Difference between revisions of "Rikesh Patel"

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External links:  
 
External links:  
  
−
[https://nottingham-repository.worktribe.com/person/234634/rikesh-patel/outputs UoN repository] [http://eprints.nottingham.ac.uk/view/people/Patel=3ARikesh=3A=3A.html (old link)]
+
[https://nottingham-repository.worktribe.com/person/234634/rikesh-patel/outputs UoN repository]  
 +
 
 +
[http://eprints.nottingham.ac.uk/view/people/Patel=3ARikesh=3A=3A.html (old link)]
 +
 
 +
[https://www.linkedin.com/in/rikesh-r-patel LinkedIn]
  
 
[https://scholar.google.com/citations?user=eDzvB5UAAAAJ Google Scholar]
 
[https://scholar.google.com/citations?user=eDzvB5UAAAAJ Google Scholar]
Line 24: Line 28:
 
==Journal publications==
 
==Journal publications==
  
 +
<bibtex>
 +
@article{patelDevelopingNeuralNetworks2025,
 +
  title = {Developing Neural Networks to Rapidly Map Crystallographic Orientation Using Laser Ultrasound Measurements},
 +
  author = {Patel, Rikesh and Li, Wenqi and Smith, Richard J. and Clark, Matt},
 +
  year = {2025},
 +
  journal = {Scripta Materialia},
 +
  volume = {256},
 +
  pages = {116415},
 +
  issn = {13596462},
 +
  doi = {10.1016/j.scriptamat.2024.116415},
 +
  urldate = {2024-10-22},
 +
  langid = {english}
 +
url = {https://linkinghub.elsevier.com/retrieve/pii/S1359646224004500}
 +
}
 +
</bibtex>
 +
 +
<bibtex>
 +
@article{kitazawaNoncontactMeasurementBolt2023,
 +
  title = {Noncontact measurement of bolt axial force in tightening processes using laser ultrasonic waves},
 +
  author = {Kitazawa, So and Lee, Yong and Patel, Rikesh},
 +
  year = {2023},
 +
  journal = {Inspection Engineering},
 +
  volume = {28},
 +
  number = {7},
 +
  pages = {69},
 +
  issn = {1341-9825},
 +
  urldate = {2024-02-01},
 +
  langid = {jp}
 +
url = {https://www.nikko-pb.co.jp/}
 +
}
 +
</bibtex>
 +
 +
<bibtex>
 +
@article{liImagingMicrostructureOptically2023,
 +
  title = {Imaging Microstructure on Optically Rough Surfaces Using Spatially Resolved Acoustic Spectroscopy},
 +
  author = {Li, Wenqi and Dryburgh, Paul and Pieris, Don and Patel, Rikesh and Clark, Matt and Smith, Richard J.},
 +
  year = {2023},
 +
  url = {https://www.mdpi.com/2076-3417/13/6/3424},
 +
  journal = {Applied Sciences},
 +
  volume = {13},
 +
  number = {6},
 +
  pages = {3424},
 +
  issn = {2076-3417},
 +
  doi = {10.3390/app13063424},
 +
  urldate = {2023-03-13},
 +
  abstract = {The microstructure of a material defines many of its mechanical properties. Tracking the microstructure of parts during their manufacturing is needed to ensure the designed performance can be obtained, especially for additively manufactured parts. Measuring the microstructure non-destructively on real parts is challenging for optical techniques such as laser ultrasound, as the optically rough surface impacts the ability to generate and detect acoustic waves. Spatially resolved acoustic spectroscopy can be used to measure the microstructure, and this paper presents the capability on a range of surface finishes. We discuss how to describe 'roughness' and how this influences the measurements. We demonstrate that measurements can be made on surfaces with Ra up to 28 {$\mu$}m for a selection of roughness comparators. Velocity images on a range of real surface finishes, including machined, etched, and additively manufactured finishes in an as-deposited state, are presented. We conclude that the Ra is a poor descriptor for the ability to perform measurements as the correlation length of the roughness has a large impact on the ability to detected the surface waves. Despite this issue, a wide range of real industrially relevant surface conditions can be measured.},
 +
  langid = {english}
 +
}
 +
</bibtex>
  
