Rikesh Patel

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Rikesh Patel

Rp portrait.jpg

Assistant Professor, Department of Electrical and Electronic Engineering, University of Nottingham

Address: A46 Coates Building, University Park, Nottingham, NG7 2RD, UK

Phone: +44 (0)115 84-67892

Email: rikesh.patelAtnotts.png

ORCID: 0000-0003-0751-4533

External links:

UoN repository (old link)

Google Scholar

ResearchGate

Grants on the web

Journal publications

Lee, Yong, Kitazawa, So, Patel, Rikesh - Simple Method of Measuring Thicknesses of Surface-Hardened Layers by Laser Ultrasonic Technique
Jpn. J. Appl. Phys. ,2021
https://iopscience.iop.org/article/10.35848/1347-4065/ac030f
Bibtex
Author : Lee, Yong, Kitazawa, So, Patel, Rikesh
Title : Simple Method of Measuring Thicknesses of Surface-Hardened Layers by Laser Ultrasonic Technique
In : Jpn. J. Appl. Phys. -
Address :
Date : 2021

Patel, Rikesh, Sharples, Steve D., Clark, Matt, Somekh, Mike G., Li, Wenqi - Single Pixel Camera Methodologies for Spatially Resolved Acoustic Spectroscopy
Appl. Phys. Lett. 118(5):051102,2021
https://aip.scitation.org/doi/10.1063/5.0040123
Bibtex
Author : Patel, Rikesh, Sharples, Steve D., Clark, Matt, Somekh, Mike G., Li, Wenqi
Title : Single Pixel Camera Methodologies for Spatially Resolved Acoustic Spectroscopy
In : Appl. Phys. Lett. -
Address :
Date : 2021

Brown, M., Pieris, D., Wright, D., Crawforth, P., M'Saoubi, R., McGourlay, J., Mantle, A., Patel, R., Smith, R.J., Ghadbeigi, H. - Non-Destructive Detection of Machining-Induced White Layers through Grain Size and Crystallographic Texture-Sensitive Methods
Materials \& Design 200:109472,2021
https://linkinghub.elsevier.com/retrieve/pii/S0264127521000253
Bibtex
Author : Brown, M., Pieris, D., Wright, D., Crawforth, P., M'Saoubi, R., McGourlay, J., Mantle, A., Patel, R., Smith, R.J., Ghadbeigi, H.
Title : Non-Destructive Detection of Machining-Induced White Layers through Grain Size and Crystallographic Texture-Sensitive Methods
In : Materials \& Design -
Address :
Date : 2021

Dryburgh, Paul, Pieris, Don, Martina, Filomeno, Patel, Rikesh, Sharples, Steve, Li, Wenqi, Clare, Adam T., Williams, Stewart, Smith, Richard J. - Spatially Resolved Acoustic Spectroscopy for Integrity Assessment in Wire-Arc Additive Manufacturing
Additive Manufacturing 28:236--251,2019
https://linkinghub.elsevier.com/retrieve/pii/S2214860419302994
Bibtex
Author : Dryburgh, Paul, Pieris, Don, Martina, Filomeno, Patel, Rikesh, Sharples, Steve, Li, Wenqi, Clare, Adam T., Williams, Stewart, Smith, Richard J.
Title : Spatially Resolved Acoustic Spectroscopy for Integrity Assessment in Wire-Arc Additive Manufacturing
In : Additive Manufacturing -
Address :
Date : 2019

Pieris, D, Patel, R, Dryburgh, P, Hirsch, M, Li, W, Sharples, S D, Smith, R J, Clare, A T, Clark, M - Spatially Resolved Acoustic Spectroscopy Towards Online Inspection of Additive Manufacturing
Insight - Non-Destructive Testing and Condition Monitoring 61(3):132--137,2019
https://www.ingentaconnect.com/content/10.1784/insi.2019.61.3.132
Bibtex
Author : Pieris, D, Patel, R, Dryburgh, P, Hirsch, M, Li, W, Sharples, S D, Smith, R J, Clare, A T, Clark, M
Title : Spatially Resolved Acoustic Spectroscopy Towards Online Inspection of Additive Manufacturing
In : Insight - Non-Destructive Testing and Condition Monitoring -
Address :
Date : 2019

Patel Rikesh, Hirsch Matthias, Dryburgh Paul, Pieris Don, Achamfuo-Yeboah Samuel, Smith Richard, Light Roger, Sharples Steve, Clare Adam, Clark Matt - Imaging Material Texture of As-Deposited Selective Laser Melted Parts Using Spatially Resolved Acoustic Spectroscopy
8(10):1991
http://www.mdpi.com/2076-3417/8/10/1991
Bibtex
Author : Patel Rikesh, Hirsch Matthias, Dryburgh Paul, Pieris Don, Achamfuo-Yeboah Samuel, Smith Richard, Light Roger, Sharples Steve, Clare Adam, Clark Matt
Title : Imaging Material Texture of As-Deposited Selective Laser Melted Parts Using Spatially Resolved Acoustic Spectroscopy
In : -
Address :
Date :

