Difference between revisions of "Rikesh Patel"
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__NOTOC__ | __NOTOC__ | ||
='''Rikesh Patel'''= | ='''Rikesh Patel'''= | ||
+ | [[Image:Rp_portrait.jpg|right|200px|link=]] | ||
+ | Assistant Professor, Department of Electrical and Electronic Engineering, University of Nottingham | ||
+ | Address: A46 Coates Building, University Park, Nottingham, NG7 2RD, UK | ||
− | + | Phone: +44 (0)115 84-67892 | |
− | + | Email: rikesh.patel[[Image:Atnotts.png|110px|link=]] | |
− | + | ORCID: [https://orcid.org/0000-0003-0751-4533 0000-0003-0751-4533] | |
− | + | External links: | |
− | + | [https://nottingham-repository.worktribe.com/person/234634/rikesh-patel/outputs UoN repository] [http://eprints.nottingham.ac.uk/view/people/Patel=3ARikesh=3A=3A.html (old link)] | |
− | + | [https://scholar.google.com/citations?user=eDzvB5UAAAAJ Google Scholar] | |
− | + | [https://www.researchgate.net/profile/Rikesh-Patel-2 ResearchGate] | |
− | + | [https://gow.epsrc.ukri.org/NGBOViewPerson.aspx?PersonId=-223355 Grants on the web] | |
− | + | ==Journal publications== | |
+ | |||
+ | <bibtex> | ||
+ | @article{liImagingMicrostructureOptically2023, | ||
+ | title = {Imaging Microstructure on Optically Rough Surfaces Using Spatially Resolved Acoustic Spectroscopy}, | ||
+ | author = {Li, Wenqi and Dryburgh, Paul and Pieris, Don and Patel, Rikesh and Clark, Matt and Smith, Richard J.}, | ||
+ | year = {2023}, | ||
+ | url = {https://www.mdpi.com/2076-3417/13/6/3424}, | ||
+ | journal = {Applied Sciences}, | ||
+ | volume = {13}, | ||
+ | number = {6}, | ||
+ | pages = {3424}, | ||
+ | issn = {2076-3417}, | ||
+ | doi = {10.3390/app13063424}, | ||
+ | urldate = {2023-03-13}, | ||
+ | abstract = {The microstructure of a material defines many of its mechanical properties. Tracking the microstructure of parts during their manufacturing is needed to ensure the designed performance can be obtained, especially for additively manufactured parts. Measuring the microstructure non-destructively on real parts is challenging for optical techniques such as laser ultrasound, as the optically rough surface impacts the ability to generate and detect acoustic waves. Spatially resolved acoustic spectroscopy can be used to measure the microstructure, and this paper presents the capability on a range of surface finishes. We discuss how to describe 'roughness' and how this influences the measurements. We demonstrate that measurements can be made on surfaces with Ra up to 28 {$\mu$}m for a selection of roughness comparators. Velocity images on a range of real surface finishes, including machined, etched, and additively manufactured finishes in an as-deposited state, are presented. We conclude that the Ra is a poor descriptor for the ability to perform measurements as the correlation length of the roughness has a large impact on the ability to detected the surface waves. Despite this issue, a wide range of real industrially relevant surface conditions can be measured.}, | ||
+ | langid = {english} | ||
+ | } | ||
+ | </bibtex> | ||
− | + | <bibtex> | |
+ | @article{kitazawaNoncontactMeasurementBolt2023, | ||
+ | title = {Noncontact Measurement of Bolt Axial Force in Tightening Processes Using Scattered Laser Ultrasonic Waves}, | ||
+ | author = {Kitazawa, So and Lee, Yong and Patel, Rikesh}, | ||
+ | year = {2023}, | ||
+ | url = {https://linkinghub.elsevier.com/retrieve/pii/S0963869523000531}, | ||
+ | journal = {NDT & E International}, | ||
+ | pages = {102838}, | ||
+ | issn = {09638695}, | ||
+ | doi = {10.1016/j.ndteint.2023.102838}, | ||
+ | urldate = {2023-04-03}, | ||