 
<bibtex>
 
<bibtex>
Line 30: Line 83:
 
   author = {Kitazawa, So and Lee, Yong and Patel, Rikesh},
 
   author = {Kitazawa, So and Lee, Yong and Patel, Rikesh},
 
   year = {2023},
 
   year = {2023},
−
   journal = {NDT \& E International},
+
url = {https://linkinghub.elsevier.com/retrieve/pii/S0963869523000531},
 +
   journal = {NDT & E International},
 
   pages = {102838},
 
   pages = {102838},
 
   issn = {09638695},
 
   issn = {09638695},
 
   doi = {10.1016/j.ndteint.2023.102838},
 
   doi = {10.1016/j.ndteint.2023.102838},
−
  urldate = {2023-04-03},
 
 
   langid = {english}
 
   langid = {english}
 
}
 
}
Line 42: Line 95:
 
@article{dryburghMeasurementSingleCrystal2022,
 
@article{dryburghMeasurementSingleCrystal2022,
 
   title = {Measurement of the Single Crystal Elasticity Matrix of Polycrystalline Materials},
 
   title = {Measurement of the Single Crystal Elasticity Matrix of Polycrystalline Materials},
−
   author = {Dryburgh, Paul and Li, Wenqi and Pieris, Don and {Fuentes-Dom{\'i}nguez}, Rafael and Patel, Rikesh and Smith, Richard J. and Clark, Matt},
+
   author = {Dryburgh, Paul and Li, Wenqi and Pieris, Don and Fuentes-Dominguez, Rafael and Patel, Rikesh and Smith, Richard J. and Clark, Matt},
 
   year = {2022},
 
   year = {2022},
 +
url = {https://linkinghub.elsevier.com/retrieve/pii/S1359645421009290},
 
   journal = {Acta Materialia},
 
   journal = {Acta Materialia},
 
   volume = {225},
 
   volume = {225},
Line 49: Line 103:
 
   issn = {13596454},
 
   issn = {13596454},
 
   doi = {10.1016/j.actamat.2021.117551},
 
   doi = {10.1016/j.actamat.2021.117551},
−
  urldate = {2021-12-29},
 
−
  langid = {english}
 
−
}
 
−
</bibtex>
 
−
<bibtex>
 
−
@article{liImagingMicrostructureOptically2023,
 
−
  title = {Imaging {{Microstructure}} on {{Optically Rough Surfaces Using Spatially Resolved Acoustic Spectroscopy}}},
 
−
  author = {Li, Wenqi and Dryburgh, Paul and Pieris, Don and Patel, Rikesh and Clark, Matt and Smith, Richard J.},
 
−
  year = {2023},
 
−
  journal = {Applied Sciences},
 
−
  volume = {13},
 
−
  number = {6},
 
−
  pages = {3424},
 
−
  issn = {2076-3417},
 
−
  doi = {10.3390/app13063424},
 
−
  urldate = {2023-03-13},
 
−
  abstract = {The microstructure of a material defines many of its mechanical properties. Tracking the microstructure of parts during their manufacturing is needed to ensure the designed performance can be obtained, especially for additively manufactured parts. Measuring the microstructure non-destructively on real parts is challenging for optical techniques such as laser ultrasound, as the optically rough surface impacts the ability to generate and detect acoustic waves. Spatially resolved acoustic spectroscopy can be used to measure the microstructure, and this paper presents the capability on a range of surface finishes. We discuss how to describe 'roughness' and how this influences the measurements. We demonstrate that measurements can be made on surfaces with Ra up to 28 {$\mu$}m for a selection of roughness comparators. Velocity images on a range of real surface finishes, including machined, etched, and additively manufactured finishes in an as-deposited state, are presented. We conclude that the Ra is a poor descriptor for the ability to perform measurements as the correlation length of the roughness has a large impact on the ability to detected the surface waves. Despite this issue, a wide range of real industrially relevant surface conditions can be measured.},
 
 
   langid = {english}
 
   langid = {english}
 
}
 
}

Latest revision as of 13:01, 29 October 2024

Rikesh Patel

Rp portrait.jpg

Assistant Professor, Department of Electrical and Electronic Engineering, University of Nottingham

Address: A46 Coates Building, University Park, Nottingham, NG7 2RD, UK

Phone: +44 (0)115 84-67892

Email: rikesh.patelAtnotts.png

ORCID: 0000-0003-0751-4533

External links:

UoN repository

(old link)

