {http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/d/d6/Pap1.pdf}}
 +
</bibtex>
 +
 +
<bibtex>
 +
@article{Smith201693,
 +
title = "Spatially resolved acoustic spectroscopy for selective laser melting ",
 +
journal = "Journal of Materials Processing Technology ",
 +
volume = "236",
 +
number = "",
 +
pages = "93 - 102",
 +
year = "2016",
 +
note = "",
 +
issn = "0924-0136",
 +
doi = "http://dx.doi.org/10.1016/j.jmatprotec.2016.05.005",
 +
url = "http://www.sciencedirect.com/science/article/pii/S0924013616301352",
 +
author = "Richard J. Smith and Matthias Hirsch and Rikesh Patel and Wenqi Li and Adam T. Clare and Steve D. Sharples",
 +
keywords = "Non-destructive testing",
 +
keywords = "Spatially resolved acoustic spectroscopy",
 +
keywords = "Selective laser melting",
 +
keywords = "Additive manufacture",
 +
keywords = "Titanium Ti-6Al-4V "
 +
}
 +
</bibtex>
 +
 +
<bibtex>
 +
@article{Hirsch2017135,
 +
title = "Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture ",
 +
journal = "Additive Manufacturing ",
 +
volume = "13",
 +
number = "",
 +
pages = "135 - 142",
 +
year = "2017",
 +
note = "",
 +
issn = "2214-8604",
 +
doi = "http://dx.doi.org/10.1016/j.addma.2016.10.004",
 +
url = "http://www.sciencedirect.com/science/article/pii/S2214860416301877",
 +
author = "Matthias Hirsch and Rikesh Patel and Wenqi Li and Guangying Guan and Richard K. Leach and Steve D. Sharples and Adam T. Clare",
 +
keywords = "Nondestructive evaluation",
 +
keywords = "Additive manufacturing",
 +
keywords = "Process control",
 +
keywords = "In-situ analysis "
 +
}
 
</bibtex>
 
</bibtex>
  

Revision as of 12:14, 23 March 2017

Rikesh Patel

Location

C38 SIOS Pharmacy, University Park

202/306 Tower, University Park

Phone

+44 (0)115 95-15605

Email

rikesh.patelAtnotts.png

Education/Posts

2004-2008 MEng Electronic and Computer Engineering (1st Class), University of Nottingham

2008-2014 PhD Electrical and Electronic Engineering (Thesis), University of Nottingham

2013-2014 Research Assistant, University of Nottingham

2014- Research Associate, University of Nottingham


Awards

  • University of Nottingham interdisciplinary research funding award (UNICAS) - 2014
  • Applied optics group internal research proposal review award (1st place) - 2015

Journal publications

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield two laser interferometry
Opt. Express 22(22):27094--27101, Nov 2014
http://www.opticsexpress.org/abstract.cfm?URI=oe-22-22-27094
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield two laser interferometry
In : Opt. Express -
Address :
Date : Nov 2014

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Ultrastable heterodyne interferometer system using a CMOS modulated light camera
Opt. Express 20(16):17722--17733, Jul 2012
http://www.opticsexpress.org/abstract.cfm?URI=oe-20-16-17722
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Ultrastable heterodyne interferometer system using a CMOS modulated light camera
In : Opt. Express -
Address :
Date : Jul 2012

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield heterodyne interferometry using a custom CMOS modulated light camera
Opt. Express 19(24):24546--24556, Nov 2011
http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield heterodyne interferometry using a custom CMOS modulated light camera
In : Opt. Express -
Address :
Date : Nov 2011

Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples - Spatially resolved acoustic spectroscopy for selective laser melting
Journal of Materials Processing Technology 236:93 - 102,2016
http://www.sciencedirect.com/science/article/pii/S0924013616301352
Bibtex
Author : Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples
Title : Spatially resolved acoustic spectroscopy for selective laser melting
In : Journal of Materials Processing Technology -
Address :
Date : 2016

Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare - Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
Additive Manufacturing 13:135 - 142,2017
http://www.sciencedirect.com/science/article/pii/S2214860416301877
Bibtex
Author : Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare
Title : Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
In : Additive Manufacturing -
Address :
Date : 2017

Conferences

  • UON Institute of Aerospace exposition, Nottingham UK - 2010
  • KTP innovate event, London UK - 2011
  • OSA Optics and Photonics Congress, Toronto Canada - 2011
  • IOP Photon12, Durham UK - 2012
  • IOP Anglo-French physical acoustic conference AFPAC2015, Frejus France - 2015
  • BINDT Aerospace event 2015, Sheffield UK - 2015
  • RCNDE Annual research review, Manchester UK - 2015
  • International Symposium on Laser Ultrasonics LU2015, Evanston IL USA - 2015