Speidel Alistair, Su Rong, Mitchell-Smith Jonathon, Dryburgh Paul, Bisterov Ivan, Pieris Don, Li Wenqi, Patel Rikesh, Clark Matt, Clare Adam T. - Crystallographic Texture Can Be Rapidly Determined by Electrochemical Surface Analytics
159:89-101
https://linkinghub.elsevier.com/retrieve/pii/S1359645418305998
Bibtex
Author : Speidel Alistair, Su Rong, Mitchell-Smith Jonathon, Dryburgh Paul, Bisterov Ivan, Pieris Don, Li Wenqi, Patel Rikesh, Clark Matt, Clare Adam T.
Title : Crystallographic Texture Can Be Rapidly Determined by Electrochemical Surface Analytics
In : -
Address :
Date :

Colombi, Andrea, Ageeva, Victoria, Smith, Richard J., Clare, Adam, Patel, Rikesh, Clark, Matt, Colquitt, Daniel, Roux, Philippe, Guenneau, Sebastien, Craster, Richard V. - Enhanced sensing and conversion of ultrasonic Rayleigh waves by elastic metasurfaces
Scientific Reports 7(1), Dec 2017
http://www.nature.com/articles/s41598-017-07151-6
Bibtex
Author : Colombi, Andrea, Ageeva, Victoria, Smith, Richard J., Clare, Adam, Patel, Rikesh, Clark, Matt, Colquitt, Daniel, Roux, Philippe, Guenneau, Sebastien, Craster, Richard V.
Title : Enhanced sensing and conversion of ultrasonic Rayleigh waves by elastic metasurfaces
In : Scientific Reports -
Address :
Date : Dec 2017

M. Hirsch, P. Dryburgh, S. Catchpole-Smith, R. Patel, L. Parry, S.D. Sharples, I.A. Ashcroft, A.T. Clare - Targeted rework strategies for powder bed additive manufacture
Additive Manufacturing 19:127 - 133,2018
https://www.sciencedirect.com/science/article/pii/S2214860417303925
Bibtex
Author : M. Hirsch, P. Dryburgh, S. Catchpole-Smith, R. Patel, L. Parry, S.D. Sharples, I.A. Ashcroft, A.T. Clare
Title : Targeted rework strategies for powder bed additive manufacture
In : Additive Manufacturing -
Address :
Date : 2018

Rikesh Patel, Wenqi Li, Richard J. Smith, Steve D. Sharples, Matt Clark - Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy
Scripta Materialia 140(Supplement C):67 - 70,2017
http://www.sciencedirect.com/science/article/pii/S1359646217303846
Bibtex
Author : Rikesh Patel, Wenqi Li, Richard J. Smith, Steve D. Sharples, Matt Clark
Title : Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy
In : Scripta Materialia -
Address :
Date : 2017

Hirsch, M., Catchpole-Smith, S., Patel, R., Marrow, P., Li, Wenqi, Tuck, C., Sharples, S. D., Clare, A. T. - Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy
Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences 473(2205),2017
http://rspa.royalsocietypublishing.org/content/473/2205/20170194
Bibtex
Author : Hirsch, M., Catchpole-Smith, S., Patel, R., Marrow, P., Li, Wenqi, Tuck, C., Sharples, S. D., Clare, A. T.
Title : Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy
In : Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences -
Address :
Date : 2017

Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare - Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
Additive Manufacturing 13:135 - 142,2017
http://www.sciencedirect.com/science/article/pii/S2214860416301877
Bibtex
Author : Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare
Title : Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
In : Additive Manufacturing -
Address :
Date : 2017

Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples - Spatially resolved acoustic spectroscopy for selective laser melting
Journal of Materials Processing Technology 236:93 - 102,2016
http://www.sciencedirect.com/science/article/pii/S0924013616301352
Bibtex
Author : Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples
Title : Spatially resolved acoustic spectroscopy for selective laser melting
In : Journal of Materials Processing Technology -
Address :
Date : 2016

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield two laser interferometry
Opt. Express 22(22):27094--27101, Nov 2014
http://www.opticsexpress.org/abstract.cfm?URI=oe-22-22-27094
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield two laser interferometry
In : Opt. Express -
Address :
Date : Nov 2014

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Ultrastable heterodyne interferometer system using a CMOS modulated light camera
Opt. Express 20(16):17722--17733, Jul 2012
http://www.opticsexpress.org/abstract.cfm?URI=oe-20-16-17722
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Ultrastable heterodyne interferometer system using a CMOS modulated light camera
In : Opt. Express -
Address :
Date : Jul 2012

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield heterodyne interferometry using a custom CMOS modulated light camera
Opt. Express 19(24):24546--24556, Nov 2011
http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield heterodyne interferometry using a custom CMOS modulated light camera
In : Opt. Express -
Address :
Date : Nov 2011