LinkedIn

Google Scholar

ResearchGate

Grants on the web

Journal publications

Patel, Rikesh, Li, Wenqi, Smith, Richard J., Clark, Matt - Developing Neural Networks to Rapidly Map Crystallographic Orientation Using Laser Ultrasound Measurements
Scripta Materialia 256:116415,2025
https://linkinghub.elsevier.com/retrieve/pii/S1359646224004500
Bibtex
Author : Patel, Rikesh, Li, Wenqi, Smith, Richard J., Clark, Matt
Title : Developing Neural Networks to Rapidly Map Crystallographic Orientation Using Laser Ultrasound Measurements
In : Scripta Materialia -
Address :
Date : 2025

Kitazawa, So, Lee, Yong, Patel, Rikesh - Noncontact measurement of bolt axial force in tightening processes using laser ultrasonic waves
Inspection Engineering 28(7):69,2023
https://www.nikko-pb.co.jp/
Bibtex
Author : Kitazawa, So, Lee, Yong, Patel, Rikesh
Title : Noncontact measurement of bolt axial force in tightening processes using laser ultrasonic waves
In : Inspection Engineering -
Address :
Date : 2023

Li, Wenqi, Dryburgh, Paul, Pieris, Don, Patel, Rikesh, Clark, Matt, Smith, Richard J. - Imaging Microstructure on Optically Rough Surfaces Using Spatially Resolved Acoustic Spectroscopy
Applied Sciences 13(6):3424,2023
https://www.mdpi.com/2076-3417/13/6/3424
Bibtex
Author : Li, Wenqi, Dryburgh, Paul, Pieris, Don, Patel, Rikesh, Clark, Matt, Smith, Richard J.
Title : Imaging Microstructure on Optically Rough Surfaces Using Spatially Resolved Acoustic Spectroscopy
In : Applied Sciences -
Address :
Date : 2023

Kitazawa, So, Lee, Yong, Patel, Rikesh - Noncontact Measurement of Bolt Axial Force in Tightening Processes Using Scattered Laser Ultrasonic Waves
NDT & E International pp. 102838,2023
https://linkinghub.elsevier.com/retrieve/pii/S0963869523000531
Bibtex
Author : Kitazawa, So, Lee, Yong, Patel, Rikesh
Title : Noncontact Measurement of Bolt Axial Force in Tightening Processes Using Scattered Laser Ultrasonic Waves
In : NDT & E International -
Address :
Date : 2023

Dryburgh, Paul, Li, Wenqi, Pieris, Don, Fuentes-Dominguez, Rafael, Patel, Rikesh, Smith, Richard J., Clark, Matt - Measurement of the Single Crystal Elasticity Matrix of Polycrystalline Materials
Acta Materialia 225:117551,2022
https://linkinghub.elsevier.com/retrieve/pii/S1359645421009290
Bibtex
Author : Dryburgh, Paul, Li, Wenqi, Pieris, Don, Fuentes-Dominguez, Rafael, Patel, Rikesh, Smith, Richard J., Clark, Matt
Title : Measurement of the Single Crystal Elasticity Matrix of Polycrystalline Materials
In : Acta Materialia -
Address :
Date : 2022

Lee, Yong, Kitazawa, So, Patel, Rikesh - Simple Method of Measuring Thicknesses of Surface-Hardened Layers by Laser Ultrasonic Technique
Jpn. J. Appl. Phys. ,2021
https://iopscience.iop.org/article/10.35848/1347-4065/ac030f
Bibtex
Author : Lee, Yong, Kitazawa, So, Patel, Rikesh
Title : Simple Method of Measuring Thicknesses of Surface-Hardened Layers by Laser Ultrasonic Technique
In : Jpn. J. Appl. Phys. -
Address :
Date : 2021

Patel, Rikesh, Sharples, Steve D., Clark, Matt, Somekh, Mike G., Li, Wenqi - Single Pixel Camera Methodologies for Spatially Resolved Acoustic Spectroscopy
Appl. Phys. Lett. 118(5):051102,2021
https://aip.scitation.org/doi/10.1063/5.0040123
Bibtex
Author : Patel, Rikesh, Sharples, Steve D., Clark, Matt, Somekh, Mike G., Li, Wenqi
Title : Single Pixel Camera Methodologies for Spatially Resolved Acoustic Spectroscopy
In : Appl. Phys. Lett. -
Address :
Date : 2021