+ | langid = {english} | ||
+ | } | ||
+ | </bibtex> | ||
− | + | <bibtex> | |
+ | @article{dryburghMeasurementSingleCrystal2022, | ||
+ | title = {Measurement of the Single Crystal Elasticity Matrix of Polycrystalline Materials}, | ||
+ | author = {Dryburgh, Paul and Li, Wenqi and Pieris, Don and Fuentes-Dominguez, Rafael and Patel, Rikesh and Smith, Richard J. and Clark, Matt}, | ||
+ | year = {2022}, | ||
+ | url = {https://linkinghub.elsevier.com/retrieve/pii/S1359645421009290}, | ||
+ | journal = {Acta Materialia}, | ||
+ | volume = {225}, | ||
+ | pages = {117551}, | ||
+ | issn = {13596454}, | ||
+ | doi = {10.1016/j.actamat.2021.117551}, | ||
+ | urldate = {2021-12-29}, | ||
+ | langid = {english} | ||
+ | } | ||
+ | </bibtex> | ||
− | + | <bibtex> | |
+ | @article{leeSimpleMethodMeasuring2021, | ||
+ | title = {Simple Method of Measuring Thicknesses of Surface-Hardened Layers by Laser Ultrasonic Technique}, | ||
+ | author = {Lee, Yong and Kitazawa, So and Patel, Rikesh}, | ||
+ | year = {2021}, | ||
+ | url = {https://iopscience.iop.org/article/10.35848/1347-4065/ac030f}, | ||
+ | journal = {Jpn. J. Appl. Phys.}, | ||
+ | issn = {0021-4922, 1347-4065}, | ||
+ | doi = {10.35848/1347-4065/ac030f} | ||
+ | } | ||
+ | </bibtex> | ||
− | == | + | <bibtex> |
+ | @article{patelSinglePixelCamera2021, | ||
+ | title = {Single Pixel Camera Methodologies for Spatially Resolved Acoustic Spectroscopy}, | ||
+ | author = {Patel, Rikesh and Sharples, Steve D. and Clark, Matt and Somekh, Mike G. and Li, Wenqi}, | ||
+ | year = {2021}, | ||
+ | url = {https://aip.scitation.org/doi/10.1063/5.0040123}, | ||
+ | journal = {Appl. Phys. Lett.}, | ||
+ | volume = {118}, | ||
+ | number = {5}, | ||
+ | pages = {051102}, | ||
+ | issn = {0003-6951, 1077-3118}, | ||
+ | doi = {10.1063/5.0040123}, | ||
+ | language = {en} | ||
+ | } | ||
+ | </bibtex> | ||
− | + | <bibtex> | |
− | + | @article{brownNondestructiveDetectionMachininginduced2021a, | |
+ | title = {Non-Destructive Detection of Machining-Induced White Layers through Grain Size and Crystallographic Texture-Sensitive Methods}, | ||
+ | author = {Brown, M. and Pieris, D. and Wright, D. and Crawforth, P. and M'Saoubi, R. and McGourlay, J. and Mantle, A. and Patel, R. and Smith, R.J. and Ghadbeigi, H.}, | ||
+ | year = {2021}, | ||
+ | url = {https://linkinghub.elsevier.com/retrieve/pii/S0264127521000253}, | ||
+ | journal = {Materials \& Design}, | ||
+ | volume = {200}, | ||
+ | pages = {109472}, | ||
+ | issn = {02641275}, | ||
+ | doi = {10.1016/j.matdes.2021.109472}, | ||
+ | language = {en} | ||
+ | } | ||
+ | </bibtex> | ||
− | == | + | <bibtex> |
+ | @article{dryburgh_spatially_2019-1, | ||
+ | title = {Spatially Resolved Acoustic Spectroscopy for Integrity Assessment in Wire-Arc Additive Manufacturing}, | ||
+ | author = {Dryburgh, Paul and Pieris, Don and Martina, Filomeno and Patel, Rikesh and Sharples, Steve and Li, Wenqi and Clare, Adam T. and Williams, Stewart and Smith, Richard J.}, | ||
+ | year = {2019}, | ||
+ | url = {https://linkinghub.elsevier.com/retrieve/pii/S2214860419302994}, | ||
+ | journal = {Additive Manufacturing}, | ||
+ | volume = {28}, | ||
+ | pages = {236--251}, | ||
+ | issn = {22148604}, | ||
+ | doi = {10.1016/j.addma.2019.04.015}, | ||
+ | language = {en} | ||
+ | } | ||
+ | </bibtex> | ||
− | + | <bibtex> | |
+ | @article{pieris_spatially_2019-1, | ||
+ | title = {Spatially Resolved Acoustic Spectroscopy Towards Online Inspection of Additive Manufacturing}, | ||
+ | author = {Pieris, D and Patel, R and Dryburgh, P and Hirsch, M and Li, W and Sharples, S D and Smith, R J and Clare, A T and Clark, M}, | ||
+ | year = {2019}, | ||
+ | url = {https://www.ingentaconnect.com/content/10.1784/insi.2019.61.3.132}, | ||
+ | journal = {Insight - Non-Destructive Testing and Condition Monitoring}, | ||
+ | volume = {61}, | ||
+ | number = {3}, | ||
+ | pages = {132--137}, | ||
+ | issn = {1354-2575}, | ||
+ | doi = {10.1784/insi.2019.61.3.132}, | ||
+ | language = {en} | ||
+ | } | ||
+ | </bibtex> | ||
<bibtex> | <bibtex> | ||
Line 179: | Line 290: | ||
@ARTICLE{Patel2011a, author = {Rikesh Patel and Samuel Achamfuo-Yeboah and Roger Light and Matt Clark}, title = {Widefield heterodyne interferometry using a custom CMOS modulated light camera}, journal = {Opt. Express}, year = {2011}, volume = {19}, pages = {24546--24556}, number = {24}, month = {Nov}, abstract = {In this paper a method of taking widefield heterodyne interferograms using a prototype modulated light camera is described. This custom CMOS modulated light camera (MLC) uses analogue quadrature demodulation at each pixel to output the phase and amplitude of the modulated light as DC voltages. The heterodyne interference fringe patterns are generated using an acousto-optical frequency shifter (AOFS) in an arm of a Mach-Zehnder interferometer. Widefield images of fringe patterns acquired using the prototype MLC are presented. The phase can be measured to an accuracy of {\textpm}6.6{\textdegree}. The added value of this method to acquire widefield images are discussed along with the advantages.}, doi = {10.1364/OE.19.024546}, owner = {rp}, publisher = {OSA}, timestamp = {2012.01.13}, url = {http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/d/d6/Pap1.pdf}} | @ARTICLE{Patel2011a, author = {Rikesh Patel and Samuel Achamfuo-Yeboah and Roger Light and Matt Clark}, title = {Widefield heterodyne interferometry using a custom CMOS modulated light camera}, journal = {Opt. Express}, year = {2011}, volume = {19}, pages = {24546--24556}, number = {24}, month = {Nov}, abstract = {In this paper a method of taking widefield heterodyne interferograms using a prototype modulated light camera is described. This custom CMOS modulated light camera (MLC) uses analogue quadrature demodulation at each pixel to output the phase and amplitude of the modulated light as DC voltages. The heterodyne interference fringe patterns are generated using an acousto-optical frequency shifter (AOFS) in an arm of a Mach-Zehnder interferometer. Widefield images of fringe patterns acquired using the prototype MLC are presented. The phase can be measured to an accuracy of {\textpm}6.6{\textdegree}. The added value of this method to acquire widefield images are discussed along with the advantages.}, doi = {10.1364/OE.19.024546}, owner = {rp}, publisher = {OSA}, timestamp = {2012.01.13}, url = {http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546}, pdf = {http://optics.eee.nottingham.ac.uk/w/images/d/d6/Pap1.pdf}} | ||
</bibtex> | </bibtex> | ||
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Revision as of 09:15, 13 April 2023
Rikesh Patel
Assistant Professor, Department of Electrical and Electronic Engineering, University of Nottingham
Address: A46 Coates Building, University Park, Nottingham, NG7 2RD, UK
Phone: +44 (0)115 84-67892
Email: rikesh.patel
ORCID: 0000-0003-0751-4533
External links:
Journal publications
Li, Wenqi, Dryburgh, Paul, Pieris, Don, Patel, Rikesh, Clark, Matt, Smith, Richard J. - Imaging Microstructure on Optically Rough Surfaces Using Spatially Resolved Acoustic Spectroscopy
- Applied Sciences 13(6):3424,2023
- https://www.mdpi.com/2076-3417/13/6/3424
BibtexAuthor : Li, Wenqi, Dryburgh, Paul, Pieris, Don, Patel, Rikesh, Clark, Matt, Smith, Richard J.