Brown, M., Pieris, D., Wright, D., Crawforth, P., M'Saoubi, R., McGourlay, J., Mantle, A., Patel, R., Smith, R.J., Ghadbeigi, H. - Non-Destructive Detection of Machining-Induced White Layers through Grain Size and Crystallographic Texture-Sensitive Methods
Materials \& Design 200:109472,2021
https://linkinghub.elsevier.com/retrieve/pii/S0264127521000253
Bibtex
Author : Brown, M., Pieris, D., Wright, D., Crawforth, P., M'Saoubi, R., McGourlay, J., Mantle, A., Patel, R., Smith, R.J., Ghadbeigi, H.
Title : Non-Destructive Detection of Machining-Induced White Layers through Grain Size and Crystallographic Texture-Sensitive Methods
In : Materials \& Design -
Address :
Date : 2021

Dryburgh, Paul, Pieris, Don, Martina, Filomeno, Patel, Rikesh, Sharples, Steve, Li, Wenqi, Clare, Adam T., Williams, Stewart, Smith, Richard J. - Spatially Resolved Acoustic Spectroscopy for Integrity Assessment in Wire-Arc Additive Manufacturing
Additive Manufacturing 28:236--251,2019
https://linkinghub.elsevier.com/retrieve/pii/S2214860419302994
Bibtex
Author : Dryburgh, Paul, Pieris, Don, Martina, Filomeno, Patel, Rikesh, Sharples, Steve, Li, Wenqi, Clare, Adam T., Williams, Stewart, Smith, Richard J.
Title : Spatially Resolved Acoustic Spectroscopy for Integrity Assessment in Wire-Arc Additive Manufacturing
In : Additive Manufacturing -
Address :
Date : 2019

Pieris, D, Patel, R, Dryburgh, P, Hirsch, M, Li, W, Sharples, S D, Smith, R J, Clare, A T, Clark, M - Spatially Resolved Acoustic Spectroscopy Towards Online Inspection of Additive Manufacturing
Insight - Non-Destructive Testing and Condition Monitoring 61(3):132--137,2019
https://www.ingentaconnect.com/content/10.1784/insi.2019.61.3.132
Bibtex
Author : Pieris, D, Patel, R, Dryburgh, P, Hirsch, M, Li, W, Sharples, S D, Smith, R J, Clare, A T, Clark, M
Title : Spatially Resolved Acoustic Spectroscopy Towards Online Inspection of Additive Manufacturing
In : Insight - Non-Destructive Testing and Condition Monitoring -
Address :
Date : 2019

Patel Rikesh, Hirsch Matthias, Dryburgh Paul, Pieris Don, Achamfuo-Yeboah Samuel, Smith Richard, Light Roger, Sharples Steve, Clare Adam, Clark Matt - Imaging Material Texture of As-Deposited Selective Laser Melted Parts Using Spatially Resolved Acoustic Spectroscopy
8(10):1991
http://www.mdpi.com/2076-3417/8/10/1991
Bibtex
Author : Patel Rikesh, Hirsch Matthias, Dryburgh Paul, Pieris Don, Achamfuo-Yeboah Samuel, Smith Richard, Light Roger, Sharples Steve, Clare Adam, Clark Matt
Title : Imaging Material Texture of As-Deposited Selective Laser Melted Parts Using Spatially Resolved Acoustic Spectroscopy
In : -
Address :
Date :

Speidel Alistair, Su Rong, Mitchell-Smith Jonathon, Dryburgh Paul, Bisterov Ivan, Pieris Don, Li Wenqi, Patel Rikesh, Clark Matt, Clare Adam T. - Crystallographic Texture Can Be Rapidly Determined by Electrochemical Surface Analytics
159:89-101
https://linkinghub.elsevier.com/retrieve/pii/S1359645418305998
Bibtex
Author : Speidel Alistair, Su Rong, Mitchell-Smith Jonathon, Dryburgh Paul, Bisterov Ivan, Pieris Don, Li Wenqi, Patel Rikesh, Clark Matt, Clare Adam T.
Title : Crystallographic Texture Can Be Rapidly Determined by Electrochemical Surface Analytics
In : -
Address :
Date :