Title : Imaging Microstructure on Optically Rough Surfaces Using Spatially Resolved Acoustic Spectroscopy
In : Applied Sciences -
Address :
Date : 2023
Kitazawa, So, Lee, Yong, Patel, Rikesh - Noncontact Measurement of Bolt Axial Force in Tightening Processes Using Scattered Laser Ultrasonic Waves
- NDT & E International pp. 102838,2023
- https://linkinghub.elsevier.com/retrieve/pii/S0963869523000531
BibtexAuthor : Kitazawa, So, Lee, Yong, Patel, Rikesh
Title : Noncontact Measurement of Bolt Axial Force in Tightening Processes Using Scattered Laser Ultrasonic Waves
In : NDT & E International -
Address :
Date : 2023
Dryburgh, Paul, Li, Wenqi, Pieris, Don, Fuentes-Dominguez, Rafael, Patel, Rikesh, Smith, Richard J., Clark, Matt - Measurement of the Single Crystal Elasticity Matrix of Polycrystalline Materials
- Acta Materialia 225:117551,2022
- https://linkinghub.elsevier.com/retrieve/pii/S1359645421009290
BibtexAuthor : Dryburgh, Paul, Li, Wenqi, Pieris, Don, Fuentes-Dominguez, Rafael, Patel, Rikesh, Smith, Richard J., Clark, Matt
Title : Measurement of the Single Crystal Elasticity Matrix of Polycrystalline Materials
In : Acta Materialia -
Address :
Date : 2022
Lee, Yong, Kitazawa, So, Patel, Rikesh - Simple Method of Measuring Thicknesses of Surface-Hardened Layers by Laser Ultrasonic Technique
- Jpn. J. Appl. Phys. ,2021
- https://iopscience.iop.org/article/10.35848/1347-4065/ac030f
BibtexAuthor : Lee, Yong, Kitazawa, So, Patel, Rikesh
Title : Simple Method of Measuring Thicknesses of Surface-Hardened Layers by Laser Ultrasonic Technique
In : Jpn. J. Appl. Phys. -
Address :
Date : 2021
Patel, Rikesh, Sharples, Steve D., Clark, Matt, Somekh, Mike G., Li, Wenqi - Single Pixel Camera Methodologies for Spatially Resolved Acoustic Spectroscopy
- Appl. Phys. Lett. 118(5):051102,2021
- https://aip.scitation.org/doi/10.1063/5.0040123
BibtexAuthor : Patel, Rikesh, Sharples, Steve D., Clark, Matt, Somekh, Mike G., Li, Wenqi
Title : Single Pixel Camera Methodologies for Spatially Resolved Acoustic Spectroscopy
In : Appl. Phys. Lett. -
Address :
Date : 2021
Brown, M., Pieris, D., Wright, D., Crawforth, P., M'Saoubi, R., McGourlay, J., Mantle, A., Patel, R., Smith, R.J., Ghadbeigi, H. - Non-Destructive Detection of Machining-Induced White Layers through Grain Size and Crystallographic Texture-Sensitive Methods
- Materials \& Design 200:109472,2021
- https://linkinghub.elsevier.com/retrieve/pii/S0264127521000253
BibtexAuthor : Brown, M., Pieris, D., Wright, D., Crawforth, P., M'Saoubi, R., McGourlay, J., Mantle, A., Patel, R., Smith, R.J., Ghadbeigi, H.