Colombi, Andrea, Ageeva, Victoria, Smith, Richard J., Clare, Adam, Patel, Rikesh, Clark, Matt, Colquitt, Daniel, Roux, Philippe, Guenneau, Sebastien, Craster, Richard V. - Enhanced sensing and conversion of ultrasonic Rayleigh waves by elastic metasurfaces
Scientific Reports 7(1), Dec 2017
http://www.nature.com/articles/s41598-017-07151-6
Bibtex
Author : Colombi, Andrea, Ageeva, Victoria, Smith, Richard J., Clare, Adam, Patel, Rikesh, Clark, Matt, Colquitt, Daniel, Roux, Philippe, Guenneau, Sebastien, Craster, Richard V.
Title : Enhanced sensing and conversion of ultrasonic Rayleigh waves by elastic metasurfaces
In : Scientific Reports -
Address :
Date : Dec 2017

M. Hirsch, P. Dryburgh, S. Catchpole-Smith, R. Patel, L. Parry, S.D. Sharples, I.A. Ashcroft, A.T. Clare - Targeted rework strategies for powder bed additive manufacture
Additive Manufacturing 19:127 - 133,2018
https://www.sciencedirect.com/science/article/pii/S2214860417303925
Bibtex
Author : M. Hirsch, P. Dryburgh, S. Catchpole-Smith, R. Patel, L. Parry, S.D. Sharples, I.A. Ashcroft, A.T. Clare
Title : Targeted rework strategies for powder bed additive manufacture
In : Additive Manufacturing -
Address :
Date : 2018

Rikesh Patel, Wenqi Li, Richard J. Smith, Steve D. Sharples, Matt Clark - Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy
Scripta Materialia 140(Supplement C):67 - 70,2017
http://www.sciencedirect.com/science/article/pii/S1359646217303846
Bibtex
Author : Rikesh Patel, Wenqi Li, Richard J. Smith, Steve D. Sharples, Matt Clark
Title : Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy
In : Scripta Materialia -
Address :
Date : 2017

Hirsch, M., Catchpole-Smith, S., Patel, R., Marrow, P., Li, Wenqi, Tuck, C., Sharples, S. D., Clare, A. T. - Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy
Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences 473(2205),2017
http://rspa.royalsocietypublishing.org/content/473/2205/20170194
Bibtex
Author : Hirsch, M., Catchpole-Smith, S., Patel, R., Marrow, P., Li, Wenqi, Tuck, C., Sharples, S. D., Clare, A. T.
Title : Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy
In : Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences -
Address :
Date : 2017

Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare - Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
Additive Manufacturing 13:135 - 142,2017
http://www.sciencedirect.com/science/article/pii/S2214860416301877
Bibtex
Author : Matthias Hirsch, Rikesh Patel, Wenqi Li, Guangying Guan, Richard K. Leach, Steve D. Sharples, Adam T. Clare
Title : Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture
In : Additive Manufacturing -
Address :
Date : 2017

Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples - Spatially resolved acoustic spectroscopy for selective laser melting
Journal of Materials Processing Technology 236:93 - 102,2016
http://www.sciencedirect.com/science/article/pii/S0924013616301352
Bibtex
Author : Richard J. Smith, Matthias Hirsch, Rikesh Patel, Wenqi Li, Adam T. Clare, Steve D. Sharples
Title : Spatially resolved acoustic spectroscopy for selective laser melting
In : Journal of Materials Processing Technology -
Address :
Date : 2016

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield two laser interferometry
Opt. Express 22(22):27094--27101, Nov 2014
http://www.opticsexpress.org/abstract.cfm?URI=oe-22-22-27094
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield two laser interferometry
In : Opt. Express -
Address :
Date : Nov 2014

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Ultrastable heterodyne interferometer system using a CMOS modulated light camera
Opt. Express 20(16):17722--17733, Jul 2012
http://www.opticsexpress.org/abstract.cfm?URI=oe-20-16-17722
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Ultrastable heterodyne interferometer system using a CMOS modulated light camera
In : Opt. Express -
Address :
Date : Jul 2012

Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark - Widefield heterodyne interferometry using a custom CMOS modulated light camera
Opt. Express 19(24):24546--24556, Nov 2011
http://www.opticsexpress.org/abstract.cfm?URI=oe-19-24-24546
Bibtex
Author : Rikesh Patel, Samuel Achamfuo-Yeboah, Roger Light, Matt Clark
Title : Widefield heterodyne interferometry using a custom CMOS modulated light camera
In : Opt. Express -
Address :
Date : Nov 2011
Retrieved from "http://optics.eee.nottingham.ac.uk/w/index.php?title=Rikesh_Patel&oldid=4739"