Title : Non-Destructive Detection of Machining-Induced White Layers through Grain Size and Crystallographic Texture-Sensitive Methods
In : Materials \& Design -
Address :
Date : 2021
Dryburgh, Paul, Pieris, Don, Martina, Filomeno, Patel, Rikesh, Sharples, Steve, Li, Wenqi, Clare, Adam T., Williams, Stewart, Smith, Richard J. - Spatially Resolved Acoustic Spectroscopy for Integrity Assessment in Wire-Arc Additive Manufacturing
- Additive Manufacturing 28:236--251,2019
- https://linkinghub.elsevier.com/retrieve/pii/S2214860419302994
BibtexAuthor : Dryburgh, Paul, Pieris, Don, Martina, Filomeno, Patel, Rikesh, Sharples, Steve, Li, Wenqi, Clare, Adam T., Williams, Stewart, Smith, Richard J.
Title : Spatially Resolved Acoustic Spectroscopy for Integrity Assessment in Wire-Arc Additive Manufacturing
In : Additive Manufacturing -
Address :
Date : 2019
Pieris, D, Patel, R, Dryburgh, P, Hirsch, M, Li, W, Sharples, S D, Smith, R J, Clare, A T, Clark, M - Spatially Resolved Acoustic Spectroscopy Towards Online Inspection of Additive Manufacturing
- Insight - Non-Destructive Testing and Condition Monitoring 61(3):132--137,2019
- https://www.ingentaconnect.com/content/10.1784/insi.2019.61.3.132
BibtexAuthor : Pieris, D, Patel, R, Dryburgh, P, Hirsch, M, Li, W, Sharples, S D, Smith, R J, Clare, A T, Clark, M
Title : Spatially Resolved Acoustic Spectroscopy Towards Online Inspection of Additive Manufacturing
In : Insight - Non-Destructive Testing and Condition Monitoring -
Address :
Date : 2019
Patel Rikesh, Hirsch Matthias, Dryburgh Paul, Pieris Don, Achamfuo-Yeboah Samuel, Smith Richard, Light Roger, Sharples Steve, Clare Adam, Clark Matt - Imaging Material Texture of As-Deposited Selective Laser Melted Parts Using Spatially Resolved Acoustic Spectroscopy
- 8(10):1991
- http://www.mdpi.com/2076-3417/8/10/1991
BibtexAuthor : Patel Rikesh, Hirsch Matthias, Dryburgh Paul, Pieris Don, Achamfuo-Yeboah Samuel, Smith Richard, Light Roger, Sharples Steve, Clare Adam, Clark Matt
Title : Imaging Material Texture of As-Deposited Selective Laser Melted Parts Using Spatially Resolved Acoustic Spectroscopy
In : -
Address :
Date :
Speidel Alistair, Su Rong, Mitchell-Smith Jonathon, Dryburgh Paul, Bisterov Ivan, Pieris Don, Li Wenqi, Patel Rikesh, Clark Matt, Clare Adam T. - Crystallographic Texture Can Be Rapidly Determined by Electrochemical Surface Analytics
- 159:89-101
- https://linkinghub.elsevier.com/retrieve/pii/S1359645418305998
BibtexAuthor : Speidel Alistair, Su Rong, Mitchell-Smith Jonathon, Dryburgh Paul, Bisterov Ivan, Pieris Don, Li Wenqi, Patel Rikesh, Clark Matt, Clare Adam T.
Title : Crystallographic Texture Can Be Rapidly Determined by Electrochemical Surface Analytics
In : -
Address :
Date :
Colombi, Andrea, Ageeva, Victoria, Smith, Richard J., Clare, Adam, Patel, Rikesh, Clark, Matt, Colquitt, Daniel, Roux, Philippe, Guenneau, Sebastien, Craster, Richard V. - Enhanced sensing and conversion of ultrasonic Rayleigh waves by elastic metasurfaces
- Scientific Reports 7(1), Dec 2017
- http://www.nature.com/articles/s41598-017-07151-6
BibtexAuthor : Colombi, Andrea, Ageeva, Victoria, Smith, Richard J., Clare, Adam, Patel, Rikesh, Clark, Matt, Colquitt, Daniel, Roux, Philippe, Guenneau, Sebastien, Craster, Richard V.
Title : Enhanced sensing and conversion of ultrasonic Rayleigh waves by elastic metasurfaces
In : Scientific Reports -
Address :
Date : Dec 2017
M. Hirsch, P. Dryburgh, S. Catchpole-Smith, R. Patel, L. Parry, S.D. Sharples, I.A. Ashcroft, A.T. Clare - Targeted rework strategies for powder bed additive manufacture
- Additive Manufacturing 19:127 - 133,2018
- https://www.sciencedirect.com/science/article/pii/S2214860417303925
BibtexAuthor : M. Hirsch, P. Dryburgh, S. Catchpole-Smith, R. Patel, L. Parry, S.D. Sharples, I.A. Ashcroft, A.T. Clare
Title : Targeted rework strategies for powder bed additive manufacture
In : Additive Manufacturing -
Address :
Date : 2018
Rikesh Patel, Wenqi Li, Richard J. Smith, Steve D. Sharples, Matt Clark - Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy
- Scripta Materialia 140(Supplement C):67 - 70,2017
- http://www.sciencedirect.com/science/article/pii/S1359646217303846
BibtexAuthor : Rikesh Patel, Wenqi Li, Richard J. Smith, Steve D. Sharples, Matt Clark
Title : Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy
In : Scripta Materialia -
Address :
Date : 2017
Hirsch, M., Catchpole-Smith, S., Patel, R., Marrow, P., Li, Wenqi, Tuck, C., Sharples, S. D., Clare, A. T. - Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy
- Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences 473(2205),2017
- http://rspa.royalsocietypublishing.org/content/473/2205/20170194
BibtexAuthor : Hirsch, M., Catchpole-Smith, S., Patel, R., Marrow, P., Li, Wenqi, Tuck, C., Sharples, S. D., Clare, A. T.
Title : Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy
In : Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences -
Address :
Date : 2017
Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare - Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
- Additive Manufacturing 13:135 - 142,2017
- http://www.sciencedirect.com/science/article/pii/S2214860416301877
BibtexAuthor : Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare
Title : Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
In : Additive Manufacturing -
Address :
Date : 2017
Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples - Spatially resolved acoustic spectroscopy for selective laser melting
- Journal of Materials Processing Technology 236:93 - 102,2016
- http://www.sciencedirect.com/science/article/pii/S0924013616301352
BibtexAuthor : Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples
Title : Spatially resolved acoustic spectroscopy for selective laser melting
In : Journal of Materials Processing Technology -
Address :
Date : 2016
Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield two laser interferometry
- Opt. Express 22(22):27094--27101, Nov 2014
- http://www.opticsexpress.org/abstract.cfm?URI=oe-22-22-27094
BibtexAuthor : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield two laser interferometry
In : Opt. Express -
Address :
Date : Nov 2014
Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Ultrastable heterodyne interferometer system using a CMOS modulated light camera
- Opt. Express 20(16):17722--17733, Jul 2012
- http://www.opticsexpress.org/abstract.cfm?URI=oe-20-16-17722
BibtexAuthor : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Ultrastable heterodyne interferometer system using a CMOS modulated light camera
In : Opt. Express -
Address :
Date : Jul 2012
Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield heterodyne interferometry using a custom CMOS modulated light camera
- Opt. Express 19(24):24546--24556, Nov 2011
- http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546
BibtexAuthor : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield heterodyne interferometry using a custom CMOS modulated light camera
In : Opt. Express -
Address :
Date : Nov 2011